Random Testing Of Digital Circuits
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Random Testing Of Digital Circuits
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Author : David
language : en
Publisher: CRC Press
Release Date : 2020-11-25
Random Testing Of Digital Circuits written by David and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-11-25 with Technology & Engineering categories.
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Soc Design Methodologies
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Author : Michel Robert
language : en
Publisher: Springer
Release Date : 2013-03-15
Soc Design Methodologies written by Michel Robert and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-15 with Technology & Engineering categories.
The 11 th IFIP International Conference on Very Large Scale Integration, in Montpellier, France, December 3-5,2001, was a great success. The main focus was about IP Cores, Circuits and System Designs & Applications as well as SOC Design Methods and CAD. This book contains the best papers (39 among 70) that have been presented during the conference. Those papers deal with all aspects of importance for the design of the current and future integrated systems. System on Chip (SOC) design is today a big challenge for designers, as a SOC may contain very different blocks, such as microcontrollers, DSPs, memories including embedded DRAM, analog, FPGA, RF front-ends for wireless communications and integrated sensors. The complete design of such chips, in very deep submicron technologies down to 0.13 mm, with several hundreds of millions of transistors, supplied at less than 1 Volt, is a very challenging task if design, verification, debug and industrial test are considered. The microelectronic revolution is fascinating; 55 years ago, in late 1947, the transistor was invented, and everybody knows that it was by William Shockley, John Bardeen and Walter H. Brattein, Bell Telephone Laboratories, which received the Nobel Prize in Physics in 1956. Probably, everybody thinks that it was recognized immediately as a major invention.
Field Programmable Logic And Applications The Roadmap To Reconfigurable Computing
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Author : Reiner W. Hartenstein
language : en
Publisher: Springer
Release Date : 2003-06-29
Field Programmable Logic And Applications The Roadmap To Reconfigurable Computing written by Reiner W. Hartenstein and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-06-29 with Computers categories.
This book is the proceedings volume of the 10th International Conference on Field Programmable Logic and its Applications (FPL), held August 27 30, 2000 in Villach, Austria, which covered areas like reconfigurable logic (RL), reconfigurable computing (RC), and its applications, and all other aspects. Its subtitle "The Roadmap to Reconfigurable Computing" reminds us, that we are currently witnessing the runaway of a breakthrough. The annual FPL series is the eldest international conference in the world covering configware and all its aspects. It was founded 1991 at Oxford University (UK) and is 2 years older than its two most important competitors usually taking place at Monterey and Napa. FPL has been held at Oxford, Vienna, Prague, Darmstadt, London, Tallinn, and Glasgow (also see: http://www. fpl. uni kl. de/FPL/). The New Case for Reconfigurable Platforms: Converging Media. Indicated by palmtops, smart mobile phones, many other portables, and consumer electronics, media such as voice, sound, video, TV, wireless, cable, telephone, and Internet continue to converge. This creates new opportunities and even necessities for reconfigurable platform usage. The new converged media require high volume, flexible, multi purpose, multi standard, low power products adaptable to support evolving standards, emerging new standards, field upgrades, bug fixes, and, to meet the needs of a growing number of different kinds of services offered to zillions of individual subscribers preferring different media mixes.
Testing Digital Circuits
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Author : B. R. Wilkins
language : en
Publisher: John Wiley & Sons
Release Date : 1986
Testing Digital Circuits written by B. R. Wilkins and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986 with Technology & Engineering categories.
Digital Communications At Crossroads In Africa
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Author : Kehbuma Langmia
language : en
Publisher: Springer Nature
Release Date : 2020-04-27
Digital Communications At Crossroads In Africa written by Kehbuma Langmia and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-04-27 with Social Science categories.
Digital communication as it is practiced in Africa today is at a crossroad. This edited collection takes that crossroad as its starting point, as it both examines the complicated present and looks to the uncertain future of African communication systems. Contributing authors explore how western digital communication systems have proliferated in the African communication landscape, and argue that rich and long-cherished African forms of communal, in-person communication have been increasingly abandoned in favor of assimilation to western digital norms. As a result, future generations of Africans born on the continent and abroad may never recognize and appreciate African systems of communications. Acknowledging that globalized digital communication systems are here to stay, the volume contends that in order to comprehend the past, present, and future of African communications, scholars need to decolonize their approach to teaching and consuming mediated and in-person communications on the African continent and abroad.
Hierarchical Modeling For Vlsi Circuit Testing
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Author : Debashis Bhattacharya
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Hierarchical Modeling For Vlsi Circuit Testing written by Debashis Bhattacharya and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Computers categories.
Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated circuit technology. It is long been recognized that the testing prob lem can be alleviated by the use of higher-level methods in which multigate modules or cells are the primitive components in test generation; however, the development of such methods has proceeded very slowly. To be acceptable, high-level approaches should be applicable to most types of digital circuits, and should provide fault coverage comparable to that of traditional, low-level methods. The fault coverage problem has, perhaps, been the most intractable, due to continued reliance in the testing industry on the single stuck-line (SSL) fault model, which is tightly bound to the gate level of abstraction. This monograph presents a novel approach to solving the foregoing problem. It is based on the systematic use of multibit vectors rather than single bits to represent logic signals, including fault signals. A circuit is viewed as a collection of high-level components such as adders, multiplexers, and registers, interconnected by n-bit buses. To match this high-level circuit model, we introduce a high-level bus fault that, in effect, replaces a large number of SSL faults and allows them to be tested in parallel. However, by reducing the bus size from n to one, we can obtain the traditional gate-level circuit and models.
Defect Oriented Testing For Cmos Analog And Digital Circuits
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Author : Manoj Sachdev
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-06-29
Defect Oriented Testing For Cmos Analog And Digital Circuits written by Manoj Sachdev and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-06-29 with Technology & Engineering categories.
Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks, traditional fault modeling and test approaches will become increasingly inadequate. Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives. Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subject. It is essential reading for all design and test professionals as well as researchers and students working in the field. `A strength of this book is its breadth. Types of designs considered include analog and digital circuits, programmable logic arrays, and memories. Having a fault model does not automatically provide a test. Sometimes, design for testability hardware is necessary. Many design for testability ideas, supported by experimental evidence, are included.' ... from the Foreword by Vishwani D. Agrawal
Fundamentals Of Computation Theory
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Author : Lothar Budach
language : en
Publisher: Springer Science & Business Media
Release Date : 1987-12-09
Fundamentals Of Computation Theory written by Lothar Budach and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987-12-09 with Computers categories.
This volume contains abridged versions of most of the sectional talks and some invited lectures given at the International Conference on Fundamentals of Computation Theory held at Kazan State University, Kazan, USSR, June 22-26, 1987. The conference was the sixth in the series of FCT Conferences organized every odd year, and the first one to take place in the USSR. FCT '87 was organized by the Section of Discrete Mathematics of the Academy of Sciences in the USSR, the Moscow State University (Department of Discrete Mathematics), and the Kazan State University (Department of Theoretical Cybernetics). This volume contains selected contributions to the following fields: Mathematical Models of Computation, Synthesis and Complexity of Control Systems, Probabilistic Computations, Theory of Programming, Computer-Assisted Deduction. The volume reflects the fact that FCT '87 was organized in the USSR: A wide range of problems typical of research in Mathematical Cybernetics in the USSR is comprehensively represented.
Built In Test
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Author :
language : en
Publisher:
Release Date : 1983
Built In Test written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1983 with Automatic test equipment categories.
Multi Run Memory Tests For Pattern Sensitive Faults
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Author : Ireneusz Mrozek
language : en
Publisher: Springer
Release Date : 2018-07-06
Multi Run Memory Tests For Pattern Sensitive Faults written by Ireneusz Mrozek and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-07-06 with Technology & Engineering categories.
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process; Presents practical algorithms for design and implementation of efficient multi-run tests; Demonstrates methods verified by analytical and experimental investigations.