Imaging With Aberration Corrected Low Energy Electron Microscopy
DOWNLOAD
Download Imaging With Aberration Corrected Low Energy Electron Microscopy PDF/ePub or read online books in Mobi eBooks. Click Download or Read Online button to get Imaging With Aberration Corrected Low Energy Electron Microscopy book now. This website allows unlimited access to, at the time of writing, more than 1.5 million titles, including hundreds of thousands of titles in various foreign languages. If the content not found or just blank you must refresh this page
Imaging With Aberration Corrected Low Energy Electron Microscopy
DOWNLOAD
Author : Sebastian Markus Schramm
language : en
Publisher:
Release Date : 2013
Imaging With Aberration Corrected Low Energy Electron Microscopy written by Sebastian Markus Schramm and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with categories.
Aberration Corrected Imaging In Transmission Electron Microscopy
DOWNLOAD
Author : Rolf Erni
language : en
Publisher: World Scientific
Release Date : 2010
Aberration Corrected Imaging In Transmission Electron Microscopy written by Rolf Erni and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with Science categories.
This book provides a concise introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. As such, it addresses recent advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science. It covers two of the most popular atomic resolution imaging techniques' namely high-resolution transmission electron microscopy and scanning transmission electron microscopy. The book bridges the gap between application-oriented textbooks in conventional electron microscopy and books in physics covering dedicated topics in charged-particle optics and aberration correction. The book is structured in three parts which can be read separately. While in the first part the fundamentals of the imaging techniques and their limits in conventional electron microscopes are explained, the second part provides readers with the basic principles of electron optics and the characteristics of electron lenses. The third part, focusing on aberrations, describes the functionality of aberration correctors and provides readers with practical guidelines for the daily work with aberration-corrected electron microscopes. The book represents a detailed and easy readable guide to aberration-corrected electron microscopy.
Advances In Imaging And Electron Physics
DOWNLOAD
Author :
language : en
Publisher: Academic Press
Release Date : 2009-06-12
Advances In Imaging And Electron Physics written by and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-06-12 with Technology & Engineering categories.
The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be seen with the traditional microscope. The biologist could study viruses and the components of cells, the materials scientist could study the structure of metals and alloys and many other substances, and especially their defects. But even the electron microscope had limits, and truly atomic structure was still too small to be observed directly. The so-called "limit of resolution" of the microscope was well understood, but attempts to use the necessary correctors were unsuccessful until the late 1990s. Such correctors now equip many microscopes in Europe, the USA and Japan and the results are extremely impressive. Moreover, microscopists feel that they are only at the beginning of a new era of subatomic microscopic imaging. In the present volume, we have brought together the principal contributors, instrument designers and microscopists to discuss this topic in depth. First book on the subject of correctors Well known contributors from academia and microscope manufacturers Provides an ideal starting point for preparing funding proposals
Surface Microscopy With Low Energy Electrons
DOWNLOAD
Author : Ernst Bauer
language : en
Publisher: Springer
Release Date : 2014-07-10
Surface Microscopy With Low Energy Electrons written by Ernst Bauer and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-07-10 with Technology & Engineering categories.
This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.
Image Contrast In Mirror And Low Energy Electron Microscopy
DOWNLOAD
Author : Shane Michael Kennedy
language : en
Publisher:
Release Date : 2010
Image Contrast In Mirror And Low Energy Electron Microscopy written by Shane Michael Kennedy and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with Electron microscopy categories.
We develop several approaches to understand and interpret image contrast in mirror electron microscopy (MEM) and low energy electron microscopy (LEEM), with potential applications to photoemission electron microscopy (PEEM). We treat both the forward problem, of how surface features and properties create image contrast, and the inverse problem, of how we may infer quantitative information about surface features and properties from experimental MEM, LEEM and PEEM images. The thesis begins with the development of the Laplacian imaging theory of MEM, whereby image contrast is understood as the second derivative of the surface topography, blurred slightly to account for the interaction of the electron beam with the electric field above the specimen, rather than the specimen surface itself. This intuitive method includes the effects of lens aberrations and can be rapidly inverted to recover the surface topography from experimental MEM images. For specimen surface variations that are outside the regime of the Laplacian imaging theory and other models, we develop a caustic imaging theory for MEM. This involves solving the electric field above the specimen and tracing a family or envelope of rays through the immersion lens. Where initially adjacent rays cross, caustics are created, and these strong image features may be used to recover three dimensional surface topography. Both the Laplacian imaging theory and the caustic imaging theory are successfully applied to experimental MEM data to obtain the surface topography. As a complement to this ray-based treatment, we then develop a wave optical treatment of LEEM image contrast, adopting the complex transfer function methodology from transmission electron microscopy. This method includes spherical and chromatic aberration, and may be extended to include higher order aberrations for use in aberration corrected LEEM instruments. With knowledge of the complex transfer function, we then apply phase retrieval methods to simulated LEEM images, recovering the electron wave function and surface topography for a series of step terraces. Finally, we consider a wave optical treatment of MEM, investigating the behaviour of the electron wave in the vicinity of the turn around region. This is extended to explore the application of MEM beyond specimen surfaces, and the feasibility of imaging very weak potentials, such as the ponderomotive potential experienced by an electron in a light field.
Low Voltage Electron Microscopy
DOWNLOAD
Author : David C. Bell
language : en
Publisher: John Wiley & Sons
Release Date : 2013-02-11
Low Voltage Electron Microscopy written by David C. Bell and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-02-11 with Science categories.
Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before.
Springer Handbook Of Microscopy
DOWNLOAD
Author : Peter W. Hawkes
language : en
Publisher: Springer Nature
Release Date : 2019-11-02
Springer Handbook Of Microscopy written by Peter W. Hawkes and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-11-02 with Technology & Engineering categories.
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
Electron Microscopy
DOWNLOAD
Author : Source Wikipedia
language : en
Publisher: University-Press.org
Release Date : 2013-09
Electron Microscopy written by Source Wikipedia and has been published by University-Press.org this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-09 with categories.
Please note that the content of this book primarily consists of articles available from Wikipedia or other free sources online. Pages: 50. Chapters: Electron microscope, Scanning electron microscope, Transmission electron microscopy, Environmental scanning electron microscope, Transmission electron microscopy DNA sequencing, Focused ion beam, Kikuchi line, Low-energy electron microscopy, Low-voltage electron microscope, Electron beam-induced deposition, Scanning transmission electron microscopy, Transmission Electron Aberration-corrected Microscope, Scanning confocal electron microscopy, Electron tomography, Negative stain, EM Data Bank, Wien filter, Annular dark-field imaging, List of microscopy visualization systems, Ultrastructure, Conventional transmission electron microscope, Charge contrast imaging, Karnovsky fixative.
Advances In Imaging And Electron Physics
DOWNLOAD
Author : Peter W. Hawkes
language : en
Publisher: Academic Press
Release Date : 2016-10-25
Advances In Imaging And Electron Physics written by Peter W. Hawkes and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-10-25 with Science categories.
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices, especially semiconductor devices, particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contains contributions from leading authorities on the subject matter Informs and updates on all the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource Features extended articles on the physics of electron devices, especially semiconductor devices, particle optics at high and low energies, microlithography, image science, and digital image processing
Electron Microscopy
DOWNLOAD
Author : S. Amelinckx
language : en
Publisher: John Wiley & Sons
Release Date : 2008-09-26
Electron Microscopy written by S. Amelinckx and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-09-26 with Technology & Engineering categories.
Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.