Advanced Computing In Electron Microscopy
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Advanced Computing In Electron Microscopy
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Author : Earl J. Kirkland
language : en
Publisher: Springer Nature
Release Date : 2020-03-09
Advanced Computing In Electron Microscopy written by Earl J. Kirkland and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-03-09 with Science categories.
This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.
Advanced Techniques In Biological Electron Microscopy Iii
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Author : J.K. Koehler
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Advanced Techniques In Biological Electron Microscopy Iii written by J.K. Koehler and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
This volume is a continuation of two prior books on advanced electron microscope techniques. The purpose of this series has been to provide in depth analyses of methods which are considered to be at the leading edge of electron microscopic research procedures with applications in the biological sciences. The mission of the present volume remains that of a source book for the research practitioner or advanced student, especially one already well versed in basic electron optical methods. It is not meant to provide in troductory material, nor can this modest volume hope to cover the entire spectrum of advanced technology now available in electron microscopy. In the past decade, computers have found their way into many research laboratories thanks to the enormous increase in computing power and stor age available at a modest cost. The ultrastructural area has also benefited from this expansion in a number of ways which will be illustrated in this volume. Half of the contributions discuss technologies that either directly or indirectly make extensive use of computer methods.
Computer Techniques For Image Processing In Electron Microscopy
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Author : W. O. Saxton
language : en
Publisher: Academic Press
Release Date : 2013-11-06
Computer Techniques For Image Processing In Electron Microscopy written by W. O. Saxton and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-06 with Science categories.
Computer Techniques for Image Processing in Electron Microscopy: Advances in Electronics and Electron Physics presents the sophisticated computer generated in processing the image. This book discusses the development of fast Fourier transform algorithms, which has led to the possibility of achieving a more reliable interpretation of electron micrographs by digital means. Organized into 10 chapters, this book begins with an overview of image formation in which the properties of the linear approximation are included. This text then reviews the available hardware and the basic mathematical methods of image processing in electron microscopy. Other chapters consider the constraints imposed on the image wave function by the objective lens aperture. This book discusses as well the properties of discrete Fourier transforms. The final chapter deals with a particular processing system called the Improc system. This book is a valuable resource for physicists and researcher workers who are interested in the study of image processing.
Computer Processing Of Electron Microscope Images
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Author : P. W. Hawkes
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Computer Processing Of Electron Microscope Images written by P. W. Hawkes and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
Towards the end of the 1960s, a number of quite different circumstances combined to launch a period of intense activity in the digital processing of electron micro graphs. First, many years of work on correcting the resolution-limiting aberrations of electron microscope objectives had shown that these optical impediments to very high resolution could indeed be overcome, but only at the cost of immense exper imental difficulty; thanks largely to the theoretical work of K. -J. Hanszen and his colleagues and to the experimental work of F. Thon, the notions of transfer func tions were beginning to supplant or complement the concepts of geometrical optics in electron optical thinking; and finally, large fast computers, capable of manipu lating big image matrices in a reasonable time, were widely accessible. Thus the idea that recorded electron microscope images could be improved in some way or rendered more informative by subsequent computer processing gradually gained ground. At first, most effort was concentrated on three-dimensional reconstruction, particu larly of specimens with natural symmetry that could be exploited, and on linear operations on weakly scattering specimens (Chap. l). In 1973, however, R. W. Gerchberg and W. O. Saxton described an iterative algorithm that in principle yielded the phase and amplitude of the electron wave emerging from a strongly scattering speci men.
Scanning Transmission Electron Microscopy
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Author : Alina Bruma
language : en
Publisher: CRC Press
Release Date : 2020-12-22
Scanning Transmission Electron Microscopy written by Alina Bruma and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-12-22 with Technology & Engineering categories.
Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications The information comprised in this book is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.
Advances In Imaging And Electron Physics
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Author :
language : en
Publisher: Academic Press
Release Date : 2020-05-21
Advances In Imaging And Electron Physics written by and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-05-21 with Technology & Engineering categories.
Computer Techniques for Image Processing in Electron Microscopy, Volume 214 in the Advances in Imaging and Electron Physics series, presents the latest advances in the field, with this new volume covering Image Formation Theory, The Discrete Fourier Transform, Analytic Images, The Image and Diffraction Plane Problem: Uniqueness, The Image and Diffraction Plane Problem: Numerical Methods, The Image and Diffraction Plane Problem: Computational Trials, Alternative Data for the Phase Determination, The Hardware of Digital Image Handling, Basic Software or Digital Image Handling, Improc, and much more. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Advances in Imaging and Electron Physics series
Advances In Imaging And Electron Physics
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Author :
language : en
Publisher: Academic Press
Release Date : 2009-11-05
Advances In Imaging And Electron Physics written by and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-11-05 with Technology & Engineering categories.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope. Updated with contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Provides an invaluable reference and guide for physicists, engineers and mathematicians
Advances In Imaging And Electron Physics
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Author : Peter W. Hawkes
language : en
Publisher: Academic Press
Release Date : 2002-11-05
Advances In Imaging And Electron Physics written by Peter W. Hawkes and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-11-05 with Technology & Engineering categories.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
A Practical Guide To Transmission Electron Microscopy Advanced Microscopy
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Author : Zhiping Luo
language : en
Publisher:
Release Date : 2016
A Practical Guide To Transmission Electron Microscopy Advanced Microscopy written by Zhiping Luo and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016 with Transmission electron microscopy categories.
New Horizons Of Applied Scanning Electron Microscopy
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Author : Kenichi Shimizu
language : en
Publisher: Springer Science & Business Media
Release Date : 2009-11-19
New Horizons Of Applied Scanning Electron Microscopy written by Kenichi Shimizu and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-11-19 with Technology & Engineering categories.
In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.