641 1987 Ieee Standard Definitions And Characterization Of Metal Nitride Oxide Semiconductor Arrays

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Ieee Standard Definitions And Characterization Of Metal Nitride Oxide Semiconductor Arrays

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Author :
language : en
Publisher:
Release Date : 1988

Ieee Standard Definitions And Characterization Of Metal Nitride Oxide Semiconductor Arrays written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1988 with categories.

641 1987 Ieee Standard Definitions And Characterization Of Metal Nitride Oxide Semiconductor Arrays

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Author :
language : en
Publisher:
Release Date :

641 1987 Ieee Standard Definitions And Characterization Of Metal Nitride Oxide Semiconductor Arrays written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on with categories.

Ieee Standards

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Author : Institute of Electrical and Electronics Engineers
language : en
Publisher:
Release Date : 1987

Ieee Standards written by Institute of Electrical and Electronics Engineers and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987 with Electrical engineering categories.

Nonvolatile Semiconductor Memory Technology

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Author : William D. Brown
language : en
Publisher: Wiley-IEEE Press
Release Date : 1998

Nonvolatile Semiconductor Memory Technology written by William D. Brown and has been published by Wiley-IEEE Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998 with Computers categories.

This comprehensive reference book provides electronics engineers with the technical data and perspective necessary for the intelligent selection, specification, and application of nonvolatile semiconductor memory devices. A "one-stop shopping" tool for the working engineer, this book presents the fundamental aspects of nonvolatile semiconductor memory technologies, devices, reliability, and applications.

Science Abstracts

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Author :
language : en
Publisher:
Release Date : 1993

Science Abstracts written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1993 with Electric engineering categories.

Semiconductor Material And Device Characterization

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Author : Dieter K. Schroder
language : en
Publisher: John Wiley & Sons
Release Date : 2015-06-29

Semiconductor Material And Device Characterization written by Dieter K. Schroder and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-06-29 with Technology & Engineering categories.

This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Index To Ieee Publications

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Author : Institute of Electrical and Electronics Engineers
language : en
Publisher:
Release Date : 1989

Index To Ieee Publications written by Institute of Electrical and Electronics Engineers and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with Electric engineering categories.

Issues for 1973- cover the entire IEEE technical literature.

Catalog Of American National Standards

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Author : American National Standards Institute
language : en
Publisher:
Release Date : 1995

Catalog Of American National Standards written by American National Standards Institute and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Manufactures categories.

Catalog Of American National Standards 1994

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Author :
language : en
Publisher:
Release Date : 1994

Catalog Of American National Standards 1994 written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with categories.

1989 1990 Catalog Of American National Standards

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Author : American National Standards Institute
language : en
Publisher:
Release Date : 1989

1989 1990 Catalog Of American National Standards written by American National Standards Institute and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with Standardization categories.