Study Of Transient Radiation Effects On Microelectronics Volume I Introduction Experimental Study Digital Logic Gate Study
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Study Of Transient Radiation Effects On Microelectronics Volume I Introduction Experimental Study Digital Logic Gate Study
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Author : James P. Raymond
language : en
Publisher:
Release Date : 1965
Study Of Transient Radiation Effects On Microelectronics Volume I Introduction Experimental Study Digital Logic Gate Study written by James P. Raymond and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1965 with categories.
The purpose was to compare microcircuits of differing construction techniques to determine their relative vulnerability, to study basic radiation-induced failure mechanisms, and to relate these mechanisms to both construction technique and circuit design. Test specimens were of three basic circuit types of five different fabrication techniques. Circuit types included digital logic gates, flip-flops, and differential or digital sense amplifiers. Fabrication techniques represented monolithic, multiple-chip, thin film compatible, oxide-isolation, and thin-film hybrid. Experimental study consisted of determining the electrical circuit performance parameters, the transient response in pulsed ionizing radiation environments, and permanent degradation from exposure to a pulsed reactor neutron/gamma environment. Failure mechanisms were, when possible, related analyticall, to the characteristics of the circuit and the fabrication technique. (Author).
Technical Abstract Bulletin
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Author :
language : en
Publisher:
Release Date :
Technical Abstract Bulletin written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on with Science categories.
Government Wide Index To Federal Research Development Reports
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Author :
language : en
Publisher:
Release Date : 1966
Government Wide Index To Federal Research Development Reports written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1966 with Government publications categories.
Microcircuit Reliability Bibliography
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Author :
language : en
Publisher:
Release Date : 1974
Microcircuit Reliability Bibliography written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1974 with Integrated circuits categories.
Study Of Transient Radiation Effects On Microelectronics Volume Ii Flip Flop Study Amplifier Study Supplementary Circuit Investigation Conclusions And Recommendations
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Author : James P. Raymond
language : en
Publisher:
Release Date : 1965
Study Of Transient Radiation Effects On Microelectronics Volume Ii Flip Flop Study Amplifier Study Supplementary Circuit Investigation Conclusions And Recommendations written by James P. Raymond and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1965 with categories.
The transient radiation effects in 17 circuit types were experimentally studied in detail. Conclusions regarding the vulnerability of each circuit type were presented in the previous discussions. The overall conclusion might be that the circuit design is the most important consideration in the circuit vulnerability with the specific circuit fabrication technique closely following. Optimum circuit design will include the widest allowable margin for transistor neutron-induced gain degradation and a trade-off between the ionizing-radiation compensation and turn-on transistor photocurrents. Observed transient responses in the p-n junction isolation circuits were substantially greater than the responses observed in the passive substrate or polycrystalline-oxide isolation circuits. For identical circuits the low level ionizing radiation response would be the greatest for the monolithic-chip circuit followed by the compatible thin-film, polycrystalline-oxide, multiple-chip and thin-film hybrid in order of decreasing response. With the exception of the monolithic response, the relative circuit response between types will be dominated by the specific circuit characteristics. (Author).
Business Service Check List
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Author :
language : en
Publisher:
Release Date : 1965
Business Service Check List written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1965 with Industries categories.
Study Of Transient Radiation Effects On Microelectronics
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Author : Edward J. Steele
language : en
Publisher:
Release Date : 1967
Study Of Transient Radiation Effects On Microelectronics written by Edward J. Steele and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1967 with categories.
The purpose was to determine microcircuit vulnerability in a transient radiation environment. Microcircuits constructed by different fabrication techniques were experimentally evaluated in an ionizing and bulk displacement radiation environment to study the basic failure mechanisms. Test specimens were of three basic circuit types; gates, flip-flops, and amplifiers. Fabrication techniques represented were monolithic p-n junction isolation, monolithic oxide-isolation, multiple chip, thin-film compatible, and thin-film hybrid. Circuit failure thresholds were determined as a function of fan-out, ambient temperature requirements, and electrical parameter degradation. Experimental study consisted of measuring transient responses in pulsed ionizing radiation environments, and determining bulk displacement effects from exposure to a reactor neutron/gamma environment. Failure mechanisms were analytically related to the characteristics of the circuit design and fabrication technique. (Author).
Laboratory Testing And Theoretical Studies In Transient Radiation Effects On Microelectronics
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Author : W. W. GRANNEMANN
language : en
Publisher:
Release Date : 1966
Laboratory Testing And Theoretical Studies In Transient Radiation Effects On Microelectronics written by W. W. GRANNEMANN and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1966 with categories.
A series of experimental studies was conducted on transistor elements suitable for microcircuits. A relationship of transient radiation effects to active volume and other parameters was made. The experimental and theoretical method developed offers a way of obtaining minority carrier lifetimes, depletion layer width, junction area, diffusion length, and active volume when the absorbed dose and the ionization efficiency are known in the transistor element of a microcircuit. Conversely, given the above parameters it is possible to determine the primary photocurrent of the microcircuit junction under a variety of radiation conditions. It was shown that the fundamental Boltzmann equation describing charge transport in semiconductors can be used to modify the usual continuity equation to obtain a more accurate circuit model for transistor elements in microcircuits. The oxide-isolated microcircuits were tested and compared with the usual backbiased isolation junction diode type.
Bibliography Of Scientific And Industrial Reports
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Author :
language : en
Publisher:
Release Date : 1970-05
Bibliography Of Scientific And Industrial Reports written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1970-05 with Science categories.
Eee
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Author :
language : en
Publisher:
Release Date : 1969-07
Eee written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1969-07 with Electronic apparatus and appliances categories.