Atomic Force Microscopy Scanning Nearfield Optical Microscopy And Nanoscratching

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Atomic Force Microscopy Scanning Nearfield Optical Microscopy And Nanoscratching

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Author : Gerd Kaupp
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-10-24

Atomic Force Microscopy Scanning Nearfield Optical Microscopy And Nanoscratching written by Gerd Kaupp and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-10-24 with Technology & Engineering categories.

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.

Atomic Force Microscopy For Biologists 2nd Edition

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Author : Victor J Morris
language : en
Publisher: World Scientific
Release Date : 2009-08-11

Atomic Force Microscopy For Biologists 2nd Edition written by Victor J Morris and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-08-11 with Science categories.

Atomic force microscopy (AFM) is part of a range of emerging microscopic methods for biologists which offer the magnification range of both the light and electron microscope, but allow imaging under the 'natural' conditions usually associated with the light microscope. To biologists, AFM offers the prospect of high resolution images of biological material, images of molecules and their interactions even under physiological conditions, and the study of molecular processes in living systems. This book provides a realistic appreciation of the advantages and limitations of the technique and the present and future potential for improving the understanding of biological systems.The second edition of this bestseller has been updated to describe the latest developments in this exciting field, including a brand new chapter on force spectroscopy. The dramatic developments of AFM over the past ten years from a simple imaging tool to the multi-faceted, nano-manipulating technique that it is today are conveyed in a lively and informative narrative, which provides essential reading for students and experienced researchers alike./a

Roadmap Of Scanning Probe Microscopy

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Author : Seizo Morita
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-12-30

Roadmap Of Scanning Probe Microscopy written by Seizo Morita and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-12-30 with Technology & Engineering categories.

Scanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, atom/molecule manipulation and nanostructuring, and inelastic electron tunneling spectroscopy - has achieved remarkable progress and become the key technology for surface science. Besides, atomic force microscopy is also rapidly developing and achieving remarkable progress and accomplishments such as true atomic resolution, atom/molecule identification, manipulation and nanostructuring. This book that predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately to be taken and to accelerate research and development on nanotechnology and nanoscience, as well as all SPM-related fields in future.

Scanning Probe Microscopy

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Author : Adam Foster
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-10-14

Scanning Probe Microscopy written by Adam Foster and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-10-14 with Technology & Engineering categories.

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.

Advances In Macromolecules

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Author : Maria Vittoria Russo
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-03-10

Advances In Macromolecules written by Maria Vittoria Russo and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-03-10 with Technology & Engineering categories.

"Polymeric and Nanostructured Macromolecules" presents the recent advances made in the synthesis, characterization, and applications of polymeric macromolecules. This book provides an excellent overview of the recent breakthroughs in the science of macromolecules, with an emphasis on nanostructured macromolecules and the perspectives that these versatile materials offer to different fields such as optoelectronics and biotechnology. Advanced undergraduate, graduate students and researchers alike will find the topics concerning physical and chemical properties of advanced macromolecular materials of great interest.

Biomedical Spectroscopy

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Author : Kartha V B
language : en
Publisher: CRC Press
Release Date : 2025-02-04

Biomedical Spectroscopy written by Kartha V B and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-02-04 with Technology & Engineering categories.

This book discusses biomedical spectroscopy and the applications of spectroscopic techniques in advanced medical technology. Applicable to scientists and medical professionals, the aim of this work is to enable them to work together in this field, so that healthcare facilities can be made routinely available in a cost-effective manner—especially for developing countries which may not be able to afford universal healthcare with present day expensive medical technologies. The subject matter of this book also covers – Instrumentation, Experimental Techniques and Computational Methods Spectroscopy of Animal Models Microspectroscopy for Biomedical Applications Clinical Applications of Optical Spectroscopy Spectroscopy of Human Models Print edition not for sale in South Asia (India, Sri Lanka, Nepal, Bangladesh, Pakistan and Bhutan)

Applied Scanning Probe Methods Xi

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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-10-22

Applied Scanning Probe Methods Xi written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-10-22 with Technology & Engineering categories.

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.

Applied Scanning Probe Methods V

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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-11-04

Applied Scanning Probe Methods V written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-11-04 with Technology & Engineering categories.

The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.

Applied Scanning Probe Methods Xiii

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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-10-29

Applied Scanning Probe Methods Xiii written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-10-29 with Technology & Engineering categories.

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Applied Scanning Probe Methods Xii

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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-10-24

Applied Scanning Probe Methods Xii written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-10-24 with Technology & Engineering categories.

Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1–4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors’ knowledge, this was shown for the rst time by Hild et al. in [5]. 16.