Beleuchtungsverfahren Zur Problemspezifischen Bildgewinnung Fuer Die Automatische Sichtpruefung
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Beleuchtungsverfahren Zur Problemspezifischen Bildgewinnung F R Die Automatische Sichtpr Fung
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Author : Robin Gruna
language : de
Publisher:
Release Date : 2013
Beleuchtungsverfahren Zur Problemspezifischen Bildgewinnung F R Die Automatische Sichtpr Fung written by Robin Gruna and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with categories.
Beleuchtungsverfahren Zur Problemspezifischen Bildgewinnung Fuer Die Automatische Sichtpruefung
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Author : Gruna, Robin
language : de
Publisher: KIT Scientific Publishing
Release Date : 2015-03-25
Beleuchtungsverfahren Zur Problemspezifischen Bildgewinnung Fuer Die Automatische Sichtpruefung written by Gruna, Robin and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-03-25 with Electronic computers. Computer science categories.
In machine vision, the illumination design has direct impact on the performance of a visual inspection system. In this work, a problem-specific illumination design is presented, which is motivated by optical feature extraction taking place during physical image acquisition. The approach is analyzed on the basis of a physically based camera and illumination model and is experimentally evaluated in different application scenarios.
Application Of Diffractive Lens Arrays In Confocal Microscopy
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Author : Li, Zheng
language : en
Publisher: KIT Scientific Publishing
Release Date : 2022-06-27
Application Of Diffractive Lens Arrays In Confocal Microscopy written by Li, Zheng and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-06-27 with Science categories.
Diffractive lens arrays are proposed in this work for application in reflected-light confocal microscopes. They have overcome the limitations between fields of view and resolution of traditional objectives. Experiments of multi-spot confocal imaging in surface metrology and fluorescence microscopy have been demonstrated based on the proposed concepts, which have shown capabilities of high-resolution measurement over a large area.
A Contribution To Active Infrared Laser Spectroscopy For Remote Substance Detection
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Author : Jarvis, Jan-Philip
language : en
Publisher: KIT Scientific Publishing
Release Date : 2017-12-04
A Contribution To Active Infrared Laser Spectroscopy For Remote Substance Detection written by Jarvis, Jan-Philip and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-04 with categories.
High Speed Surface Profilometry Based On An Adaptive Microscope With Axial Chromatic Encoding
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Author : Luo, Ding
language : en
Publisher: KIT Scientific Publishing
Release Date : 2021-02-25
High Speed Surface Profilometry Based On An Adaptive Microscope With Axial Chromatic Encoding written by Luo, Ding and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-02-25 with Computers categories.
An adaptive microscope with axial chromatic encoding is designed and developed, namely the AdaScope. With the ability to confocally address any locations within the measurement volume, the AdaScope provides the hardware foundation for a cascade measurement strategy to be developed, dramatically accelerating the speed of 3D confocal microscopy.
Simulation Based Planning Of Machine Vision Inspection Systems With An Application To Laser Triangulation
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Author : Mohammadikaji, Mahsa
language : en
Publisher: KIT Scientific Publishing
Release Date : 2020-06-22
Simulation Based Planning Of Machine Vision Inspection Systems With An Application To Laser Triangulation written by Mohammadikaji, Mahsa and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-06-22 with Computers categories.
Light Field Methods For The Visual Inspection Of Transparent Objects
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Author : Meyer, Johannes
language : en
Publisher: KIT Scientific Publishing
Release Date : 2019-08-22
Light Field Methods For The Visual Inspection Of Transparent Objects written by Meyer, Johannes and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-08-22 with Science categories.
Beleuchtungsverfahren Zur Problemspezifi Schen Bildgewinnung F R Die Automatische Sichtpr Fung
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Author : Robin Gruna
language : de
Publisher:
Release Date : 2013
Beleuchtungsverfahren Zur Problemspezifi Schen Bildgewinnung F R Die Automatische Sichtpr Fung written by Robin Gruna and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with categories.
Probabilistische Planungsverfahren F R Die Deflektometrische Oberfl Cheninspektion
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Author : Roschani, Masoud
language : de
Publisher: KIT Scientific Publishing
Release Date : 2019-10-08
Probabilistische Planungsverfahren F R Die Deflektometrische Oberfl Cheninspektion written by Roschani, Masoud and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-10-08 with Computers categories.
Abbildende Ellipsometrie Mit Lichtwegumkehrung F R Die Optische Charakterisierung Von Gekr Mmten Oberfl Chen
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Author : Negara, Christian Emanuel
language : de
Publisher: KIT Scientific Publishing
Release Date : 2023-07-14
Abbildende Ellipsometrie Mit Lichtwegumkehrung F R Die Optische Charakterisierung Von Gekr Mmten Oberfl Chen written by Negara, Christian Emanuel and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-07-14 with categories.
Die Ellipsometrie ist ein Messverfahren zur Oberflächencharakterisierung und Dünnschichtmessung von ebenen Oberflächen unter Verwendung von polarisiertem Licht. Ein neues Messprinzip basierend auf Lichtwegumkehrung und Retroreflexion ermöglicht jedoch die Erfassung von beliebigen Freiformflächen. Dieses neue Messprinzip und damit verbundene Fragestellungen zur Messabbildung, Auswertealgorithmik und Mehrdeutigkeiten sowie Freiheitsgrade der Lösungsmenge werden in dieser Arbeit untersucht. - Ellipsometry is a measuring method for surface characterization and thin-film measurement of flat surfaces using polarized light. However, a new measuring principle based on return-path ellipsometry and retroreflection enables the detection of free-form surfaces. This new measurement principle and related questions regarding the measurement function, evaluation algorithms and ambiguities as well as degrees of freedom of the solution set are examined in this work.