Emission Electron Microscopy
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Field Emission Scanning Electron Microscopy
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Author : Nicolas Brodusch
language : en
Publisher: Springer
Release Date : 2017-09-25
Field Emission Scanning Electron Microscopy written by Nicolas Brodusch and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-09-25 with Technology & Engineering categories.
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Biological Field Emission Scanning Electron Microscopy 2 Volume Set
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Author : Roland A. Fleck
language : en
Publisher: John Wiley & Sons
Release Date : 2019-04-29
Biological Field Emission Scanning Electron Microscopy 2 Volume Set written by Roland A. Fleck and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-04-29 with Science categories.
The go‐to resource for microscopists on biological applications of field emission gun scanning electron microscopy (FEGSEM) The evolution of scanning electron microscopy technologies and capability over the past few years has revolutionized the biological imaging capabilities of the microscope—giving it the capability to examine surface structures of cellular membranes to reveal the organization of individual proteins across a membrane bilayer and the arrangement of cell cytoskeleton at a nm scale. Most notable are their improvements for field emission scanning electron microscopy (FEGSEM), which when combined with cryo-preparation techniques, has provided insight into a wide range of biological questions including the functionality of bacteria and viruses. This full-colour, must-have book for microscopists traces the development of the biological field emission scanning electron microscopy (FEGSEM) and highlights its current value in biological research as well as its future worth. Biological Field Emission Scanning Electron Microscopy highlights the present capability of the technique and informs the wider biological science community of its application in basic biological research. Starting with the theory and history of FEGSEM, the book offers chapters covering: operation (strengths and weakness, sample selection, handling, limitations, and preparation); Commercial developments and principals from the major FEGSEM manufacturers (Thermo Scientific, JEOL, HITACHI, ZEISS, Tescan); technical developments essential to bioFEGSEM; cryobio FEGSEM; cryo-FIB; FEGSEM digital-tomography; array tomography; public health research; mammalian cells and tissues; digital challenges (image collection, storage, and automated data analysis); and more. Examines the creation of the biological field emission gun scanning electron microscopy (FEGSEM) and discusses its benefits to the biological research community and future value Provides insight into the design and development philosophy behind current instrument manufacturers Covers sample handling, applications, and key supporting techniques Focuses on the biological applications of field emission gun scanning electron microscopy (FEGSEM), covering both plant and animal research Presented in full colour An important part of the Wiley-Royal Microscopical Series, Biological Field Emission Scanning Electron Microscopy is an ideal general resource for experienced academic and industrial users of electron microscopy—specifically, those with a need to understand the application, limitations, and strengths of FEGSEM.
Scanning Electron Microscopy
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Author : Ludwig Reimer
language : en
Publisher: Springer
Release Date : 2013-11-11
Scanning Electron Microscopy written by Ludwig Reimer and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-11 with Science categories.
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Physical Principles Of Electron Microscopy
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Author : Ray Egerton
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-02-11
Physical Principles Of Electron Microscopy written by Ray Egerton and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-02-11 with Technology & Engineering categories.
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Field Emission And Field Ionization
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Author : Robert Gomer
language : en
Publisher:
Release Date : 1961
Field Emission And Field Ionization written by Robert Gomer and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1961 with Science categories.
Market: Students and researchers in vacuum and surface science, microscopy, and semiconductor physics. This definitive work was based on four lectures presented at Harvard University in 1958. When it was written, field emission was one of the few techniques available for surface studies and the attainment of ultra-high vacuum was a little-known art. Though more sophisticated treatments have since been developed, Gomer's pioneering work remains valid to this day.
Transmission Electron Microscopy
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Author : David B. Williams
language : en
Publisher: Springer Science & Business Media
Release Date : 2009-08-05
Transmission Electron Microscopy written by David B. Williams and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-08-05 with Science categories.
This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, the book provides the necessary instructions for successful hands-on application of this versatile materials characterization technique.
Transmission Electron Microscopy
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Author : Ludwig Reimer
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-08-28
Transmission Electron Microscopy written by Ludwig Reimer and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-08-28 with Science categories.
The aim of this monograph is to outline the physics of image formation, electron–specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi?ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics.
Aberration Corrected Imaging In Transmission Electron Microscopy
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Author : Rolf Erni
language : en
Publisher: World Scientific
Release Date : 2010
Aberration Corrected Imaging In Transmission Electron Microscopy written by Rolf Erni and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with Science categories.
This book provides a concise introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. As such, it addresses recent advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science. It covers two of the most popular atomic resolution imaging techniques' namely high-resolution transmission electron microscopy and scanning transmission electron microscopy. The book bridges the gap between application-oriented textbooks in conventional electron microscopy and books in physics covering dedicated topics in charged-particle optics and aberration correction. The book is structured in three parts which can be read separately. While in the first part the fundamentals of the imaging techniques and their limits in conventional electron microscopes are explained, the second part provides readers with the basic principles of electron optics and the characteristics of electron lenses. The third part, focusing on aberrations, describes the functionality of aberration correctors and provides readers with practical guidelines for the daily work with aberration-corrected electron microscopes. The book represents a detailed and easy readable guide to aberration-corrected electron microscopy.
Surface Microscopy With Low Energy Electrons
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Author : Ernst Bauer
language : en
Publisher: Springer
Release Date : 2014-07-10
Surface Microscopy With Low Energy Electrons written by Ernst Bauer and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-07-10 with Technology & Engineering categories.
This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.
Near Field Emission Scanning Electron Microscopy
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Author : Taryl Leaton Kirk
language : en
Publisher: Logos Verlag Berlin GmbH
Release Date : 2010
Near Field Emission Scanning Electron Microscopy written by Taryl Leaton Kirk and has been published by Logos Verlag Berlin GmbH this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with Science categories.
Low beam energies have been implemented in a simplified SEM technique; where the electron source, remote in standard SEMs, is brought within tens of nanometers to the object. This method, known as the "near field emission scanning electron microscopy" (NFESEM), is capable of imaging conducting surfaces with nanometer resolution using beam energies less than 60 eV. The terminology "near" refers to the locality of the field-emitted electron source; which is to distinguish itself from the "remote" field emission gun sources used in standard SEMs. The main aim of this instrument is the realization of some kind of surface topography image due to the exposure of a primary beam of electrons, as it is rastered along the sample surface. This will be achieved by two distinct (although related) experiments: measuring the field emission (FE) current while scanning and detecting the secondary electrons (SE)s generated when the electron beam impinges on the surface. Here, the FE properties, in accordance with the tip-sample separation, will be emphasized, since the variations in SE yield are directly proportional to the impinging primary electron beam. We observe a direct correlation between the image contrast and the FE current, where the image is enhanced with increasing FE current. Moreover, simple electrostatic measurements can be used to define the performance of the device.