Phase Shifting Projection Grid Techniques
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Phase Shifting Projection Grid Techniques
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Author : A. (ed.). Asundi
language : en
Publisher:
Release Date : 1994
Phase Shifting Projection Grid Techniques written by A. (ed.). Asundi and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with categories.
Special Issue On Phase Shifting Projection Grid Techniques
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Author :
language : en
Publisher:
Release Date : 1994
Special Issue On Phase Shifting Projection Grid Techniques written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with categories.
The Phase Shifting Technique And Its Application In 3 D Fringe Projection Profilometry
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Author : Hong Zhang
language : en
Publisher:
Release Date : 1999
The Phase Shifting Technique And Its Application In 3 D Fringe Projection Profilometry written by Hong Zhang and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with categories.
Optical Inspection Of Microsystems Second Edition
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Author : Wolfgang Osten
language : en
Publisher: CRC Press
Release Date : 2019-06-21
Optical Inspection Of Microsystems Second Edition written by Wolfgang Osten and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-06-21 with Technology & Engineering categories.
Where conventional testing and inspection techniques fail at the microscale, optical techniques provide a fast, robust, noninvasive, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems, Second Edition, extends and updates the first comprehensive survey of the most important optical measurement techniques to be successfully used for the inspection of microsystems. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image processing, image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moire techniques, interference microscopy, laser-Doppler vibrometry, digital holography, speckle metrology, spectroscopy, and sensor fusion technologies. They also examine modern approaches to data acquisition and processing, such as the determination of surface features and the estimation of uncertainty of measurement results. The book emphasizes the evaluation of various system properties and considers encapsulated components to increase quality and reliability. Numerous practical examples and illustrations of optical testing reinforce the concepts. Supplying effective tools for increased quality and reliability, this book Provides a comprehensive, up-to-date overview of optical techniques for the measurement and inspection of microsystems Discusses image correlation, displacement and strain measurement, electro-optic holography, and speckle metrology techniques Offers numerous practical examples and illustrations Includes calibration of optical measurement systems for the inspection of MEMS Presents the characterization of dynamics of MEMS
3d Optical Metrology By Digital Moir
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Author : Fatemeh Mohammadi
language : en
Publisher:
Release Date : 2017
3d Optical Metrology By Digital Moir written by Fatemeh Mohammadi and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017 with Metrology categories.
Fast, accurate three dimensional (3D) optical metrology has diverse applications in object and environment modelling. Structured-lighting techniques allow non-contacting 3D surface-shape measurement by projecting patterns of light onto an object surface, capturing images of the deformed patterns, and computing the 3D surface geometry from the captured 2D images. However, motion artifacts can still be a problem with high-speed surface-motion especially with increasing demand for higher measurement resolution and accuracy. To avoid motion artifacts, fast 2D image acquisition of projected patterns is required. Fast multi-pattern projection and minimization of the number of projected patterns are two approaches for dynamic object measurement. To achieve a higher rate of switching frames, fast multi-pattern projection techniques require costly projector hardware modification or new designs of projection systems to increase the projection rate beyond the capabilities of off-the-shelf projectors. Even if these disadvantages were acceptable (higher cost, complex hardware), and even if the rate of acquisition achievable with current systems were fast enough to avoid errors, minimization of the number of captured frames required will still contribute to reduce further the effect of object motion on measurement accuracy and to enable capture of higher object dynamics. Development of an optical 3D metrology method that minimizes the number of projected patterns while maintaining accurate 3D surface-shape measurement of objects with continuous and discontinuous surface geometry has remained a challenge. Capture of a single image-frame instead of multiple frames would be advantageous for measuring moving or deforming objects. Since accurate measurement generally requires multiple phase-shifted images, imbedding multiple patterns into a single projected composite pattern is one approach to achieve accurate single-frame 3D surface-shape measurement. The main limitations of existing single-frame methods based on composite patterns are poor resolution, small range of gray-level intensity due to collection of multiple patterns in one image, and degradation of the extracted patterns because of modulation and demodulation processes on the captured composite pattern image. To benefit from the advantages of multi-pattern projection of phase-shifted fringes and single-frame techniques, without combining phase-shifted patterns into one frame, digital moiré was used. Moiré patterns are generated by projecting a grid pattern onto the object, capturing a single frame, and in a post-process, superimposing a synthetic grid of the same frequency as in the captured image. Phase-shifting is carried out as a post-process by digitally shifting the synthetic grid across the captured image. The useful moiré patterns, which contain object shape information, are contaminated with a high-frequency grid lines that must be removed. After performing grid removal, computation of a phase map, and phase-to-height mapping, 3D object shape can be computed. The advantage of digital moiré provides an opportunity to decrease the number of projected patterns. However, in previous attempts to apply digital phase-shifting moiré to perform 3D surface-shape measurement, there have been significant limitations. To address the limitation of previous system-calibration techniques based on direct measurement of optical-setup parameters, a moiré-wavelength based phase-to-height mapping system-calibration method was developed. The moiré-wavelength refinement performs pixel-wise computation of the moiré wavelength based on the measured height (depth). In measurement of a flat plate at different depths, the range of root-mean-square (RMS) error was reduced from 0.334 to 0.828 mm using a single global wavelength across all pixels, to 0.204 to 0.261 mm using the new pixel-wise moiré-wavelength refinement. To address the limitations of previous grid removal techniques (precise mechanical grid translation, multiple-frame capture, moiré-pattern blurring, and measurement artifacts), a new grid removal technique was developed for single-frame digital moiré using combined stationary wavelet and Fourier transforms (SWT-FFT). This approach removes high frequency grid both straight and curved lines, without moiré-pattern artifacts, blurring, and degradation, and was an improvement compared to previous techniques. To address the limitations of the high number of projected patterns and captured images of temporal phase unwrapping (TPU) in fringe projection, and the low signal-to-noise ratio of the extended phase map of TPU in digital moiré, improved methods using two-image and three-image TPU in digital phase-shifting moiré were developed. For measurement of a pair of hemispherical objects with true radii 50.80 mm by two-image TPU digital moiré, least-squares fitted spheres to the measured 3D point clouds had errors of 0.03 mm and 0.06 mm, respectively (sphere fitting standard deviations 0.15 mm and 0.14 mm), and the centre-to-centre distance measurement between hemispheres had an error of 0.19 mm. The number of captured images required by this new method is one third that for three-wavelength heterodyne temporal phase unwrapping by fringe projection techniques, which would be advantageous in measuring dynamic objects, either moving or deforming.
Optical Inspection Of Microsystems
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Author : Wolfgang Osten
language : en
Publisher: CRC Press
Release Date : 2018-10-03
Optical Inspection Of Microsystems written by Wolfgang Osten and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-10-03 with Science categories.
Where conventional testing and inspection techniques fail at the micro-scale, optical techniques provide a fast, robust, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems is the first comprehensive, up-to-date survey of the most important and widely used full-field optical metrology and inspection technologies. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moiré techniques, interference microscopy, laser Doppler vibrometry, holography, speckle metrology, and spectroscopy. They also examine modern approaches to data acquisition and processing. The book emphasizes the evaluation of various properties to increase reliability and promote a consistent approach to optical testing. Numerous practical examples and illustrations reinforce the concepts. Supplying advanced tools for microsystem manufacturing and characterization, Optical Inspection of Microsystems enables you to reach toward a higher level of quality and reliability in modern micro-scale applications.
Handbook Of Optical Metrology
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Author : Toru Yoshizawa
language : en
Publisher: CRC Press
Release Date : 2009-02-25
Handbook Of Optical Metrology written by Toru Yoshizawa and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-02-25 with Science categories.
The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals. Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications. With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter that make this a valuable reference for all those involved with optical metrology.
Optical Methods For Solid Mechanics
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Author : Pramod K. Rastogi
language : en
Publisher: John Wiley & Sons
Release Date : 2013-03-11
Optical Methods For Solid Mechanics written by Pramod K. Rastogi and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-11 with Science categories.
Unique within the field for being written in a tutorial style, this textbook adopts a step-by-step approach to the background needed for understanding a wide range of full-field optical measurement techniques in solid mechanics. This method familiarizes readers with the essentials of imaging and full-field optical measurement techniques, helping them to identify the appropriate techniques and in assessing measurement systems. In addition, readers learn the appropriate rules of thumb as a guide to better experimental performance from the applied techniques. Rather than presenting an exhaustive overview on the subject, each chapter provides a concise introduction to the concepts and principles, integrates solved problems within the text, summarizes the essence at the end, and includes unsolved problems. With its coverage of topics also relevant for industry, this text is aimed at graduate students, researchers, and engineers involved in non-destructive testing for acoustics, mechanics, medicine, diagnosis on artwork and construction, and civil engineering.
Non Invasive Diagnostic Techniques In Clinical Dermatology
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Author : Enzo Berardesca
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-12-02
Non Invasive Diagnostic Techniques In Clinical Dermatology written by Enzo Berardesca and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-12-02 with Medical categories.
This book is a comprehensive but compact guide to the latest technical and technological developments in the growing field of non invasive diagnosis in clinical dermatology. Information is provided on the practical and technical characteristics of a wide range of equipment and methods for in vivo measurements that aid in the investigation of skin function, the evaluation of topically applied products and the monitoring of skin disease. Individual sections are devoted to imaging techniques, skin analysis, superficial skin analysis, skin mechanics, water and stratum corneum hydration and erythema and blood flow. All of the authors are experts in the field, with detailed knowledge of the techniques they describe. Non Invasive Diagnostic Techniques in Clinical Dermatology will be of value for all dermatologists, whether they are engaged in delivering patient care or in research programs, for cosmetic scientists and for biologists involved in skin research and product assessment.
Advanced Phase Shifting Algorithms For Accuracy Enhancement In Fringe Projection Profilometry
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Author : Thang Hoang
language : en
Publisher:
Release Date : 2011
Advanced Phase Shifting Algorithms For Accuracy Enhancement In Fringe Projection Profilometry written by Thang Hoang and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011 with categories.
