Notes On Sem Examination Of Microelectronic Devices
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Semiconductor Measurement Technology
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Author : John R. Devaney
language : en
Publisher:
Release Date : 1977
Semiconductor Measurement Technology written by John R. Devaney and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1977 with Miniature electronic equipment categories.
Nbs Special Publication
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Author :
language : en
Publisher:
Release Date : 1977
Nbs Special Publication written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1977 with Weights and measures categories.
National Semiconductor Metrology Program
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Author : National Institute of Standards and Technology (U.S.)
language : en
Publisher:
Release Date : 2000
National Semiconductor Metrology Program written by National Institute of Standards and Technology (U.S.) and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000 with Semiconductors categories.
National Semiconductor Metrology Program
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Author : National Semiconductor Metrology Program (U.S.)
language : en
Publisher:
Release Date :
National Semiconductor Metrology Program written by National Semiconductor Metrology Program (U.S.) and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on with Semiconductors categories.
Semiconductor Measurement Technology
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Author : United States. National Bureau of Standards
language : en
Publisher:
Release Date : 1978
Semiconductor Measurement Technology written by United States. National Bureau of Standards and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1978 with Semiconductors categories.
Semiconductor Measurement Technology
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Author :
language : en
Publisher:
Release Date : 1977
Semiconductor Measurement Technology written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1977 with Semiconductors categories.
National Semiconductor Metrology Program Nist List Of Publications Lp 103 May 2000
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Author :
language : en
Publisher:
Release Date : 2000
National Semiconductor Metrology Program Nist List Of Publications Lp 103 May 2000 written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000 with categories.
Monthly Catalog Of United States Government Publications
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Author : United States. Superintendent of Documents
language : en
Publisher:
Release Date : 1977
Monthly Catalog Of United States Government Publications written by United States. Superintendent of Documents and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1977 with Government publications categories.
February issue includes Appendix entitled Directory of United States Government periodicals and subscription publications; September issue includes List of depository libraries; June and December issues include semiannual index
Problem Solving With Microbeam Analysis
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Author : K. Kiss
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Problem Solving With Microbeam Analysis written by K. Kiss and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Science categories.
This book provides the reader with a working knowledge sufficient to select microbeam techniques for the efficient, cost-effective solution of complex problems arising in today's high-tech industries. Primarily written for the industrial analyst whose field of expertise is other than microbeam analysis, it will also be of help to engineers, plant chemists and industrial research scientists who often seek the aid of the microbeam analyst in their problem solving. Research and plant managers as well as administrators may also find this book helpful since they may be called upon to select and/or approve high-priced microbeam instruments.The book is organized into two parts. Part I gives a brief description of the various techniques and critically compares their capabilities and limitations. Part II consists of selected applications which show how the various techniques or their combinations are applied to characterize materials and to guide research in a wide variety of fields. The examples and case histories will undoubtedly aid the reader in problem solving, quality assurance and research-related tasks. Newcomers to the field will find enough information in the book to enable them to begin practical work and to apply the techniques.
Scientific And Technical Aerospace Reports
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Author :
language : en
Publisher:
Release Date : 1977
Scientific And Technical Aerospace Reports written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1977 with Aeronautics categories.
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.