Synchrotron White Beam X Ray Topography Characterization Of Lgx And Sxgs Bulk Single Crystals Thin Films And Piezoelectric Devices
DOWNLOAD
Download Synchrotron White Beam X Ray Topography Characterization Of Lgx And Sxgs Bulk Single Crystals Thin Films And Piezoelectric Devices PDF/ePub or read online books in Mobi eBooks. Click Download or Read Online button to get Synchrotron White Beam X Ray Topography Characterization Of Lgx And Sxgs Bulk Single Crystals Thin Films And Piezoelectric Devices book now. This website allows unlimited access to, at the time of writing, more than 1.5 million titles, including hundreds of thousands of titles in various foreign languages. If the content not found or just blank you must refresh this page
Synchrotron White Beam X Ray Topography Characterization Of Lgx And Sxgs Bulk Single Crystals Thin Films And Piezoelectric Devices
DOWNLOAD
Author :
language : en
Publisher:
Release Date : 2007
Synchrotron White Beam X Ray Topography Characterization Of Lgx And Sxgs Bulk Single Crystals Thin Films And Piezoelectric Devices written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007 with categories.
This project comprised a program of research aimed at applying the technique of Synchrotron White Beam X-ray Topography (SWBXT), supplemented by the complementary technique of High Resolution Triple-Axis X-ray Diffraction (HRTXD), to the determination of defect and general distortion distributions in novel LGX piezoelectric crystals with a view to enabling improvement in crystal quality and consequently in piezoelectric device performance. The LGX family of compounds, which includes langanite, LGS (La3Ga5SiO14), and its isomorphs, langanite or LGN (La3Ga5.5Nb0.5O14) and langatate or LGT (La3Ga5.5Ta0.5O14), as well as several other variants, are of current interest for application as bulk wave resonators for precision oscillators, with all these materials exhibiting high piezoelectric coupling, low acoustic loss (high Q) and temperature compensation. However, the influence of crystal quality on piezoelectric properties, for example, on mode shapes dictates that high quality crystals are required for this technology to reach full potential. This requires collaboration between crystal growers and characterizers to gain an understanding of the defect content of the crystals and to enable optimization of growth parameters. To this end, detailed SWBXT studies will be carried out on: (1) bulk LGX crystals grown using the Czochralski technique, (2) homo- and heteroepitaxial thin films of LGX, and (3) various LGX resonator structures including Surface Acoustic Wave (SAW) resonators. (4) Selected Quartz Resonators (5) SiC substrates/epilayers.
X Ray Diffraction From Thin Film Structures
DOWNLOAD
Author : Ge Liu
language : en
Publisher:
Release Date : 2007
X Ray Diffraction From Thin Film Structures written by Ge Liu and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007 with categories.
InAs/GaSb superlattices grown via molecular beam epitaxy, and containing InSb-like interfacial layers, were analyzed with a combination of x-ray diffraction (XRD) and structural refinement techniques. The superlattice refinement from x-rays (SUPREX) method determines with high accuracy the average thicknesses and d-spacings of the individual InAs and GaSb layers in addition to standard structural parameters usually obtained by XRD, such as the modulation length (periodicity), average out-of-plane interplanar spacings, and total thickness. The combined SUPREX/XRD experiments show that the absence of certain odd order satellite features in the x-ray data is due to asymmetric and inhomogeneous lattice strain. \textit{Ex situ}-annealed InAs/GaSb superlattices were studied using atomic force microscopy (AFM) and XRD methods. Results show that annealing at temperatures between 200 °C and 300 °C for 1 hour in HVAC improves the structural quality of these superlattices. Strain relaxation occurs during the annealing process indicating that there are chemical intermixing and anion segregation in the superlattices. The effect of the inner-molecular electron density on the x-ray diffraction profile of a layer-stacked thin film is studied. Important phase information contained in the x-ray diffraction profile of highly anisotropic molecular-based thin films is charaterized. The experimental and calculated results show that the intensity distribution of the diffraction peaks belonging to the same lattice orientation provides important structural information. For example, tilt angle and core electron density of a molecule can be determined from the intensity distribution. The out-of-plane tilt angle relaxation is studied numerically. The results show that the relaxation can only occur at the first phthalocyanine monolayer above the substrate. The lateral grain size effect and the polar angle anisotropy are studied using a three-dimensional model. The FWHM of the center peak in associated rocking curves gives lateral coherence length or lateral grain size, and the ratio of the intensities from the diffraction peaks in normal diffraction curves shows the uniaxial angular anisotropy of the phthalocyanine thin films.
The Quartz Crystal Microbalance In Soft Matter Research
DOWNLOAD
Author : Diethelm Johannsmann
language : en
Publisher: Springer
Release Date : 2014-07-17
The Quartz Crystal Microbalance In Soft Matter Research written by Diethelm Johannsmann and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-07-17 with Science categories.
This book describes the physics of the second-generation quartz crystal microbalance (QCM), a fundamental method of analysis for soft matter at interfaces. From a device for measuring film thickness in vacuum, the quartz crystal microbalance (QCM) has in the past two decades evolved into a versatile instrument for analyzing soft matter at solid/liquid and solid/gas interfaces that found applications in diverse fields including the life sciences, material science, polymer research and electrochemistry. As a consequence of this success, the QCM is now being used by scientists with a wide variety of backgrounds to study an impressive diversity of samples, with intricate data analysis methods being elaborated along the way. It is for these practitioners of the QCM that the book is written. It brings across basic principles behind the technique and the data analysis methods in sufficient detail to be educational and in a format that is accessible to anyone with an undergraduate level knowledge of any of the physical or natural sciences. These principles concern the analysis of acoustic shear waves and build on a number of fundamental physical concepts which many users of the technique do not usually come across. They have counterparts in optical spectroscopy, electrical engineering, quantum mechanics, rheology and mechanics, making this book a useful educational resource beyond the QCM itself. The main focus is the physics of QCM, but as the book describes the behavior of the QCM when exposed to films, droplets, polymer brushes, particles, vesicles, nanobubbles and stick-slip, it also offers insight into the behavior of soft matter at interfaces in a more general sense.