Multiple Beam Interferometry Of Surfaces And Films

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Multiple Beam Interferometry Of Surfaces And Films

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Author : Samuel Tolansky
language : en
Publisher:
Release Date : 1970

Multiple Beam Interferometry Of Surfaces And Films written by Samuel Tolansky and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1970 with Science categories.

Multiple Beam Interferometry Of Surfaces And Films

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Author : S. Tolansky
language : en
Publisher:
Release Date : 1983-07

Multiple Beam Interferometry Of Surfaces And Films written by S. Tolansky and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1983-07 with categories.

Multiple Beam Interferometry Of Surfaces And Films By S Tolansky

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Author : Samuel Tolansky
language : en
Publisher:
Release Date : 1948

Multiple Beam Interferometry Of Surfaces And Films By S Tolansky written by Samuel Tolansky and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1948 with categories.

Thickness Measurements Of Thin Films By Multiple Beam Interferometry

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Author : T. W. Bartlett
language : en
Publisher:
Release Date : 1954

Thickness Measurements Of Thin Films By Multiple Beam Interferometry written by T. W. Bartlett and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1954 with Interferometry categories.

Measurement Of The Thickness Of Thin Films By Multiple Beam Interferometry

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Author : Dean Pappas
language : en
Publisher:
Release Date : 1962

Measurement Of The Thickness Of Thin Films By Multiple Beam Interferometry written by Dean Pappas and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1962 with categories.

A Multiple-Beam Interferometer was developed for the measurement of the thickness of vacuum deposited thin films. The thicknesses measured were in the region of 1000 to 10,000 Angstroms. Both Monochromatic Fizeau fringes of equal thickness and heterochromatic fringes of equal chromatic order were investigated, but the latter method was chosen for the actual measurements because of its greater accuracy and less stringent experimental requirements. Five SiO films and one Cr film were measured. Two of the SiO films were deposited simultaneously and the measured thicknesses of these were used to evaluate the uniformity of the deposition. The fringes of equal chromatic order were also used to investigate the reflection phase dispersion by the Al overcoats on the SiO films and by the Cr overcoat on the Cr film. The functional form of this phase dispersion determines whether or not a simple formula for the thickness computation is valid. (Author).

Thin Film Measurement By Multiple Beam Interferometry

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Author : Scott K. Kinerson
language : en
Publisher:
Release Date : 1953

Thin Film Measurement By Multiple Beam Interferometry written by Scott K. Kinerson and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1953 with categories.

Determination Of The Thickness Of Thin Films Using Multiple Beam Interferometry

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Author : Malcom Lee Bruce Weems
language : en
Publisher:
Release Date : 1969

Determination Of The Thickness Of Thin Films Using Multiple Beam Interferometry written by Malcom Lee Bruce Weems and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1969 with Interferometry categories.

Survey Of Optical Surfaces By Multiple Beam Interference

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Author : Joseph A. Jr English
language : en
Publisher:
Release Date : 1950

Survey Of Optical Surfaces By Multiple Beam Interference written by Joseph A. Jr English and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1950 with categories.

Multiple Beam Interferometry For Small Step Measurement

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Author : John William Beck
language : en
Publisher:
Release Date : 1961

Multiple Beam Interferometry For Small Step Measurement written by John William Beck and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1961 with Interferometers categories.

Study Of Monomolecular Films By Multiple Beam Interferometry

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Author : Ryuji Shirahata
language : en
Publisher:
Release Date : 1969

Study Of Monomolecular Films By Multiple Beam Interferometry written by Ryuji Shirahata and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1969 with Thin films categories.