Accelerated Life Models
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Accelerated Life Models
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Author : Vilijandas Bagdonavicius
language : en
Publisher: CRC Press
Release Date : 2001-11-28
Accelerated Life Models written by Vilijandas Bagdonavicius and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001-11-28 with Business & Economics categories.
The authors of this monograph have developed a large and important class of survival analysis models that generalize most of the existing models. In a unified, systematic presentation, this monograph fully details those models and explores areas of accelerated life testing usually only touched upon in the literature. Accelerated Life Models:
Accelerated Life Models
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Author : Vilijandas Bagdonavičius
language : en
Publisher:
Release Date : 2002
Accelerated Life Models written by Vilijandas Bagdonavičius and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002 with Accelerated life testing categories.
Survival analysis is an important technique used. The authors of this book have developed a large class of survival analysis models that generalised most of the existing models. This monograph details those accelerated models.
Optimum Accelerated Life Testing Models With Time Varying Stresses
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Author : Preeti Wanti Srivastava
language : en
Publisher: World Scientific
Release Date : 2017-02-23
Optimum Accelerated Life Testing Models With Time Varying Stresses written by Preeti Wanti Srivastava and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-02-23 with Technology & Engineering categories.
Today's manufacturers are under tremendous pressure to develop new technological and high reliability products in record time. This has motivated reliability engineers to evaluate the reliabilities of such products. Reliability testing under accelerated environment — accelerated life testing helps to meet this challenge.This comprehensive and must-have edition provides a broad coverage of the optimal design of Accelerated Life Test Plans under time-varying stress loadings. It also focuses on the formulation of Accelerated Life Test Sampling Plans (ALTSPs) which integrate accelerated life tests with quality control technique of acceptance sampling plans. These plans help to determine optimal experimental variables such as appropriate stress levels, optimal allocation at each stress levels, stress change points, etc, depending on the stress loading scheme. ALTSPs determine optimal plans such that the producers' and consumers' risks are safeguarded.
Accelerated Testing
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Author : Wayne B. Nelson
language : en
Publisher: John Wiley & Sons
Release Date : 2009-09-25
Accelerated Testing written by Wayne B. Nelson and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-09-25 with Mathematics categories.
The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. ". . . a goldmine of knowledge on accelerated life testing principles and practices . . . one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering." –Dev G. Raheja, Quality and Reliability Engineering International ". . . an impressive book. The width and number of topics covered, the practical data sets included, the obvious knowledge and understanding of the author and the extent of published materials reviewed combine to ensure that this will be a book used frequently." –Journal of the Royal Statistical Society A benchmark text in the field, Accelerated Testing: Statistical Models, Test Plans, and Data Analysis offers engineers, scientists, and statisticians a reliable resource on the effective use of accelerated life testing to measure and improve product reliability. From simple data plots to advanced computer programs, the text features a wealth of practical applications and a clear, readable style that makes even complicated physical and statistical concepts uniquely accessible. A detailed index adds to its value as a reference source.
Accelerated Life Testing Of One Shot Devices
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Author : Narayanaswamy Balakrishnan
language : en
Publisher: John Wiley & Sons
Release Date : 2021-02-10
Accelerated Life Testing Of One Shot Devices written by Narayanaswamy Balakrishnan and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-02-10 with Mathematics categories.
Provides authoritative guidance on statistical analysis techniques and inferential methods for one-shot device life-testing Estimating the reliability of one-shot devices—electro-expolsive devices, fire extinguishers, automobile airbags, and other units that perform their function only once—poses unique analytical challenges to conventional approaches. Due to how one-shot devices are censored, their precise failure times cannot be obtained from testing. The condition of a one-shot device can only be recorded at a specific inspection time, resulting in a lack of lifetime data collected in life-tests. Accelerated Life Testing of One-shot Devices: Data Collection and Analysis addresses the fundamental issues of statistical modeling based on data collected from accelerated life-tests of one-shot devices. The authors provide inferential methods and procedures for planning accelerated life-tests, and describe advanced statistical techniques to help reliability practitioners overcome estimation problems in the real world. Topics covered include likelihood inference, competing-risks models, one-shot devices with dependent components, model selection, and more. Enabling readers to apply the techniques to their own lifetime data and arrive at the most accurate inference possible, this practical resource: Provides expert guidance on comprehensive data analysis of one-shot devices under accelerated life-tests Discusses how to design experiments for data collection from efficient accelerated life-tests while conforming to budget constraints Helps readers develops optimal designs for constant-stress and step-stress accelerated life-tests, mainstream life-tests commonly used in reliability practice Includes R code in each chapter for readers to use in their own analyses of one-shot device testing data Features numerous case studies and practical examples throughout Highlights important issues, problems, and future research directions in reliability theory and practice Accelerated Life Testing of One-shot Devices: Data Collection and Analysis is essential reading for graduate students, researchers, and engineers working on accelerated life testing data analysis.
Some Optimumfully And Partially Accelerated Life Testing Models In Reliabiligy
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Author : Mittal Neha N
language : en
Publisher: Independent Author
Release Date : 2023-03-23
Some Optimumfully And Partially Accelerated Life Testing Models In Reliabiligy written by Mittal Neha N and has been published by Independent Author this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-03-23 with Medical categories.
With today's high technology and highly reliable products, the traditional life tests result in none or very few failures by the end of the test. The life test is, therefore, fully or partially accelerated to induce early failures and obtain quickly information about the life distribution of the product. The test data obtained at accelerated conditions are extrapolated by means of an appropriate model to the use conditions to quantify the life characteristics of the product under normal use conditions. In fully accelerated life testing all the test units are run at accelerated condition, while in partially accelerated life testing they are run at both normal and accelerated conditions. Stress under accelerated condition can be applied using constant-stress, step-stress, progressive-stress, cyclic-stress, random-stress, or combinations of such loadings. The choice of a stress loading depends on how the product or unit is used in service and other practical and theoretical limitations.
Semiparametric Models In Accelerated Life Testing
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Author : Vilijandas Bagdonavičius
language : en
Publisher: Kingston, Ont. : Queen's University
Release Date : 1995
Semiparametric Models In Accelerated Life Testing written by Vilijandas Bagdonavičius and has been published by Kingston, Ont. : Queen's University this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Mathematics categories.
Accelerated Life Testing Of One Shot Devices
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Author : Narayanaswamy Balakrishnan
language : en
Publisher: John Wiley & Sons
Release Date : 2021-03-23
Accelerated Life Testing Of One Shot Devices written by Narayanaswamy Balakrishnan and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-03-23 with Mathematics categories.
Provides authoritative guidance on statistical analysis techniques and inferential methods for one-shot device life-testing Estimating the reliability of one-shot devices—electro-expolsive devices, fire extinguishers, automobile airbags, and other units that perform their function only once—poses unique analytical challenges to conventional approaches. Due to how one-shot devices are censored, their precise failure times cannot be obtained from testing. The condition of a one-shot device can only be recorded at a specific inspection time, resulting in a lack of lifetime data collected in life-tests. Accelerated Life Testing of One-shot Devices: Data Collection and Analysis addresses the fundamental issues of statistical modeling based on data collected from accelerated life-tests of one-shot devices. The authors provide inferential methods and procedures for planning accelerated life-tests, and describe advanced statistical techniques to help reliability practitioners overcome estimation problems in the real world. Topics covered include likelihood inference, competing-risks models, one-shot devices with dependent components, model selection, and more. Enabling readers to apply the techniques to their own lifetime data and arrive at the most accurate inference possible, this practical resource: Provides expert guidance on comprehensive data analysis of one-shot devices under accelerated life-tests Discusses how to design experiments for data collection from efficient accelerated life-tests while conforming to budget constraints Helps readers develops optimal designs for constant-stress and step-stress accelerated life-tests, mainstream life-tests commonly used in reliability practice Includes R code in each chapter for readers to use in their own analyses of one-shot device testing data Features numerous case studies and practical examples throughout Highlights important issues, problems, and future research directions in reliability theory and practice Accelerated Life Testing of One-shot Devices: Data Collection and Analysis is essential reading for graduate students, researchers, and engineers working on accelerated life testing data analysis.
Reliability And Risk Models
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Author : Michael Todinov
language : en
Publisher: John Wiley & Sons
Release Date : 2015-09-01
Reliability And Risk Models written by Michael Todinov and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-09-01 with Technology & Engineering categories.
A comprehensively updated and reorganized new edition. The updates include comparative methods for improving reliability; methods for optimal allocation of limited resources to achieve a maximum risk reduction; methods for improving reliability at no extra cost and building reliability networks for engineering systems. Includes: A unique set of 46 generic principles for reducing technical risk Monte Carlo simulation algorithms for improving reliability and reducing risk Methods for setting reliability requirements based on the cost of failure New reliability measures based on a minimal separation of random events on a time interval Overstress reliability integral for determining the time to failure caused by overstress failure modes A powerful equation for determining the probability of failure controlled by defects in loaded components with complex shape Comparative methods for improving reliability which do not require reliability data Optimal allocation of limited resources to achieve a maximum risk reduction Improving system reliability based solely on a permutation of interchangeable components
Implementation Of Accelerated Life Testing
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Author : Cabarbaye André
language : en
Publisher: Cab Innovation Editeur
Release Date : 2019-11-20
Implementation Of Accelerated Life Testing written by Cabarbaye André and has been published by Cab Innovation Editeur this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-11-20 with Science categories.
The accelerated life testing is used to quickly demonstrate the ability of a product to perform its role, by increasing the stress conditions compared to those of its operational life. This educational book on the implementation of accelerated life testing therefore explains its theoretical foundations and offers a practical application guide which covers state-of-the-art thinking on design techniques and optimal planning of tests.