Analog Signal Generation For Built In Self Test Of Mixed Signal Integrated Circuits
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Analog Signal Generation For Built In Self Test Of Mixed Signal Integrated Circuits
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Author : Gordon W. Roberts
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Analog Signal Generation For Built In Self Test Of Mixed Signal Integrated Circuits written by Gordon W. Roberts and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.
Analog Signal Generation For Built In Self Test Of Mixed Signal Integrated Circuits
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Author : Gordon W Roberts
language : en
Publisher:
Release Date : 1995-04-30
Analog Signal Generation For Built In Self Test Of Mixed Signal Integrated Circuits written by Gordon W Roberts and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995-04-30 with categories.
Test And Diagnosis Of Analogue Mixed Signal And Rf Integrated Circuits
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Author : Yichuang Sun
language : en
Publisher: IET
Release Date : 2008-05-30
Test And Diagnosis Of Analogue Mixed Signal And Rf Integrated Circuits written by Yichuang Sun and has been published by IET this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-05-30 with Technology & Engineering categories.
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
Computer Aided Design Of Analog Integrated Circuits And Systems
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Author : Rob A. Rutenbar
language : en
Publisher: John Wiley & Sons
Release Date : 2002-05-06
Computer Aided Design Of Analog Integrated Circuits And Systems written by Rob A. Rutenbar and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-05-06 with Technology & Engineering categories.
The tools and techniques you need to break the analog design bottleneck! Ten years ago, analog seemed to be a dead-end technology. Today, System-on-Chip (SoC) designs are increasingly mixed-signal designs. With the advent of application-specific integrated circuits (ASIC) technologies that can integrate both analog and digital functions on a single chip, analog has become more crucial than ever to the design process. Today, designers are moving beyond hand-crafted, one-transistor-at-a-time methods. They are using new circuit and physical synthesis tools to design practical analog circuits; new modeling and analysis tools to allow rapid exploration of system level alternatives; and new simulation tools to provide accurate answers for analog circuit behaviors and interactions that were considered impossible to handle only a few years ago. To give circuit designers and CAD professionals a better understanding of the history and the current state of the art in the field, this volume collects in one place the essential set of analog CAD papers that form the foundation of today's new analog design automation tools. Areas covered are: * Analog synthesis * Symbolic analysis * Analog layout * Analog modeling and analysis * Specialized analog simulation * Circuit centering and yield optimization * Circuit testing Computer-Aided Design of Analog Integrated Circuits and Systems is the cutting-edge reference that will be an invaluable resource for every semiconductor circuit designer and CAD professional who hopes to break the analog design bottleneck.
Analog Test Signal Generation Using Periodic Encoded Data Streams
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Author : Benoit Dufort
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Analog Test Signal Generation Using Periodic Encoded Data Streams written by Benoit Dufort and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
Analog Test Signal Generation Using Periodic SigmaDelta-Encoded Data Streams presents a new method to generate high quality analog signals with low hardware complexity. The theory of periodic SigmaDelta-encoded bitstreams is presented along with a set of empirical tables to help select the appropriate parameters of a bitstream. An optimization procedure is also outlined to help select a bit sequence with the desired attributes. A large variety of signals can be generated using this approach. Silicon implementation issues are discussed with a specific emphasis on area overhead and ease of design. One FPGA circuit and three different silicon implementations are presented along with experimental results. It is shown that simple designs are capable of generating very high precision signals-on-chip. The technique is further extended to multi-bit signal generation where it is shown how to increase the performance of arbitrary waveform, generators commonly found in past and present-day mixed-signal testers. No hardware modifications are required, only the numbers in memory are changed. Three different calibration techniques to reduce the effects of the AWG's non-linearities are also introduced, together with supporting experimental evidence. The main focus of this text is to describe an area-efficient technique for analog signal generation using SigmaDelta-encoded data stream. The main characteristics of the technique are: High quality signals (SFDR of 110 dB observed); Large variety of signals generated; Bitstreams easily obtained with a fast optimization program; Good frequency resolution, compatible with coherent sampling; Simple and fast hardware implementation; Mostly digital, except an easily testable 1-bit DAC and possibly a reconstruction filter; Memory already available on-chip can be reused, reducing area overhead; Designs can be incorporated into existing CAD tools; High frequency generation.
Test And Design For Testability In Mixed Signal Integrated Circuits
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Author : Jose Luis Huertas Díaz
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-02-23
Test And Design For Testability In Mixed Signal Integrated Circuits written by Jose Luis Huertas Díaz and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-02-23 with Technology & Engineering categories.
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.
A Designer S Guide To Built In Self Test
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Author : Charles E. Stroud
language : en
Publisher: Springer Science & Business Media
Release Date : 2005-12-27
A Designer S Guide To Built In Self Test written by Charles E. Stroud and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-12-27 with Technology & Engineering categories.
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Soc Design Methodologies
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Author : Michel Robert
language : en
Publisher: Springer
Release Date : 2013-03-15
Soc Design Methodologies written by Michel Robert and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-15 with Technology & Engineering categories.
The 11 th IFIP International Conference on Very Large Scale Integration, in Montpellier, France, December 3-5,2001, was a great success. The main focus was about IP Cores, Circuits and System Designs & Applications as well as SOC Design Methods and CAD. This book contains the best papers (39 among 70) that have been presented during the conference. Those papers deal with all aspects of importance for the design of the current and future integrated systems. System on Chip (SOC) design is today a big challenge for designers, as a SOC may contain very different blocks, such as microcontrollers, DSPs, memories including embedded DRAM, analog, FPGA, RF front-ends for wireless communications and integrated sensors. The complete design of such chips, in very deep submicron technologies down to 0.13 mm, with several hundreds of millions of transistors, supplied at less than 1 Volt, is a very challenging task if design, verification, debug and industrial test are considered. The microelectronic revolution is fascinating; 55 years ago, in late 1947, the transistor was invented, and everybody knows that it was by William Shockley, John Bardeen and Walter H. Brattein, Bell Telephone Laboratories, which received the Nobel Prize in Physics in 1956. Probably, everybody thinks that it was recognized immediately as a major invention.
Integrated Circuit Test Engineering
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Author : Ian A. Grout
language : en
Publisher: Springer Science & Business Media
Release Date : 2005-12-08
Integrated Circuit Test Engineering written by Ian A. Grout and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-12-08 with Technology & Engineering categories.
Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Vlsi Testing
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Author : Stanley Leonard Hurst
language : en
Publisher: IET
Release Date : 1998
Vlsi Testing written by Stanley Leonard Hurst and has been published by IET this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998 with Computers categories.
Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR