Collection M Moire M Moires
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The Theory Of The Moir Phenomenon
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Author : Isaac Amidror
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
The Theory Of The Moir Phenomenon written by Isaac Amidror and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Mathematics categories.
Who has not noticed, on one o~casion or another, those intriguing geometric patterns which appear at the intersection Of repetitive structures such as two far picket fences on a hill, the railings on both sides of a bridge, superposed layers of fabric, or folds of a nylon curtain? This fascinating phenomenon, known as the moire effect, has found useful applications in several fields of science and technology, such as metrology, strain analysis or even document authentication and anti-counterfeiting. However, in other situations moire patterns may have an unwanted, adverse effect. This is the case in the printing world, and, in particular, in the field of colour reproduction: moire patterns which may be caused by the dot-screens used for colour printing may severely deteriorate the image quality and tum into a real printer's nightmare. The starting point of the work on which this book is based was, indeed, in the research of moire phenomena in the context of the colour printing process. The initial aim of this research was to understand the nature and the causes of the superposition moire patterns between regular screens in order to find how to avoid, or at least minimize, their adverse effect on colour printing. This interesting research led us, after all, to a much more far reaching mathematical understanding of the moire phenomenon, whose interest stands in its own right, independently of any particular application.
Moir Fringes In Strain Analysis
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Author : Pericles S. Theocaris
language : en
Publisher: Elsevier
Release Date : 2017-05-25
Moir Fringes In Strain Analysis written by Pericles S. Theocaris and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-05-25 with Technology & Engineering categories.
Moiré Fringes in Strain Analysis provides a comprehensive coverage of the measurement of strains in deformed bodies and engineering structures. The title details the methods and techniques in strain analysis using the moiré fringe phenomenon. The text first covers the general theory, and then proceeds to tackling the moiré patterns. Next the selection deals with the applications of line gratings to two-dimensional strain measurement. The text also talks about surface topology by moiré patterns, along with the applications of moiré methods to dynamic problems and curved surfaces. The ninth chapter discusses moiré extensometers, while the tenth chapter tackles the precision and influence of grating defects. The remaining chapters detail the technological information on reproduction techniques of gratings and the evaluation of moiré methods. The book will be of great use to students, practitioners, and researchers of materials engineering and pure and applied mathematics.
Atomic And Electronic Properties Of 2d Moir Interfaces
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Author : Astrid Weston
language : en
Publisher: Springer Nature
Release Date : 2022-10-06
Atomic And Electronic Properties Of 2d Moir Interfaces written by Astrid Weston and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-10-06 with Technology & Engineering categories.
This thesis provides the first atomic length-scale observation of the structural transformation (referred to as lattice reconstruction) that occurs in moiré superlattices of twisted bilayer transition metal dichalcogenides (TMDs) at low (θ 2 ̊) twist angles. Such information is essential for the fundamental understanding of how manipulating the rotational twist-angle between two adjacent 2-dimensional crystals subsequently affects their optical and electrical properties./ppStudies using Scanning transmission electron microscopy (STEM), a powerful tool for atomic-scale imaging, were limited due to the complexity of the (atomically-thin) sample fabrication requirements. This work developed a unique way to selectively cut and re-stack monolayers of TMDs with a controlled rotational twist angle which could then be easily suspended on a TEM grid to meet the needs of the atomically thin sample requirements. The fabrication technique enabled the study of the two common stacking-polytypes including 3R and 2H (using MoS2 and WS2 as the example) as well as their structural evolution with decreasing twist-angle./ppAtomic-scale studies were followed by a comprehensive investigation of their electronic properties using scanning probe microscopy and electrical transport measurements of the artificially-engineered structures. The electronic structure of two common stacking-polytypes (3R and 2H) were strikingly different, as revealed by conductive atomic force microscopy. Further studies focused on the 3R-stacking polytype to reveal room-temperature out-of-plane ferroelectricity using tools such as kelvin probe force microscopy, scanning electron microscopy and electrical transport measurements. This work highlights that the unique intrinsic properties of TMDs (i.e. semiconductors with strongly light-matter interaction) combined with the additional twisted degree-of-freedom has great potential to create atomically thin transistors/LEDs with built-in memory storage functions and will further aid in the development of the next generation of optoelectronics.
Routledge Diccionario T Cnico Ingl S
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Author : Routledge
language : en
Publisher: Psychology Press
Release Date : 1997
Routledge Diccionario T Cnico Ingl S written by Routledge and has been published by Psychology Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997 with Foreign Language Study categories.
This collection of essays and reviews represents the most significant and comprehensive writing on Shakespeare's A Comedy of Errors. Miola's edited work also features a comprehensive critical history, coupled with a full bibliography and photographs of major productions of the play from around the world. In the collection, there are five previously unpublished essays. The topics covered in these new essays are women in the play, the play's debt to contemporary theater, its critical and performance histories in Germany and Japan, the metrical variety of the play, and the distinctly modern perspective on the play as containing dark and disturbing elements. To compliment these new essays, the collection features significant scholarship and commentary on The Comedy of Errors that is published in obscure and difficulty accessible journals, newspapers, and other sources. This collection brings together these essays for the first time.
Energy Minimization Methods In Computer Vision And Pattern Recognition
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Author : Mario Figueiredo
language : en
Publisher: Springer Science & Business Media
Release Date : 2001-08-22
Energy Minimization Methods In Computer Vision And Pattern Recognition written by Mario Figueiredo and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001-08-22 with Computers categories.
This book constitutes the refereed proceedings of the Third International Workshop on Energy Minimization Methods in Computer Vision and Pattern Recognition, EMMCVPR 2001, held in Sophia Antipolis, France in September 2001. The 42 revised full papers presented were carefully reviewed and selected from 70 submissions. The book offers topical sections on probabilistic models and estimation; image modeling and synthesis; clustering, grouping, and segmentation; optimization and graphs; and shapes, curves, surfaces, and templates.
High Sensitivity Moir
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Author : Daniel Post
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
High Sensitivity Moir written by Daniel Post and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
A description of both the theory and practice of physical measurements that use high-sensitivity moiré - principally moiré interferometry. The focus here is on the mechanics and micromechanics of materials and structural elements and the book includes new studies published for the first time. Diverse fields are addressed: advanced composite materials, thermal stresses, electronic packaging, fracture, metallurgy, time-dependence, strain gage calibration. All the methods can be applied for whole-field measurements on nearly and solid bodies. This reader-friendly book will serve engineers and scientists who are concerned with measurements of real phenomena, while also stimulating students to pursue the treasures of experimental analysis.
Routledge French Technical Dictionary Dictionnaire Technique Anglais
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Author : Yves Arden
language : en
Publisher: Routledge
Release Date : 2013-01-11
Routledge French Technical Dictionary Dictionnaire Technique Anglais written by Yves Arden and has been published by Routledge this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-01-11 with Reference categories.
The French-English volume of this highly acclaimed set consists of some 100,000 keywords in both French and English, drawn from the whole range of modern applied science and technical terminology. Covers over 70 subject areas, from engineering and chemistry to packaging, transportation, data processing and much more.
Handbook Of Surface And Nanometrology
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Author : David J. Whitehouse
language : en
Publisher: CRC Press
Release Date : 2010-12-20
Handbook Of Surface And Nanometrology written by David J. Whitehouse and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-12-20 with Science categories.
Since the publication of the first edition, miniaturization and nanotechnology have become inextricably linked to traditional surface geometry and metrology. This interdependence of scales has had profound practical implications.Updated and expanded to reflect many new developments, Handbook of Surface and Nanometrology, Second Edition determines h
Dictionary Of The Printing And Allied Industries
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Author : F.J.M. Wijnekus
language : en
Publisher: Elsevier
Release Date : 2013-10-22
Dictionary Of The Printing And Allied Industries written by F.J.M. Wijnekus and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-22 with Technology & Engineering categories.
The first edition of this dictionary, compiled by F.J.M. Wijnekus and published in 1967, was the result of years of systematic collection and preparation of thousands of terms and expressions which were until then not to be found in any other dictionary. The material was correlated for use in his daily work and, as the reputation of his private collection spread, there was an increasing demand for access to these findings. Until 1967 there was no comprehensive multilingual dictionary on the subject; former publications were incomplete and out of date and lacked clear definition - often leading to disastrous misunderstandings. Furthermore, the subject of printing, paper and ink technology had never been dealt with, in dictionary form, in relation to other aspects of the graphic industry.This new work, prepared by F.J.M. Wijnekus and his son, has been considerably up-dated. Much time has been devoted to checking the material against the most reliable and authoritative sources. The usefulness of the work has been further enhanced by the addition of Spanish and Italian to the original languages of English, French and German.The first edition was received with much enthusiastic praise and this new dictionary will undoubtedly continue to be an invaluable tool for all those working with the printed word in the widest sense. It is a reference work which should be in the hands of all those in any way connected with the printing industry, paper manufacturers, ink manufacturers, printers, bookbinders, publishers, lithographers, lay-out men and graphical research institutes.
Optical Inspection Of Microsystems
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Author : Wolfgang Osten
language : en
Publisher: CRC Press
Release Date : 2018-10-03
Optical Inspection Of Microsystems written by Wolfgang Osten and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-10-03 with Science categories.
Where conventional testing and inspection techniques fail at the micro-scale, optical techniques provide a fast, robust, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems is the first comprehensive, up-to-date survey of the most important and widely used full-field optical metrology and inspection technologies. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moiré techniques, interference microscopy, laser Doppler vibrometry, holography, speckle metrology, and spectroscopy. They also examine modern approaches to data acquisition and processing. The book emphasizes the evaluation of various properties to increase reliability and promote a consistent approach to optical testing. Numerous practical examples and illustrations reinforce the concepts. Supplying advanced tools for microsystem manufacturing and characterization, Optical Inspection of Microsystems enables you to reach toward a higher level of quality and reliability in modern micro-scale applications.