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2001 Ieee International Integrated Reliability Workshop

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2001 Ieee International Integrated Reliability Workshop

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Author :
language : en
Publisher:
Release Date : 2001

2001 Ieee International Integrated Reliability Workshop written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Integrated circuits categories.

2001 Ieee International Integrated Reliability Workshop

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Author : IEEE Electron Devices Society
language : en
Publisher: IEEE
Release Date : 2001

2001 Ieee International Integrated Reliability Workshop written by IEEE Electron Devices Society and has been published by IEEE this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Technology & Engineering categories.

2017 Ieee International Integrated Reliability Workshop Iirw

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Author :
language : en
Publisher:
Release Date : 2017

2017 Ieee International Integrated Reliability Workshop Iirw written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017 with Integrated circuits categories.

2017 Ieee International Integrated Reliability Workshop Iirw

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Author : IEEE Staff
language : en
Publisher:
Release Date : 2017-10-08

2017 Ieee International Integrated Reliability Workshop Iirw written by IEEE Staff and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-10-08 with categories.

The IEEE International Integrated Reliability Workshop (IIRW) focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems Topics include resistive memories, high k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, III V, SOI, emerging memory technologies, transistor reliability including hot carriers and NBTI PBTI, root cause defects (physical mechanisms and simulations), Cu interconnects and low k dielectrics, impact of transistor degradation on circuit reliability, MEMS and sensor reliability, designing in reliability (products, circuits, systems, processes), customer product reliability requirements manufacturer reliability tasks, wafer level reliability tests (test approaches and reliability test structures), reliability modeling and simulation, optoelectronics, and single event upsets

2013 Ieee International Integrated Reliability Workshop Iirw

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Author : IEEE Staff
language : en
Publisher:
Release Date : 2013-10-13

2013 Ieee International Integrated Reliability Workshop Iirw written by IEEE Staff and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-13 with Technology & Engineering categories.

2011 Ieee International Integrated Reliability Workshop Final Report

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Author : IEEE Staff
language : en
Publisher:
Release Date : 2011-10-16

2011 Ieee International Integrated Reliability Workshop Final Report written by IEEE Staff and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-10-16 with Integrated circuits categories.