Atomic Scale Characterization Of Materials Using Scanning Transmission Electron Microscopy
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Atomic Scale Characterization Of Materials Using Scanning Transmission Electron Microscopy
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Author : Jeffery Andrew Aguiar
language : en
Publisher:
Release Date : 2012
Atomic Scale Characterization Of Materials Using Scanning Transmission Electron Microscopy written by Jeffery Andrew Aguiar and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012 with categories.
Coupling the development of emerging experimental techniques in STEM and EELS with a fundamental understanding of atomic electronic structure afforded by DFT represents the unique approach and intention of this thesis. Scanning transmission electron microscopes equipped with high-angle annular dark field (HAADF) detectors and Gatan image filters (GIF) provide images and spectra, where the image brightness is interpreted as a function of atomic mass and thickness, and elemental specific spectra provide a means for the exploration of electronic and chemical structure of materials at the angstrom size scale. Over the past 20 years, the application of EELS in STEM has enabled more accurate elemental identification and exploration of electronic and chemical structure on angstrom-length scales, and arguably has provided an unprecedented wealth of materials characterization compared to other available techniques. Many materials issues related to specific novel properties that cannot be analyzed using the traditional techniques of the past, however, still remain unanswered. These concepts require a married approach of experiment and theory to fully explain. The intent of this dissertation is the development of improved analysis techniques that derive quantitative atomic scale information in connection with unraveling the origins of materials properties linked to the electronic structure and chemistry of materials.
Atomic Scale Characterization Of Embedded And Supported Nanostructures By Scanning Transmission Electron Microscopy
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Author : Volkan Ortalan
language : en
Publisher:
Release Date : 2010
Atomic Scale Characterization Of Embedded And Supported Nanostructures By Scanning Transmission Electron Microscopy written by Volkan Ortalan and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with categories.
Atomic Scale Characterization Of Semiconductor Interfaces By Scanning Transmission Electron Microscopy
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Author :
language : en
Publisher:
Release Date : 1997
Atomic Scale Characterization Of Semiconductor Interfaces By Scanning Transmission Electron Microscopy written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997 with categories.
Recently, the scanning transmission electron microscope has become capable of forming electron probes of atomic dimensions. Through the technique of Z-contrast imaging, it is now possible to form atomic resolution images with high compositional sensitivity from which atomic column positions can be directly determined. An incoherent image of this nature also allows atomic resolution chemical analysis to be performed, by locating the probe over particular columns or planes seen in the image while electron energy loss spectra are collected. These powerful techniques, combined with atomic-scale calculations, constitute a powerful probe of the structural, kinetic and thermodynamic properties of complex materials. The authors show the direct observation of As segregated to specific sites in a Si grain boundary, and present a candidate model for the structure of the Si/SiO2 interface.
Atomic Scale Analytical Tomography
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Author : Thomas F. Kelly
language : en
Publisher: Cambridge University Press
Release Date : 2022-03-24
Atomic Scale Analytical Tomography written by Thomas F. Kelly and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-03-24 with Technology & Engineering categories.
The first comprehensive guide on Atomic-Scale Analytical Tomography, extending basics to the future implications for science and technology.
Atomic Scale Characterization And First Principles Studies Of Si3n4 Interfaces
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Author : Weronika Walkosz
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-04-06
Atomic Scale Characterization And First Principles Studies Of Si3n4 Interfaces written by Weronika Walkosz and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-04-06 with Technology & Engineering categories.
This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β−Si3N4 and amorphous (i) CeO2-x as well as (ii) SiO2 intergranular film (IGF). These interfaces are of a great fundamental and technological interest because they play an important role in the microstructural evolution and mechanical properties of Si3N4 ceramics used in many high temperature and pressure applications. The main contribution of this work is its detailed description of the bonding characteristics of light atoms, in particular oxygen and nitrogen, at these interfaces, which has not been achieved before. The atomic-scale information on the arrangement of both light and heavy atoms is critical for realistic modeling of interface properties, such as interface strength and ion transport, and will facilitate increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.
A Combined Experimental And Theoretical Approach To Atomic Scale Characterization
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Author :
language : en
Publisher:
Release Date : 1998
A Combined Experimental And Theoretical Approach To Atomic Scale Characterization written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998 with categories.
Recently, the scanning transmission electron microscope has become capable of forming electron probes of atomic dimensions. Through the technique of Z-contrast imaging, it is now possible to form atomic resolution images with high compositional sensitivity from which atomic column positions can be directly determined. An incoherent image of this nature also allows atomic resolution chemical analysis to be performed, by locating the probe over particular columns or planes seen in the image while electron energy loss spectra are collected. Such data represents either an ideal starting point for first principles theoretical calculations or a test of theoretical predictions. The authors present several examples where theory and experiment together give a very complete and often surprising atomic scale view of complex materials.
Scanning Transmission Electron Microscopy
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Author : Stephen J. Pennycook
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-03-24
Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-03-24 with Technology & Engineering categories.
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Atomic Scale Microstructure Analysis Of High Entropy Alloys And Silicide Using Scanning Transmission Electron Microscope
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Author :
language : en
Publisher:
Release Date : 2022
Atomic Scale Microstructure Analysis Of High Entropy Alloys And Silicide Using Scanning Transmission Electron Microscope written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022 with categories.
Atom Probe Tomography
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Author : Williams Lefebvre
language : en
Publisher: Academic Press
Release Date : 2016-05-30
Atom Probe Tomography written by Williams Lefebvre and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-05-30 with Science categories.
Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process. Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials Written for both experienced researchers and new users Includes exercises, along with corrections, for users to practice the techniques discussed Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy
Scanning Probe Microscopy
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Author : Adam Foster
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-10-14
Scanning Probe Microscopy written by Adam Foster and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-10-14 with Technology & Engineering categories.
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.