Quantitative Microanalysis With High Spatial Resolution
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Quantitative Microanalysis With High Spatial Resolution
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Author : G. W. Lorimer
language : en
Publisher: Ashgate Publishing
Release Date : 1981
Quantitative Microanalysis With High Spatial Resolution written by G. W. Lorimer and has been published by Ashgate Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 1981 with Technology & Engineering categories.
Quantitative Microanalysis With High Spatial Resolution
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Author :
language : en
Publisher:
Release Date : 2001
Quantitative Microanalysis With High Spatial Resolution written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with categories.
To assist in the characterization of microstructural changes associated with irradiation damage in low alloy steels, the technique of quantitative x-ray mapping using a field emission gun scanning transmission electron microscope (FEG-STEM) equipped with an x-ray energy Dispersive spectrometer (XEDS) has been employed. Quantitative XEDS microanalyses of the matrix and grain boundaries of irradiated specimens have been compared with previous quantitative analyses obtained using 3D-Atom Probe Field-Ion Microscopy (3D-APFIM). In addition, the FEG-STEM XEDS maps obtained from the irradiated steel have revealed the presence of 2 to 3 nm Ni-enriched 'precipitates' in the matrix, which had previously been detected using 3D-APFIM. These quantitative FEG-STEM XEDS results represent the first direct and independent microchemical corroboration of the 3D-APFIM results showing ultra-fine irradiation-induced hardening features in low alloy steel.
Quantitative Microanalysis With High Spatial Resolution
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Author :
language : en
Publisher:
Release Date : 1981
Quantitative Microanalysis With High Spatial Resolution written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1981 with Electron metallography categories.
Quantitative Microanalysis With Spatial Resolution
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Author :
language : en
Publisher:
Release Date : 1981
Quantitative Microanalysis With Spatial Resolution written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1981 with categories.
High Resolution X Ray Imaging And Quantitative Microanalysis In Electron Microscopy
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Author : Chaoyi Teng
language : en
Publisher:
Release Date : 2020
High Resolution X Ray Imaging And Quantitative Microanalysis In Electron Microscopy written by Chaoyi Teng and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020 with categories.
"Scanning electron microscope/energy dispersive spectroscopy (SEM/EDS) systems are popular for X-ray microanalysis due to its simple and fast operation. Recent years, which use cold field emission sources and silicon drift detectors, are highly capable X-ray imaging and quantitative microanalysis tools. However, the analytical efficiency and accuracy of SEM/EDS still have room for improvement. Regarding X-ray elemental mapping in particular, the top concern is to collect sufficient X-ray counts. Unfortunately, high count rates are usually achieved with sacrificing acquisition efficiency or spatial resolution. Regarding the quantitative X-ray microanalysis, the accuracy of EDS is constantly being questioned. Thus, the objective of this study is to optimize the SEM/EDS, making it a more efficient and accurate analytical instrument. In this study, X-ray mapping was performed on rare earth minerals (REMs), which contain various phases and complicated elemental constituents. The data was collected using a cold field emission SEM (CFE-SEM) equipped with an annular SDD (aSDD). The traditional elemental maps usually have excessive noise and limited phase information, so phase map analysis was performed instead. Compared with the conventional SDD, the aSDD has a larger solid angle, which produces high count rate and allows for efficient analysis at a low beam energy. The enhanced spatial resolution enables the accurate identification of REM phases down to one micron. In addition, the multivariate statistical analysis (MSA), i.e. the principal components analysis (PCA) and the blind source separation (BSS), was performed on the phase maps of REMs. This analysis reduces the noise and improves the phase identification accuracy, shortening the necessary acquisition timeThe f-ratio method, which is a recently developed quantitative analysis method for binary systems based on a CFE-SEM/EDS, is used. This method incorporates traditional EDS experiments and Monte Carlo simulations. Standards with known compositions are needed to calibrate the differences between experiments and simulations. In this study, the f-ratio method was applied to multi-element systems, including two Mg-Al-Zn alloys, and three standard minerals [kyanite (Al2SiO5), albite (NaAlSi3O8) and orthoclase (KAlSi3O8)]. The requirement of standard option was extended to any standard containing one or more target elements. The influences of the beam current, beam energy, and the standard composition were investigated. It is shown that the beam current does not have obvious impacts on the quantification results, so the f-ratio method is suitable for long acquisition, even when suffering from current instabilities. In addition, using beam-energy-dependent calibration factors, the f-ratio method can achieve a satisfactory accuracy"--
Quantitative Microbeam Analysis
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Author : A.G Fitzgerald
language : en
Publisher: Routledge
Release Date : 2017-07-12
Quantitative Microbeam Analysis written by A.G Fitzgerald and has been published by Routledge this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-07-12 with Science categories.
Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used to analyze subatomic quantities of materials blasted from a surface by a laser or particle beam, providing information on the structure and composition of the material. Contributed to by international experts, the book is unique in the breadth of microbeam analytical techniques covered. For each technique, it develops the theoretical background, discusses practical details relating to choice of equipment, and describes the current advances. The book highlights developments relating to Auger electron spectroscopy in scanning electron microscopes and transmission electron microscopes and advances in surface analytical imaging and accelerated ion beam-surface interactions.
Principles Of Analytical Electron Microscopy
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Author : Joseph Goldstein
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-11
Principles Of Analytical Electron Microscopy written by Joseph Goldstein and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-11 with Science categories.
Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.
Handbook Of Microscopy For Nanotechnology
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Author : Nan Yao
language : en
Publisher: Springer
Release Date : 2008-11-01
Handbook Of Microscopy For Nanotechnology written by Nan Yao and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-11-01 with Technology & Engineering categories.
Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.
Microprobe Techniques In The Earth Sciences
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Author : Philip J. Potts
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Microprobe Techniques In The Earth Sciences written by Philip J. Potts and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
30% discount for members of The Mineralogical Society of Britain and Ireland This text covers the range of microanalytical techniques available for the analysis of geological samples, principally in research applications. Each chapter is written in a clear, informative style and has a tutorial element, designed to introduce each technique for the beginning and experienced researcher alike.
Scanning Electron Microscopy And X Ray Microanalysis
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Author : Joseph I. Goldstein
language : en
Publisher: Springer
Release Date : 2017-11-17
Scanning Electron Microscopy And X Ray Microanalysis written by Joseph I. Goldstein and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-11-17 with Technology & Engineering categories.
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners — engineers, technicians, physical and biological scientists, clinicians, and technical managers — will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope’s software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD). With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation. Includes case studies to illustrate practical problem solving Covers Helium ion scanning microscopy Organized into relatively self-contained modules – no need to "read it all" to understand a topic Includes an online supplement—an extensive "Database of Electron–Solid Interactions"—which can be accessed on SpringerLink, in Chapter 3