Scanning Transmission Electron Microscopy
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Scanning Transmission Electron Microscopy
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Author : Stephen J. Pennycook
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-03-24
Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-03-24 with Technology & Engineering categories.
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Introduction To Scanning Transmission Electron Microscopy
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Author : Dr Robert Keyse
language : en
Publisher: Routledge
Release Date : 2018-12-19
Introduction To Scanning Transmission Electron Microscopy written by Dr Robert Keyse and has been published by Routledge this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-12-19 with Technology & Engineering categories.
1997 was the 'Year of the Electron' because it marked the centenary pf the celebrated discovery of the smallest of the fundamental particles that make up ordinary matter, and which has proved to have so many remarkable properties that, after light, it has become the most widley used of the particles in scientific and technogical applications. STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.
Introduction To Scanning Transmission Electron Microscopy
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Author : Robert Keyse
language : en
Publisher: CRC Press
Release Date : 2018-06-28
Introduction To Scanning Transmission Electron Microscopy written by Robert Keyse and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-06-28 with categories.
STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.
Advances In Imaging And Electron Physics
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Author :
language : en
Publisher: Academic Press
Release Date : 2009-11-05
Advances In Imaging And Electron Physics written by and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-11-05 with Technology & Engineering categories.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope. Updated with contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Provides an invaluable reference and guide for physicists, engineers and mathematicians
Introduction To Scanning Transmission Electron Microscopy
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Author : Robert J. Keyse
language : en
Publisher:
Release Date : 1998
Introduction To Scanning Transmission Electron Microscopy written by Robert J. Keyse and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998 with SCIENCE categories.
Scanning Transmission Electron Microscopy (STEM) is one of the highest resolution methods for performing microanlysis on thin sections of material. The technique is used in many modern transmission electron microscopes, and an increasing number of specialized instruments dedicated to STEM are being developed. This book provides an up-to-date introduction to the principles and major applications of STEM.
Introduction To Scanning Transmission Electron Microscopy
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Author : Robert J. Keyse
language : en
Publisher: Springer
Release Date : 1997-07-28
Introduction To Scanning Transmission Electron Microscopy written by Robert J. Keyse and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-07-28 with categories.
STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.
Science Of Microscopy
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Author : P.W. Hawkes
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-08-29
Science Of Microscopy written by P.W. Hawkes and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-08-29 with Technology & Engineering categories.
This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.
Scanning Transmission Electron Microscopy Of Nanomaterials
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Author : Nobuo Tanaka
language : en
Publisher: World Scientific
Release Date : 2014-08-21
Scanning Transmission Electron Microscopy Of Nanomaterials written by Nobuo Tanaka and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-08-21 with Science categories.
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Contents:Introduction (N Tanaka)Historical Survey of the Development of STEM Instruments (N Tanaka)Basic Knowledge of STEM:Basics of STEM (N Tanaka and K Saitoh)Application of STEM to Nanomaterials and Biological Specimens (N Shibata, S D Findlay, Y Ikuhara and N Tanaka)Theories of STEM Imaging:Theory for HAADF-STEM and Its Image Simulation (K Watanabe)Theory for Annular Bright Field STEM Imaging (S D Findlay, N Shibata and Y Ikuhara)Electron Energy-Loss Spectroscopy in STEM and Its Imaging (K Kimoto)Density Functional Theory for ELNES in STEM-EELS (T Mizoguchi)Advanced Methods in STEM:Aberration Correction in STEM (H Sawada)Secondary Electron Microscopy in STEM (H Inada and Y Zhu)Scanning Confocal Electron Microscopy (K Mitsuishi and M Takeguchi)Electron Tomography in STEM (N Tanaka)Electron Holography and Lorentz Electron Microscopy in STEM (N Tanaka)Recent Topics and Future Prospects in STEM (N Tanaka) Readership: Graduate students and researchers in the field of nanomaterials and nanostructures. Key Features:Most advanced; befitting beginning graduate studentsVery convenient for advanced researchers who would like to use STEM and have a comprehensive understanding of the theory of image contrast and application detailsSpans from the basic theory to the applications of STEMKeywords:STEM;Nanomaterials;HAADF-STEM;Atomic Resolution;Elemental Mapping;Dark Field Images;Nanoanalysis;Nanofabrication;NanodiffractionReviews: “This is written in a very readable style, packed with information and helpful explanations, and above all, very up to date. The book is generously illustrated, with many nice line-drawings, historic photographs, micrographs and spectra and, as a bonus, it has a name index as well as a subject index.” Ultramicroscopy
Field Emission Scanning Electron Microscopy
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Author : Nicolas Brodusch
language : en
Publisher: Springer
Release Date : 2017-09-25
Field Emission Scanning Electron Microscopy written by Nicolas Brodusch and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-09-25 with Technology & Engineering categories.
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Scanning Transmission Electron Microscopy
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Author : Alina Bruma
language : en
Publisher: CRC Press
Release Date : 2020-12-22
Scanning Transmission Electron Microscopy written by Alina Bruma and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-12-22 with Technology & Engineering categories.
Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications The information comprised in this book is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.