Random Testing Of Digital Circuits
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Random Testing Of Digital Circuits
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Author : Rene David
language : en
Publisher: CRC Press
Release Date : 2020-11-26
Random Testing Of Digital Circuits written by Rene David and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-11-26 with Technology & Engineering categories.
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Digital Circuit Testing And Testability
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Author : Parag K. Lala
language : en
Publisher: Academic Press
Release Date : 1997
Digital Circuit Testing And Testability written by Parag K. Lala and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997 with Computers categories.
An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Testing Digital Circuits
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Author : B. R. Wilkins
language : en
Publisher: John Wiley & Sons
Release Date : 1986
Testing Digital Circuits written by B. R. Wilkins and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986 with Digital electronics categories.
Testing Digital Circuits
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Author : Brian R. Wilkins
language : en
Publisher:
Release Date : 1986
Testing Digital Circuits written by Brian R. Wilkins and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986 with Digital electronics categories.
Efficiency Of Compact Testing For Sequential Circuits
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Author : Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory
language : en
Publisher:
Release Date : 1976
Efficiency Of Compact Testing For Sequential Circuits written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1976 with categories.
Compact testing uses random inputs to test digital circuits. Detection is achieved by comparison between some statistic property of the circuit under test, like the frequency of ones on the output line, and the same property for the fault-free circuit. This paper shows that compact testing can be used efficiently for sequential machines, although it has some inherent limitations. Synchronization is achieved by a long sequence of random inputs whose length is circuit dependent. However, for most sequential circuits, synchronization can be achieved in a few seconds. The great majority of failures inside the memory elements are easily detected even with short tests. Compact testing also detects most of the failures in the combinational parts. There, its efficiency is largely dependent upon the test length and also the characteristics of the random number generators. However, even the most subtle failures may be detected if the test has sufficient length. Some of the requirements and trade-offs to achieve efficient detection are presented.
Optimal Random Testing Of Single Intermittent Failures In Combinational Circuits
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Author : Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory
language : en
Publisher:
Release Date : 1976
Optimal Random Testing Of Single Intermittent Failures In Combinational Circuits written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1976 with Integrated circuits categories.
Testing Digital Circuits
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Author : Brian Richard Wilkins
language : en
Publisher:
Release Date : 1994
Testing Digital Circuits written by Brian Richard Wilkins and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Digital electronics categories.
Digital Circuit Testing
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Author : Francis C. Wong
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Digital Circuit Testing written by Francis C. Wong and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Technology & Engineering categories.
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Testing Digital Circuits
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Author : A. Wilkins
language : en
Publisher:
Release Date : 1986
Testing Digital Circuits written by A. Wilkins and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986 with Digital electronics categories.
Fault Diagnosis Of Digital Circuits
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Author : V. N. Yarmolik
language : en
Publisher: John Wiley & Sons
Release Date : 1990
Fault Diagnosis Of Digital Circuits written by V. N. Yarmolik and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990 with Technology & Engineering categories.
The continual explosion of computer development has led to inadequate coverage of proper & useful on-line testing techniques. This text fills the gap in the literature by presenting the latest techniques available for digital devices used in the most popular computers. Initial chapters explore the classic problems of on-line testing, pointing out the limited applications of conventional approaches to the problem of diagnosing digital devices using LSI & VLSI chips. Chapters 4-7 cover compact testing methods used to diagnose complex digital circuits. Chapters 8 & 9 analyze the techniques of compressing output responses of a digital circuit, while chapter 10 surveys promising recent signature generation techniques for binary sequences. The final chapter covers multi-output digital circuits.