High Speed Surface Profilometry Based On An Adaptive Microscope With Axial Chromatic Encoding
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High Speed Surface Profilometry Based On An Adaptive Microscope With Axial Chromatic Encoding
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Author : Luo, Ding
language : en
Publisher: KIT Scientific Publishing
Release Date : 2021-02-25
High Speed Surface Profilometry Based On An Adaptive Microscope With Axial Chromatic Encoding written by Luo, Ding and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-02-25 with Computers categories.
An adaptive microscope with axial chromatic encoding is designed and developed, namely the AdaScope. With the ability to confocally address any locations within the measurement volume, the AdaScope provides the hardware foundation for a cascade measurement strategy to be developed, dramatically accelerating the speed of 3D confocal microscopy.
Advances In Sports Science And Technology
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Author : D. Prasanna Balaji
language : en
Publisher: CRC Press
Release Date : 2025-04-29
Advances In Sports Science And Technology written by D. Prasanna Balaji and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-04-29 with Technology & Engineering categories.
It focused on the strategies, challenges and choices in the renaissance of modern sports. It brought together scientists, sports persons, decision makers and executives from across the globe to share research approaches, methods and results. It analyzed ways for implementing adaptable and observable improvement which have direct impact on sports.
Retroreflex Ellipsometry For Nonplanar Surfaces
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Author : Chen, Chia-Wei
language : en
Publisher: KIT Scientific Publishing
Release Date : 2025-04-29
Retroreflex Ellipsometry For Nonplanar Surfaces written by Chen, Chia-Wei and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-04-29 with categories.
Retroreflex ellipsometry addresses the geometric restrictions of conventional ellipsometry by using a retroreflective sheet, which returns the light beam from the sample on the same beam path. Simulation and experiments of retroreflex ellipsometry in two- and three-phase systems have been demonstrated based on the proposed concepts, which have shown the capabilities of ellipsometric measurements on nonplanar surfaces.
Application Of Diffractive Lens Arrays In Confocal Microscopy
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Author : Li, Zheng
language : en
Publisher: KIT Scientific Publishing
Release Date : 2022-06-27
Application Of Diffractive Lens Arrays In Confocal Microscopy written by Li, Zheng and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-06-27 with Science categories.
Diffractive lens arrays are proposed in this work for application in reflected-light confocal microscopes. They have overcome the limitations between fields of view and resolution of traditional objectives. Experiments of multi-spot confocal imaging in surface metrology and fluorescence microscopy have been demonstrated based on the proposed concepts, which have shown capabilities of high-resolution measurement over a large area.
Towards Learning Object Detectors With Limited Data For Industrial Applications
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Author : Guirguis, Karim
language : en
Publisher: KIT Scientific Publishing
Release Date : 2025-04-02
Towards Learning Object Detectors With Limited Data For Industrial Applications written by Guirguis, Karim and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-04-02 with categories.
In dieser Dissertation werden drei neuartige Generalized FSOD (G-FSOD)-Ansätze vorgestellt, die das Vergessen von zuvor gelernten Klassen beim Lernen neuer Klassen mit begrenzten Daten minimieren. Die ersten beiden Ansätze reduzieren das Vergessen von Basisklassen, wenn diese während des Trainings noch verfügbar sind. Der dritte Ansatz, für Szenarien ohne Basisdaten, nutzt Wissensdestillation, um den Wissenstransfer zu verbessern. - In this dissertation, three novel Generalized Few-Shot Object Detection (G-FSOD) approaches are presented to minimize the forgetting of previously learned classes while learning new classes with limited data. The first two approaches reduce the forgetting of base classes if they are still available during training. The third approach, for scenarios without base data, uses knowledge distillation to improve the knowledge transfer.
Bildfolgenbasierte Gewinnung Und Nutzung Partikelindividueller Bewegungsinformation In Der Optischen Sch Ttgutsortierung
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Author : Maier, Georg
language : de
Publisher: KIT Scientific Publishing
Release Date : 2022-06-21
Bildfolgenbasierte Gewinnung Und Nutzung Partikelindividueller Bewegungsinformation In Der Optischen Sch Ttgutsortierung written by Maier, Georg and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-06-21 with Computers categories.
Die sensorgestützte Sortierung ermöglicht die Trennung einzelner Partikel aus einem Materialstrom. In dieser Arbeit wird eine neue Gattung eines Schüttgutsortiersystems mit Flächenkamera erforscht. Der Einsatz von Hochgeschwindigkeitskameras als Inspektionssensorik wirft aus Sicht der Informatik spannende Forschungsfragen hinsichtlich der Gewinnung und Nutzung weitergehender Merkmale, insbesondere von Bewegungsinformation über zu sortierende Materialien, auf. - Sensor-based sorting enables the separation of individual particles from a material stream. In this work, a novel sorting system using an area-scan camera is investigated. The use of high-speed cameras raises exciting research questions from a computer science perspective regarding the extraction and use of more advanced features, especially motion information about the materials to be sorted.
Methodische Evaluation Von Verfahren Zur Korrektur Atmosph Rischer Turbulenz In Bildsequenzen
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Author : Hübner, Claudia Susanne
language : de
Publisher: KIT Scientific Publishing
Release Date : 2024-06-26
Methodische Evaluation Von Verfahren Zur Korrektur Atmosph Rischer Turbulenz In Bildsequenzen written by Hübner, Claudia Susanne and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-06-26 with categories.
Bei langen horizontalen Ausbreitungswegen ist die Atmosphäre, nicht die verwendete Sensorik entscheidend für die Qualität erfasster Bilddaten. Atmosphärische Turbulenz verursacht erhöhte Unschärfe, verringerten (Farb-)Kontrast und (scheinbare) Bildbewegungen, sowie Bilddeformierungen. Diese Arbeit beschäftigt sich mit der Frage, wie man diese beeinträchtigenden Effekte am besten abmildern und die Qualität der Bilddaten mithilfe geeigneter Rekonstruktionsverfahren verbessern kann. - For long horizontal propagation distances, it is the atmosphere, not the sensor technology which is responsible for the quality of acquired image data. Atmospheric turbulence causes increased blur, reduced (color) contrast and (apparent) image motion, as well as image deformation. This work addresses the question of how best to mitigate these degrading effects and improve image data quality using suitable reconstruction techniques.
Abbildende Ellipsometrie Mit Lichtwegumkehrung F R Die Optische Charakterisierung Von Gekr Mmten Oberfl Chen
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Author : Negara, Christian Emanuel
language : de
Publisher: KIT Scientific Publishing
Release Date : 2023-07-14
Abbildende Ellipsometrie Mit Lichtwegumkehrung F R Die Optische Charakterisierung Von Gekr Mmten Oberfl Chen written by Negara, Christian Emanuel and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-07-14 with categories.
Die Ellipsometrie ist ein Messverfahren zur Oberflächencharakterisierung und Dünnschichtmessung von ebenen Oberflächen unter Verwendung von polarisiertem Licht. Ein neues Messprinzip basierend auf Lichtwegumkehrung und Retroreflexion ermöglicht jedoch die Erfassung von beliebigen Freiformflächen. Dieses neue Messprinzip und damit verbundene Fragestellungen zur Messabbildung, Auswertealgorithmik und Mehrdeutigkeiten sowie Freiheitsgrade der Lösungsmenge werden in dieser Arbeit untersucht. - Ellipsometry is a measuring method for surface characterization and thin-film measurement of flat surfaces using polarized light. However, a new measuring principle based on return-path ellipsometry and retroreflection enables the detection of free-form surfaces. This new measurement principle and related questions regarding the measurement function, evaluation algorithms and ambiguities as well as degrees of freedom of the solution set are examined in this work.
Optical Engineering
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Author :
language : en
Publisher:
Release Date : 2002
Optical Engineering written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002 with Optical instruments categories.
Publishes papers reporting on research and development in optical science and engineering and the practical applications of known optical science, engineering, and technology.
Surfaces And Their Measurement
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Author : David J. Whitehouse
language : en
Publisher: CRC Press
Release Date : 2002
Surfaces And Their Measurement written by David J. Whitehouse and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002 with Technology & Engineering categories.
The importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology is the scientific study of measurement, and surface metrology is the study of the measurement of rough surfaces. In this book, Professor David Whitehouse, an internationally acknowledged subject expert, covers the wide range of theory and practice, including the use of new methods of instrumentation.'Written by one of the world's leading metrologists?Covers electronics and optics applications as well as mechanical?Written for mechanical and manufacturing engineers, tribologists and precision engineers in industry and academia