Secondary Ion Mass Spectrometry Sims Ii
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Secondary Ion Mass Spectrometry Sims Ii
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Author : A. Benninghoven
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-11
Secondary Ion Mass Spectrometry Sims Ii written by A. Benninghoven and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-11 with Science categories.
Secondary Ion Mass Spectrometry Sims Ii Proceedings Of The 2 International Conference On Secondary Ion Mass Spectrometry Sims Ii
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Author : Alfred Benninghoven
language : de
Publisher:
Release Date : 1979
Secondary Ion Mass Spectrometry Sims Ii Proceedings Of The 2 International Conference On Secondary Ion Mass Spectrometry Sims Ii written by Alfred Benninghoven and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1979 with categories.
Secondary Ion Mass Spectrometry
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Author : A. Benninghoven
language : en
Publisher:
Release Date : 1979
Secondary Ion Mass Spectrometry written by A. Benninghoven and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1979 with categories.
Secondary Ion Mass Spectrometry Sims Ii
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Author : A. Benninghoven
language : en
Publisher:
Release Date : 2014-01-15
Secondary Ion Mass Spectrometry Sims Ii written by A. Benninghoven and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-01-15 with categories.
Secondary Ion Mass Spectrometry
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Author : Paul van der Heide
language : en
Publisher: John Wiley & Sons
Release Date : 2014-08-19
Secondary Ion Mass Spectrometry written by Paul van der Heide and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-08-19 with Science categories.
Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations • Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission • Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) • Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions • Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other
Secondary Ion Mass Spectrometry Sims Ii Proceedings Of The 3rd International Conference Technical University Budapest Hungary August 30 September 5 1981
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Author : International Conference on Secondary Ion Mass Spectrometry
language : en
Publisher:
Release Date : 1982
Secondary Ion Mass Spectrometry Sims Ii Proceedings Of The 3rd International Conference Technical University Budapest Hungary August 30 September 5 1981 written by International Conference on Secondary Ion Mass Spectrometry and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1982 with categories.
Secondary Ion Mass Spectrometry
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Author : Robert G. Wilson
language : en
Publisher: Wiley-Interscience
Release Date : 1989-11-16
Secondary Ion Mass Spectrometry written by Robert G. Wilson and has been published by Wiley-Interscience this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989-11-16 with Science categories.
Seco ndary Ion Mass Spectrometry Basic Concepts, Instrumental Aspects, Applications and Trends (Volume 86 in Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications) A. Benninghoven, F. G. Rüdenauer, and H. W. Werner "[This book] is (and probably will be for a long time ahead) the standard book on secondary ion mass spectrometry." —Trends in Analytical Chemistry "This is a monumental work, and contains nearly 600 illustrations and over 2,000 references covering nearly all the essential published information up to 1985. The book will certainly find its place as a reference work in most laboratories using this methodology" —Analytica Chimica Acta 1987 (0 471-01056-1) 1,227 pp. Secondary Ion Mass Spectrometry Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI) Edited by A. Benninghoven, A.M. Huber, and H. W. Werner "The international SIMS conferences have been held every two years since 1977. They are recognized as one of the major forums for scientists, instrument manufacturers, and other researchers actively engaged in this rapidly expanding field…this volume is a valuable account of the latest advances in the field of SIMS, and of the research trends of some of the most respected experts in the field.…it is recommended for the libraries of all academic and industrial institutions where SIMS research is ongoing.…it should prove a valuable reference source for years to come." —Applied Spectroscopy 1988 (0 471-91832-6) 1,078 pp.
Secondary Ion Mass Spectrometry Sims Iv
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Author : A. Benninghoven
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Secondary Ion Mass Spectrometry Sims Iv written by A. Benninghoven and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
This volume contains full proceedings of the Fourth International Conference on Secondary Ion Mass Spectrometry (SIMS-IV), held in the Minoo-Kanko Hotel, Osaka, Japan, from November 13th to 19th, 1983. Coordinated by a local or ganizing committee under the auspices of the international organizing com mittee, it followed earlier conferences held in MUnster (1977), Stanford (1979), and Budapest (1981). The conference was attended by about 250 participants from 18 countries, and 130 papers including 24 invited ones were presented. Reflecting the rap idly expanding activities in the SIMS field, informative papers were pre sented containing up-to-date information on SIMS and various related fields. The proceedings focussed upon six main issues: (1) Fundamentals of sput tering and secondary ion formation. (2) Recent progress in instrumentation, including submicron SIMS and image processing. (3) SIMS combined with other surface analysis techniques. (4) Outstanding SIMS-related analytical methods such as laser-microprobe SIMS, sputtered neutral mass spectrometry, mass spectrometry of sputtered neutrals by multi-photon resonance ionization, and accelerator-based SIMS. (5) Organic SIMS and FAB which has recently become a rapidly expanding technique in pharmacy, biotechnology, etc. (6) Appl ica tions of SIMS to various fields such as metallurgy, geology, and biology, including depth profiling of semiconductors, and analysis of inorganic mate rials. As a venue for the exchange of ideas and information concerning all the above issues, the conference proved a great success.
Secondary Ion Mass Spectrometry Sims V
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Author : Alfred Benninghoven
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Secondary Ion Mass Spectrometry Sims V written by Alfred Benninghoven and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
This volume contains the proceedings of the Fifth International Confer ence on Secondary Ion Mass Spectrometry (SIMS V), held at the Capitol Holiday Inn, Washington, DC, USA, from September 30 to October 4, 1985. The conference was the fifth in a series of conferences held bienni ally. Previous conferences were held in Miinster (1977), Stanford (1979), Budapest (1981), and Osaka (1983). SIMS V was organized by Dr. R.J. Colton of the Nayal Research Lab oratory and Dr. D.S. Simons of the National Bureau of Standards un der the auspices of the International Organizing Committee chaired by Prof. A. Benninghoven of the Universitat Miinster. Dr. Richard F.K. Herzog served as the honorary chairman of SIMS V. While Dr. Herzog is best known to the mass spectrometry community for his theoretical development of a mass spectrometer design, known as the Mattauch-Herzog geometry, he also made several early and impor tant contributions to SIMS. In 1949, Herzog and Viehbock published a description of the first instrument designed to study secondary ions pro duced by bombardment from a beam of ions generated in a source that was separated from the sample by a narrow tube. Later at the GCA Cor poration, he brought together a team of researchers including H.J. Liebl, F.G. Riidenauer, W.P. Poschenrieder and F.G. Satkiewicz, who designed and built, and carried out applied research with the first commercial ion microprobe.
An Introduction To Time Of Flight Secondary Ion Mass Spectrometry Tof Sims And Its Application To Materials Science
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Author : Sarah Fearn
language : en
Publisher: Morgan & Claypool Publishers
Release Date : 2015-10-16
An Introduction To Time Of Flight Secondary Ion Mass Spectrometry Tof Sims And Its Application To Materials Science written by Sarah Fearn and has been published by Morgan & Claypool Publishers this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-10-16 with Technology & Engineering categories.
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.