Characterization Of Crystal Growth Defects By X Ray Methods
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Characterization Of Crystal Growth Defects By X Ray Methods
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Author : B.K. Tanner
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-04-17
Characterization Of Crystal Growth Defects By X Ray Methods written by B.K. Tanner and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Science categories.
This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.
Characterization Of Crystal Growth Defects By X Ray Methods Volume 63b
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Author :
language : en
Publisher:
Release Date : 1980
Characterization Of Crystal Growth Defects By X Ray Methods Volume 63b written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1980 with Crystals categories.
Characterization Of Crystal Growth Defects By X Ray Methods Applications Of Communications Theory
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Author : B. K. Tanner
language : en
Publisher:
Release Date : 2014-01-15
Characterization Of Crystal Growth Defects By X Ray Methods Applications Of Communications Theory written by B. K. Tanner and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-01-15 with categories.
Research On Crystal Growth And Defect Characterization At The National Bureau Of Standards During The Period July To December 1962
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Author : United States. National Bureau of Standards
language : en
Publisher:
Release Date : 1963
Research On Crystal Growth And Defect Characterization At The National Bureau Of Standards During The Period July To December 1962 written by United States. National Bureau of Standards and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1963 with Crystal growth categories.
Crystal Growth And Characterization Of Advanced Materials
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Author : A N Christensen
language : en
Publisher: World Scientific
Release Date : 1988-12-31
Crystal Growth And Characterization Of Advanced Materials written by A N Christensen and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 1988-12-31 with Science categories.
Contents:Fundamental Aspects of Crystal Growth from the Melt (C Paorici & L Zanotti)Phase Diagrams in Crystal Growth (A N Christensen)Growth Procedures and Perfection of Semiconductor Materials (A Lindegaard-Andersen)Atomistic Aspects of Crystal Growth and Epitaxy (I Markov)Fundamentals of Liquid Phase Epitaxial Growth (P Kordos)Determination of Few Selected Basic Parameters of the Investigation of AIII-BV Semiconductors Using X-Ray Methods (H Bruhl)Multijunction Solar Cells (I Chambouleyron)Application of the Mossbauer Spectroscopy to the Study of Magnetic Materials (G Albanese)Metallic Magnetism in Modern Materials (D Givord)and others Readership: Materials scientists.
Research On Crystal Growth And Characterization At The National Bureau Of Standards January To June 1964
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Author : Howard F. McMurdie
language : en
Publisher:
Release Date : 1964
Research On Crystal Growth And Characterization At The National Bureau Of Standards January To June 1964 written by Howard F. McMurdie and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1964 with Crystal growth categories.
A wide program of studies involving crystalline materials includes investigation of methods and theory of growth, study of detection and effects of defects, determination of physical properties, refinement of ch * emical analysis, and determination of stability relations and atomic structure.The types of materials range from organic compounds, through metals, and inorganic salts to refractory oxides.(Author).
Research On Crystal Growth And Characterization At The National Bureau Of Standards July To December 1964
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Author : Howard F. McMurdie
language : en
Publisher:
Release Date : 1965
Research On Crystal Growth And Characterization At The National Bureau Of Standards July To December 1964 written by Howard F. McMurdie and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1965 with Crystal growth categories.
Introduction To Crystal Growth And Characterization
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Author : Klaus-Werner Benz
language : en
Publisher: John Wiley & Sons
Release Date : 2014-07-28
Introduction To Crystal Growth And Characterization written by Klaus-Werner Benz and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-07-28 with Technology & Engineering categories.
This new textbook provides for the first time a comprehensive treatment of the basics of contemporary crystallography and crystal growth in a single volume. The reader will be familiarized with the concepts for the description of morphological and structural symmetry of crystals. The architecture of crystal structures of selected inorganic and molecular crystals is illustrated. The main crystallographic databases as data sources of crystal structures are described. Nucleation processes, their kinetics and main growth mechanism will be introduced in fundamentals of crystal growth. Some phase diagrams in the solid and liquid phases in correlation with the segregation of dopants are treated on a macro- and microscale. Fluid dynamic aspects with different types of convection in melts and solutions are discussed. Various growth techniques for semiconducting materials in connection with the use of external field (magnetic fields and microgravity) are described. Crystal characterization as the overall assessment of the grown crystal is treated in detail with respect to - crystal defects - crystal quality - field of application Introduction to Crystal Growth and Characterization is an ideal textbook written in a form readily accessible to undergraduate and graduate students of crystallography, physics, chemistry, materials science and engineering. It is also a valuable resource for all scientists concerned with crystal growth and materials engineering.
Research On Crystal Growth And Characterization At The National Bureau Of Standards
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Author : Herbert Steffen Peiser
language : en
Publisher:
Release Date : 1963
Research On Crystal Growth And Characterization At The National Bureau Of Standards written by Herbert Steffen Peiser and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1963 with Crystal growth categories.
The National Bureau of Standards is continuing diverse research projects on the growth and characterization of crystals.This note summarizes the individual NBS activities in this and closely related fields during July to December, 1963. Lists of NBS publications appertaining to *that period and of participating NBS scientists are appended.(Author).
X Ray Diffraction Topography
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Author : B. K. Tanner
language : en
Publisher: Elsevier
Release Date : 2013-10-22
X Ray Diffraction Topography written by B. K. Tanner and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-22 with Science categories.
X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang’s method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring crystals are discussed. The text defines the meaning of melt, solid state and vapour growth. An analysis of the properties of inorganic crystals is presented. A chapter of the volume is devoted to the characteristics of metals. Another section of the book focuses on the production of ice crystals and the utilization of oxides as laser materials. The book will provide useful information to chemists, scientists, students and researchers.