Aberration Corrected Analytical Transmission Electron Microscopy Of Light Elements In Complex Oxides
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Aberration Corrected Analytical Transmission Electron Microscopy Of Light Elements In Complex Oxides
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Author : Dan Zhou
language : en
Publisher:
Release Date : 2015
Aberration Corrected Analytical Transmission Electron Microscopy Of Light Elements In Complex Oxides written by Dan Zhou and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015 with categories.
Aberration Corrected Analytical Transmission Electron Microscopy Of Light Elements In Complex Oxides Application And Methodology
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Author : Dan Zhou
language : en
Publisher:
Release Date : 2016
Aberration Corrected Analytical Transmission Electron Microscopy Of Light Elements In Complex Oxides Application And Methodology written by Dan Zhou and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016 with categories.
Aberration Corrected Analytical Transmission Electron Microscopy Of Light Elements In Complex Oxides Application And Methodology
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Author : Dan Zhou
language : en
Publisher:
Release Date : 2016
Aberration Corrected Analytical Transmission Electron Microscopy Of Light Elements In Complex Oxides Application And Methodology written by Dan Zhou and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016 with categories.
Direct Imaging Of Light Elements In Aberration Corrected Scanning Transmission Electron Microscopy
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Author :
language : en
Publisher:
Release Date : 2009
Direct Imaging Of Light Elements In Aberration Corrected Scanning Transmission Electron Microscopy written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009 with categories.
Light Element Analysis In The Transmission Electron Microscope Wedx And Eels
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Author : Peter M. Budd
language : en
Publisher: Oxford University Press, USA
Release Date : 1988
Light Element Analysis In The Transmission Electron Microscope Wedx And Eels written by Peter M. Budd and has been published by Oxford University Press, USA this book supported file pdf, txt, epub, kindle and other format this book has been release on 1988 with Language Arts & Disciplines categories.
Emphasizing practical application over theory, this book explains in simple terms the two major techniques by which analysis of very light elements using the transmission electron microscope (TEM) is performed: x-ray analysis without a window (WEDX) and electron energy loss spectroscopy (EELS). Readers familiar with the TEM will quickly learn how to analyse for the light elements (boron, carbon, nitrogen, oxygen, and fluorine). Each technique is first described as it is used for qualitative analysis, and then quantitative analysis is developed. In a final chapter, the two techniques are compared. The book is a practical guide for biologists and for researchers in the medical, physical, and materials sciences.
Aberration Corrected Analytical Transmission Electron Microscopy
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Author : Rik Brydson
language : en
Publisher: John Wiley & Sons
Release Date : 2011-08-02
Aberration Corrected Analytical Transmission Electron Microscopy written by Rik Brydson and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-08-02 with Science categories.
The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
Scanning Transmission Electron Microscopy Of Nanomaterials Basics Of Imaging And Analysis
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Author : Nobuo Tanaka
language : en
Publisher: World Scientific
Release Date : 2014-08-21
Scanning Transmission Electron Microscopy Of Nanomaterials Basics Of Imaging And Analysis written by Nobuo Tanaka and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-08-21 with Science categories.
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
Scanning Transmission Electron Microscopy
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Author : Alina Bruma
language : en
Publisher: CRC Press
Release Date : 2020-12-22
Scanning Transmission Electron Microscopy written by Alina Bruma and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-12-22 with Technology & Engineering categories.
Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications The information comprised in this book is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.
Aberration Correction For Analytical In Situ Tem The Nteam Concept
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Author :
language : en
Publisher:
Release Date : 2002
Aberration Correction For Analytical In Situ Tem The Nteam Concept written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002 with categories.
Future aberration corrected transmission electron microscopes (TEM) will have a strong impact in materials science, since such microscopes yield information on chemical bonding and structure of interfaces, grain boundaries and lattice defects at an atomic level. Beyond this aberration correction offers new possibilities for in situ experiments performed under controlled temperature, magnetic field, strain etc. at atomic resolution. Such investigations are necessary for solving problems arising from electronic component miniaturization, for example. Significant progress can be expected by means of analytical aberration corrected TEM. These next generation microscopes will be equipped with an aberration corrected imaging system, a monochromator and aberration corrected energy filters. These novel elements have already been designed and partially realized [1,2,3].
Aberration Corrected Imaging In Transmission Electron Microscopy
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Author : Rolf Erni
language : en
Publisher:
Release Date : 2010
Aberration Corrected Imaging In Transmission Electron Microscopy written by Rolf Erni and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with Electronic books categories.