Defects In Silicon
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Proceedings Of The Second Symposium On Defects In Silicon
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Author : W. Murray Bullis
language : en
Publisher:
Release Date : 1991
Proceedings Of The Second Symposium On Defects In Silicon written by W. Murray Bullis and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with Semiconductors categories.
Defects And Impurities In Silicon Materials
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Author : Yutaka Yoshida
language : en
Publisher: Springer
Release Date : 2016-03-30
Defects And Impurities In Silicon Materials written by Yutaka Yoshida and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-03-30 with Technology & Engineering categories.
This book emphasizes the importance of the fascinating atomistic insights into the defects and the impurities as well as the dynamic behaviors in silicon materials, which have become more directly accessible over the past 20 years. Such progress has been made possible by newly developed experimental methods, first principle theories, and computer simulation techniques. The book is aimed at young researchers, scientists, and technicians in related industries. The main purposes are to provide readers with 1) the basic physics behind defects in silicon materials, 2) the atomistic modeling as well as the characterization techniques related to defects and impurities in silicon materials, and 3) an overview of the wide range of the research fields involved.
Proceedings Of The Third International Symposium On Defects In Silicon
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Author : Takao Abe
language : en
Publisher: The Electrochemical Society
Release Date : 1999
Proceedings Of The Third International Symposium On Defects In Silicon written by Takao Abe and has been published by The Electrochemical Society this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with Science categories.
Science And Technology Of Defects In Silicon
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Author : C.A.J. Ammerlaan
language : en
Publisher: Elsevier
Release Date : 2014-01-01
Science And Technology Of Defects In Silicon written by C.A.J. Ammerlaan and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-01-01 with Technology & Engineering categories.
This volume reviews recent developments in the materials science of silicon. The topics discussed range from the fundamental characterization of the physical properties to the assessment of materials for device applications, and include: crystal growth; process-induced defects; topography; hydrogenation of silicon; impurities; and complexes and interactions between impurities. In view of its key position within the conference scope, several papers examine process induced defects: defects due to ion implantation, silicidation and dry etching, with emphasis being placed on the device aspects. Special attention is also paid to recent developments in characterization techniques on epitaxially grown silicon, and silicon-on-insulators.
Structure And Kinetics Of Defects In Silicon
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Author : Martin M. Sokoloski
language : en
Publisher:
Release Date : 1967
Structure And Kinetics Of Defects In Silicon written by Martin M. Sokoloski and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1967 with Crystals categories.
Intrinsic Point Defects Impurities And Their Diffusion In Silicon
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Author : Peter Pichler
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Intrinsic Point Defects Impurities And Their Diffusion In Silicon written by Peter Pichler and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behaviour from investigations, it gives a comprehensive introduction into the relevant fundamental concepts.
Defects In Silicon Hydrogen
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Author : J. Weber
language : en
Publisher: Elsevier Science
Release Date : 1999-05-19
Defects In Silicon Hydrogen written by J. Weber and has been published by Elsevier Science this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999-05-19 with Technology & Engineering categories.
The present volume contains most of the papers presented at the Symposium A 'Defects in Silicon: Hydrogen'. The symposium took place at the 1998 Spring Meeting of the European Materials Research Society from June 16-19 1998, Strasbourg, France, and was devoted to the fundamental aspects of hydrogen in crystalline silicon and their influence on silicon technology. The two-and-a-half day scientific program included 13 invited and 35 contributed papers.
Wacker S Atlas For Characterization Of Defects In Silicon
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Author : H. Rauh
language : de
Publisher:
Release Date : 1986*
Wacker S Atlas For Characterization Of Defects In Silicon written by H. Rauh and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986* with categories.
Aggregation Phenomena Of Point Defects In Silicon
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Author : Erhard Sirtl
language : en
Publisher:
Release Date : 1983
Aggregation Phenomena Of Point Defects In Silicon written by Erhard Sirtl and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1983 with Science categories.
Point And Extended Defects In Semiconductors
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Author : Giorgio Benedek
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-06-29
Point And Extended Defects In Semiconductors written by Giorgio Benedek and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-06-29 with Science categories.
The systematic study of defects in semiconductors began in the early fifties. FrQm that time on many questions about the defect structure and properties have been an swered, but many others are still a matter of investigation and discussion. Moreover, during these years new problems arose in connection with the identification and char acterization of defects, their role in determining transport and optical properties of semiconductor materials and devices, as well as from the technology of the ever in creasing scale of integration. This book presents to the reader a view into both basic concepts of defect physics and recent developments of high resolution experimental techniques. The book does not aim at an exhaustive presentation of modern defect physics; rather it gathers a number of topics which represent the present-time research in this field. The volume collects the contributions to the Advanced Research Workshop "Point, Extended and Surface Defects in Semiconductors" held at the Ettore Majo rana Centre at Erice (Italy) from 2 to 7 November 1988, in the framework of the International School of Materials Science and Technology. The workshop has brought together scientists from thirteen countries. Most participants are currently working on defect problems in either silicon submicron technology or in quantum wells and superlattices, where point defects, dislocations, interfaces and surfaces are closely packed together.