Analytical Techniques For The Characterization Of Compound Semiconductors
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Analytical Techniques For The Characterization Of Compound Semiconductors
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Author : G. Bastard
language : en
Publisher: Elsevier
Release Date : 1991-07-26
Analytical Techniques For The Characterization Of Compound Semiconductors written by G. Bastard and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991-07-26 with Science categories.
This volume is a collection of 96 papers presented at the above Conference. The scope of the work includes optical and electrical methods as well as techniques for structural and compositional characterization. The contributed papers report on topics such as X-ray diffraction, TEM, depth profiling, photoluminescence, Raman scattering and various electrical methods. Of particular interest are combinations of different techniques providing complementary information. The compound semiconductors reviewed belong mainly to the III-V and III-VI families. The papers in this volume will provide a useful reference on the implications of new technologies in the characterization of compound semiconductors.
Analytical Techniques For The Characterization Of Compound Semiconductors
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Author :
language : en
Publisher:
Release Date : 1991
Analytical Techniques For The Characterization Of Compound Semiconductors written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with categories.
Analytical Techniques For The Characterization Of Compound Semiconductors
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Author : Gerald Bastard
language : en
Publisher: North Holland
Release Date : 1991
Analytical Techniques For The Characterization Of Compound Semiconductors written by Gerald Bastard and has been published by North Holland this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with Science categories.
This volume is a collection of 96 papers presented at the above Conference. The scope of the work includes optical and electrical methods as well as techniques for structural and compositional characterization. The contributed papers report on topics such as X-ray diffraction, TEM, depth profiling, photoluminescence, Raman scattering and various electrical methods. Of particular interest are combinations of different techniques providing complementary information. The compound semiconductors reviewed belong mainly to the III-V and III-VI families. The papers in this volume will provide a useful reference on the implications of new technologies in the characterization of compound semiconductors.
Analytical Techniques For The Characterization Of Compound Semiconductors
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Author : Gerald Bastard
language : en
Publisher:
Release Date : 1991
Analytical Techniques For The Characterization Of Compound Semiconductors written by Gerald Bastard and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with categories.
Analytical Techniques For The Characterization Of Compound Semiconductor
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Author : Gerald Bastard
language : en
Publisher:
Release Date : 1991
Analytical Techniques For The Characterization Of Compound Semiconductor written by Gerald Bastard and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with categories.
Analytical Techniques For The Characterization Of Compound Semiconductors
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Author : European Materials Research Society
language : en
Publisher:
Release Date : 1991
Analytical Techniques For The Characterization Of Compound Semiconductors written by European Materials Research Society and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with categories.
Scientific And Technical Aerospace Reports
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Author :
language : en
Publisher:
Release Date : 1995
Scientific And Technical Aerospace Reports written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Aeronautics categories.
Journal Of Research Of The National Institute Of Standards And Technology
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Author :
language : en
Publisher:
Release Date : 1995
Journal Of Research Of The National Institute Of Standards And Technology written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Measurement categories.
Semiconductor Materials Analysis And Fabrication Process Control
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Author : G.M. Crean
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Semiconductor Materials Analysis And Fabrication Process Control written by G.M. Crean and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Science categories.
There is a growing awareness that the successful implementation of novel material systems and technology steps in the fabrication of microelectronic and optoelectronic devices, is critically dependent on the understanding and control of the materials, the process steps and their interactions. The contributions in this volume demonstrate that characterisation and analysis techniques are an essential support mechanism for research in these fields. Current major research themes are reviewed both in the development and application of diagnostic techniques for advanced materials analysis and fabrication process control. Two distinct trends are elucidated: the emergence and evaluation of sophisticated in situ optical diagnostic techniques such as photoreflectance and spectroellipsometry and the industrial application of ultra-high sensitivity chemical analysis techniques for contamination monitoring. The volume will serve as a useful and timely overview of this increasingly important field.
Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Characterization
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Author : Richard Haight
language : en
Publisher: World Scientific
Release Date : 2012
Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Characterization written by Richard Haight and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012 with Science categories.
As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.