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High Speed Surface Profilometry Based On An Adaptive Microscope With Axial Chromatic Encoding


High Speed Surface Profilometry Based On An Adaptive Microscope With Axial Chromatic Encoding
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High Speed Surface Profilometry Based On An Adaptive Microscope With Axial Chromatic Encoding


High Speed Surface Profilometry Based On An Adaptive Microscope With Axial Chromatic Encoding
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Author : Luo, Ding
language : en
Publisher: KIT Scientific Publishing
Release Date : 2021-02-25

High Speed Surface Profilometry Based On An Adaptive Microscope With Axial Chromatic Encoding written by Luo, Ding and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-02-25 with Computers categories.


An adaptive microscope with axial chromatic encoding is designed and developed, namely the AdaScope. With the ability to confocally address any locations within the measurement volume, the AdaScope provides the hardware foundation for a cascade measurement strategy to be developed, dramatically accelerating the speed of 3D confocal microscopy.



Application Of Diffractive Lens Arrays In Confocal Microscopy


Application Of Diffractive Lens Arrays In Confocal Microscopy
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Author : Li, Zheng
language : en
Publisher: KIT Scientific Publishing
Release Date : 2022-06-27

Application Of Diffractive Lens Arrays In Confocal Microscopy written by Li, Zheng and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-06-27 with Science categories.


Diffractive lens arrays are proposed in this work for application in reflected-light confocal microscopes. They have overcome the limitations between fields of view and resolution of traditional objectives. Experiments of multi-spot confocal imaging in surface metrology and fluorescence microscopy have been demonstrated based on the proposed concepts, which have shown capabilities of high-resolution measurement over a large area.



Bildfolgenbasierte Gewinnung Und Nutzung Partikelindividueller Bewegungsinformation In Der Optischen Sch Ttgutsortierung


Bildfolgenbasierte Gewinnung Und Nutzung Partikelindividueller Bewegungsinformation In Der Optischen Sch Ttgutsortierung
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Author : Maier, Georg
language : de
Publisher: KIT Scientific Publishing
Release Date : 2022-06-21

Bildfolgenbasierte Gewinnung Und Nutzung Partikelindividueller Bewegungsinformation In Der Optischen Sch Ttgutsortierung written by Maier, Georg and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-06-21 with Computers categories.


Die sensorgestützte Sortierung ermöglicht die Trennung einzelner Partikel aus einem Materialstrom. In dieser Arbeit wird eine neue Gattung eines Schüttgutsortiersystems mit Flächenkamera erforscht. Der Einsatz von Hochgeschwindigkeitskameras als Inspektionssensorik wirft aus Sicht der Informatik spannende Forschungsfragen hinsichtlich der Gewinnung und Nutzung weitergehender Merkmale, insbesondere von Bewegungsinformation über zu sortierende Materialien, auf. - Sensor-based sorting enables the separation of individual particles from a material stream. In this work, a novel sorting system using an area-scan camera is investigated. The use of high-speed cameras raises exciting research questions from a computer science perspective regarding the extraction and use of more advanced features, especially motion information about the materials to be sorted.



Abbildende Ellipsometrie Mit Lichtwegumkehrung F R Die Optische Charakterisierung Von Gekr Mmten Oberfl Chen


Abbildende Ellipsometrie Mit Lichtwegumkehrung F R Die Optische Charakterisierung Von Gekr Mmten Oberfl Chen
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Author : Negara, Christian Emanuel
language : de
Publisher: KIT Scientific Publishing
Release Date : 2023-07-14

Abbildende Ellipsometrie Mit Lichtwegumkehrung F R Die Optische Charakterisierung Von Gekr Mmten Oberfl Chen written by Negara, Christian Emanuel and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-07-14 with categories.


Die Ellipsometrie ist ein Messverfahren zur Oberflächencharakterisierung und Dünnschichtmessung von ebenen Oberflächen unter Verwendung von polarisiertem Licht. Ein neues Messprinzip basierend auf Lichtwegumkehrung und Retroreflexion ermöglicht jedoch die Erfassung von beliebigen Freiformflächen. Dieses neue Messprinzip und damit verbundene Fragestellungen zur Messabbildung, Auswertealgorithmik und Mehrdeutigkeiten sowie Freiheitsgrade der Lösungsmenge werden in dieser Arbeit untersucht. - Ellipsometry is a measuring method for surface characterization and thin-film measurement of flat surfaces using polarized light. However, a new measuring principle based on return-path ellipsometry and retroreflection enables the detection of free-form surfaces. This new measurement principle and related questions regarding the measurement function, evaluation algorithms and ambiguities as well as degrees of freedom of the solution set are examined in this work.



Optical Engineering


Optical Engineering
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Author :
language : en
Publisher:
Release Date : 2002

Optical Engineering written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002 with Optical instruments categories.


Publishes papers reporting on research and development in optical science and engineering and the practical applications of known optical science, engineering, and technology.



Optical Coherence Tomography And Its Non Medical Applications


Optical Coherence Tomography And Its Non Medical Applications
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Author : Michael Wang
language : en
Publisher: BoD – Books on Demand
Release Date : 2020-05-27

Optical Coherence Tomography And Its Non Medical Applications written by Michael Wang and has been published by BoD – Books on Demand this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-05-27 with Science categories.


Optical coherence tomography (OCT) is a promising non-invasive non-contact 3D imaging technique that can be used to evaluate and inspect material surfaces, multilayer polymer films, fiber coils, and coatings. OCT can be used for the examination of cultural heritage objects and 3D imaging of microstructures. With subsurface 3D fingerprint imaging capability, OCT could be a valuable tool for enhancing security in biometric applications. OCT can also be used for the evaluation of fastener flushness for improving aerodynamic performance of high-speed aircraft. More and more OCT non-medical applications are emerging. In this book, we present some recent advancements in OCT technology and non-medical applications.



Theory And Practice Of Scanning Optical Microscopy


Theory And Practice Of Scanning Optical Microscopy
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Author : Tony Wilson
language : en
Publisher:
Release Date : 1984

Theory And Practice Of Scanning Optical Microscopy written by Tony Wilson and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1984 with Science categories.




Confocal Raman Microscopy


Confocal Raman Microscopy
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Author : Jan Toporski
language : en
Publisher: Springer
Release Date : 2018-03-01

Confocal Raman Microscopy written by Jan Toporski and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-03-01 with Science categories.


This second edition provides a cutting-edge overview of physical, technical and scientific aspects related to the widely used analytical method of confocal Raman microscopy. The book includes expanded background information and adds insights into how confocal Raman microscopy, especially 3D Raman imaging, can be integrated with other methods to produce a variety of correlative microscopy combinations. The benefits are then demonstrated and supported by numerous examples from the fields of materials science, 2D materials, the life sciences, pharmaceutical research and development, as well as the geosciences.



Optical Measurement Of Surface Topography


Optical Measurement Of Surface Topography
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Author : Richard Leach
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-03-31

Optical Measurement Of Surface Topography written by Richard Leach and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-03-31 with Technology & Engineering categories.


The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.



Surfaces And Their Measurement


Surfaces And Their Measurement
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Author : David J. Whitehouse
language : en
Publisher: Elsevier
Release Date : 2004-07-01

Surfaces And Their Measurement written by David J. Whitehouse and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-07-01 with Science categories.


The importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology is the scientific study of measurement, and surface metrology is the study of the measurement of rough surfaces. In this book, Professor David Whitehouse, an internationally acknowledged subject expert, covers the wide range of theory and practice, including the use of new methods of instrumentation. · Written by one of the world's leading metrologists · Covers electronics and optics applications as well as mechanical · Written for mechanical and manufacturing engineers, tribologists and precision engineers in industry and academia