Basic Principles Of Synchrotron Radiation Induced X Ray Fluorescence Srxpf
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Basic Principles Of Synchrotron Radiation Induced X Ray Fluorescence Srxpf
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Author :
language : en
Publisher:
Release Date : 1990
Basic Principles Of Synchrotron Radiation Induced X Ray Fluorescence Srxpf written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990 with categories.
Basic Principles Of Synchrotron Radiation Induced X Ray Fluorescence Srxrf
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Author :
language : en
Publisher:
Release Date : 1990
Basic Principles Of Synchrotron Radiation Induced X Ray Fluorescence Srxrf written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990 with categories.
The characteristic x rays can be used as powerful analytical tools for qualitative and quantitative determination of the major, minor and trace composition of materials. X Ray Fluorescence (XRF) techniques used for almost four decade to solve many problems in basic, applied science, and in industry. The XRF techniques that were developed initially used crystal spectrometers, and are referred to in literature as Wavelength Dispersive (WD) techniques. These WD techniques are still used in many fields and have the merit of a excellent energy resolution that allows for the analysis of many elements while avoiding the overlapping of some fluorescence peaks. They are also particularly useful in a matrix that produces copious quantities of a particular radiation. The principal disadvantages of a WD system are the low efficiency of crystal and the reduced energy region in which crystal spectrometer can be used. In the 1960's, Solid State Detectors (SSD) were developed with energy resolution such that the Energy Dispersive XRF techniques could be developed. These SSD's overcame some of the limitations of the WD techniques. The most attractive characteristics of the EDXRF techniques are in their intrinsic multielemental and non destructive capabilities. The development of the high intensity, high brilliance Synchrotron Radiation (SR) sources have open the possibility to make microanalyses using the XRF techniques, increasing the interest of the scientific community for these techniques. In this paper the basic concepts of the XRF technique are reviewed taking in account the availability of the new sources of x rays. 32 refs., 7 figs.
X Ray Fluorescence With Synchrotron Radiation
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Author :
language : en
Publisher:
Release Date : 1986
X Ray Fluorescence With Synchrotron Radiation written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986 with categories.
X-ray fluorescence (XRF) has long been used to make measurements of trace element concentrations in biological materials with very high sensitivity. It has not been previously possible to work with micrometer spatial resolutions because of the relatively low brightness of x-ray tubes. This situation is much improved by using synchrotron storage ring x-ray sources since the brightness of the synchrotron source is many orders of magnitude higher than is obtained with the most intense tube sources. These intense sources open the possibility of using the XRF technique for measurements with resolutions of approximately cellular dimensions. A description of a current research project at Brookhaven which uses synchrotron radiation induced x-ray emission (SRIXE) is presented to illustrate a specific application of the method in biology. 1 ref., 4 figs.
Analysis Of Individual Microscopic Particles By Means Of Synchrotron Radiation Induced X Ray Micro Fluorescence
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Author :
language : en
Publisher:
Release Date : 1992
Analysis Of Individual Microscopic Particles By Means Of Synchrotron Radiation Induced X Ray Micro Fluorescence written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with categories.
Synchrotron Radiation Induced X Ray Emission Srixe
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Author :
language : en
Publisher:
Release Date : 1999
Synchrotron Radiation Induced X Ray Emission Srixe written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with categories.
Elemental analysis using emission of characteristic x rays is a well-established scientific method. The success of this analytical method is highly dependent on the properties of the source used to produce the x rays. X-ray tubes have long existed as a principal excitation source, but electron and proton beams have also been employed extensively. The development of the synchrotron radiation x-ray source that has taken place during the past 40 years has had a major impact on the general field of x-ray analysis. Even tier 40 years, science of x-ray analysis with synchrotron x-ray beams is by no means mature. Improvements being made to existing synchrotron facilities and the design and construction of new facilities promise to accelerate the development of the general scientific use of synchrotron x-ray sources for at least the next ten years. The effective use of the synchrotron source technology depends heavily on the use of high-performance computers for analysis and theoretical interpretation of the experimental data. Fortunately, computer technology has advanced at least as rapidly as the x-ray technology during the past 40 years and should continue to do so during the next decade. The combination of these technologies should bring about dramatic advances in many fields where synchrotron x-ray science is applied. It is interesting also to compare the growth and rate of acceptance of this particular research endeavor to the rates for other technological endeavors. Griibler [1997] cataloged the time required for introduction, diffusion, and acceptance of technological, economic, and social change and found mean values of 40 to 50 years. The introduction of the synchrotron source depends on both technical and non-technical factors, and the time scale at which this seems to be occurring is quite compatible with what is seen for other major innovations such as the railroad or the telegraph. It will be interesting to see how long the present rate of technological change and increase in scientific use can be maintained for the synchrotron x-ray source. A short summary of the present state of the synchrotron radiation-induced x-ray emission (SRIXE) method is presented here. Basically, SRIXE experiments can include any that depend on the detection. of characteristic x-rays produced by the incident x-ray beam born the synchrotron source as they interact with a sample. Thus, experiments done to measure elemental composition, chemical state, crystal, structure, and other sample parameters can be considered in a discussion of SRIXE. It is also clear that the experimentalist may well wish to use a variety of complementary techniques for study of a given sample. For this reason, discussion of computed microtomography (CMT) and x-ray diffraction is included here. It is hoped that this present discussion will serve as a succinct introduction to the basic ideas of SRIXE for those not working in the field and possibly help to stimulate new types of work by those starting in the field as well as by experienced practitioners of the art. The topics covered include short descriptions of (1) the properties of synchrotron radiation, (2) a description of facilities used for its production, (3) collimated microprobe, (4) focused microprobes, (5) continuum and monoenergetic excitation, (6) detection limits, (7) quantitation, (8) applications of SRIXE, (9) computed microtomography (CMT), and (10)chemical speciation using x-ray absorption near-edge structure (XANES) and extended x-ray absorption fine structure (EXAFS). An effort has been made to cite a wide variety of work from different laboratories to show the vital nature of the field.
Synchrotron Radiation Induced X Ray Micro Analysis
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Author :
language : en
Publisher:
Release Date : 1992
Synchrotron Radiation Induced X Ray Micro Analysis written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with categories.
Synchrotron Radiation induced X-ray micro Fluorescence analysis ([mu]-SRXRF) is compared with more conventional microanalytical techniques such as Secondary Ion Microscopy (SIMS) and Electron Probe X-ray Microanalysis (EPXMA) for two typical microanalytical applications. SRXRF and EPXMA are employed for the analysis of individual particles, showing the complementary character of both techniques. By means of element mapping of trace constituents in a heterogeneous feldspar, the strong and weak points of SRXRF in comparison to EPXMA and SIMS are illustrated. The most striking difference between SRXRF and the other two microanalytical methods is the ability of SRXRF to probe deep into the investigated Material, whereas SIMS and EPXMA only investigate the upper surface of the material. The possibilities of SRXRF at third generation synchrotron rings is also briefly discussed.