Impact Of Electron And Scanning Probe Microscopy On Materials Research
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Impact Of Electron And Scanning Probe Microscopy On Materials Research
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Author : David G. Rickerby
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Impact Of Electron And Scanning Probe Microscopy On Materials Research written by David G. Rickerby and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.
Scanning Probe Microscopy
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Author : Sergei V. Kalinin
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-04-03
Scanning Probe Microscopy written by Sergei V. Kalinin and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-04-03 with Technology & Engineering categories.
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
Advances In Scanning Probe Microscopy
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Author : T. Sakurai
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Advances In Scanning Probe Microscopy written by T. Sakurai and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has been felt in various fields, from surface physics and chemistry to nano-mechanics, nano-electronics and medical science. Its influence will surely extend further as the years go by, beyond the reach of our present imagination, and new research applications will continue to emerge. This book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their applications to fullerene film growth, SiC surface reconstructions, MBE (molecular beam epitaxy) growth of CaAs, atomic scale manipulation of Si surfaces and meso scopic work function.
Scanning Probe Microscopy
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Author : Bert Voigtländer
language : en
Publisher: Springer
Release Date : 2015-02-24
Scanning Probe Microscopy written by Bert Voigtländer and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-02-24 with Technology & Engineering categories.
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
Scanning Probe Microscopy Of Functional Materials
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Author : Sergei V. Kalinin
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-12-13
Scanning Probe Microscopy Of Functional Materials written by Sergei V. Kalinin and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-12-13 with Technology & Engineering categories.
The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.
Applied Scanning Probe Methods Iii
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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-04-28
Applied Scanning Probe Methods Iii written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-04-28 with Technology & Engineering categories.
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.
Scanning Probe Microscopes
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Author : K. S. Birdi
language : en
Publisher: CRC Press
Release Date : 2003-02-26
Scanning Probe Microscopes written by K. S. Birdi and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-02-26 with Science categories.
Scanning Probe Microscopes: Applications in Science and Technology explains, analyzes, and demonstrates the most widely used microscope in the family of microscopes -- the scanning probe microscope. Beginning with an introduction to the development of SPMs, the author introduces the basics of scanning tunneling and atomic force microscopes (STMs an
Atomic Force Microscopy Scanning Tunneling Microscopy 3
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Author : Samuel H. Cohen
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-05-08
Atomic Force Microscopy Scanning Tunneling Microscopy 3 written by Samuel H. Cohen and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-05-08 with Technology & Engineering categories.
The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998. This book represents the compilation of papers that were presented at the AFM/STM Symposium as well as a few that were presented at SCANNING 96 and SCANNING 97 meetings that took place in Monterey, California. The purpose of the symposium was to provide an interface between scientists and engineers, representatives of industry, government and academia, all of whom have a common interest in probe microscopies. The meetings offered an ideal forum where ideas could easily be exchanged and where individuals from diverse fields who are on the cutting edge ofprobe microscopy research could communicate with one another. Experts in probe microscopy from around the world representing a wide range of disciplines including physics, biotechnology, nanotechnology, chemistry, material science, etc., were invited to participate. The format of the meeting was structured so as to encourage communication among these individuals. During the first day’s sessions papers were presented on general topics such as application of scanning probe microscopy in materials science; STM and scanning tunneling spectroscopy of organic materials; fractal analysis in AFM; and nanomanipulation. Other papers presented included unexpected ordering of a molecule; synthesis ofpeptides and oligonucleotides; and analysis oflunar soils from Apollo 11.
In Situ Microscopy In Materials Research
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Author : Pratibha L. Gai
language : en
Publisher: Springer
Release Date : 1997-09-30
In Situ Microscopy In Materials Research written by Pratibha L. Gai and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-09-30 with Science categories.
Fulfilling the need for an informative account of the different in-situ microscopy methods, 13 chapters cover developments and applications in environmental-SEM, field emission-SEL, LEEM, reflection EM, UHV-TEM and HVEM, direct atomic-scale probing of gas molecule-solid interactions with environmental-HVEM, atomic level HVEM with very high temperature sample holders, electron diffraction, scanning tunneling microscopy (STM) (including for atomic-scale fabrication of surfaces and high temperature UHV-STM), electron holography, and Lorentz microscopy. Annotation copyrighted by Book News, Inc., Portland, OR
Applied Scanning Probe Methods Ii
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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-06-22
Applied Scanning Probe Methods Ii written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-06-22 with Technology & Engineering categories.
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.