Retroreflex Ellipsometry For Nonplanar Surfaces
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Retroreflex Ellipsometry For Nonplanar Surfaces
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Author : Chen, Chia-Wei
language : en
Publisher: KIT Scientific Publishing
Release Date : 2025-04-29
Retroreflex Ellipsometry For Nonplanar Surfaces written by Chen, Chia-Wei and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-04-29 with categories.
Retroreflex ellipsometry addresses the geometric restrictions of conventional ellipsometry by using a retroreflective sheet, which returns the light beam from the sample on the same beam path. Simulation and experiments of retroreflex ellipsometry in two- and three-phase systems have been demonstrated based on the proposed concepts, which have shown the capabilities of ellipsometric measurements on nonplanar surfaces.
Proceedings Of The 2019 Joint Workshop Of Fraunhofer Iosb And Institute For Anthropomatics Vision And Fusion Laboratory
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Author : Beyerer, Jürgen
language : en
Publisher: KIT Scientific Publishing
Release Date : 2020-10-23
Proceedings Of The 2019 Joint Workshop Of Fraunhofer Iosb And Institute For Anthropomatics Vision And Fusion Laboratory written by Beyerer, Jürgen and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-10-23 with Computers categories.
In 2019 fand wieder der jährliche Workshop des Fraunhofer IOSB und des Lehrstuhls für Interaktive Echtzeitsysteme des Karlsruher Insitut für Technologie statt. Die Doktoranden beider Institutionen präsentierten den Fortschritt ihrer Forschung in den Themen Maschinelles Lernen, Machine Vision, Messtechnik, Netzwerksicherheit und Usage Control. Die Ideen dieses Workshops sind in diesem Buch gesammelt in der Form technischer Berichte. - In 2019 again, the annual joint workshop of the Fraunhofer IOSB and the Vision and Fusion Laboratory of the Karlsruhe Institute of Technology took place. The doctoral students of both institutions presented extensive reports on the status of their research and discussed topics ranging from computer vision and optical metrology to network security, usage control and machine learning. The results and ideas presented at the workshop are collected in this book in the form of technical reports.
Proceedings Of The 2020 Joint Workshop Of Fraunhofer Iosb And Institute For Anthropomatics Vision And Fusion Laboratory
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Author : Beyerer, Jürgen
language : en
Publisher: KIT Scientific Publishing
Release Date : 2021-06-22
Proceedings Of The 2020 Joint Workshop Of Fraunhofer Iosb And Institute For Anthropomatics Vision And Fusion Laboratory written by Beyerer, Jürgen and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-06-22 with Computers categories.
In 2020 fand der jährliche Workshop des Faunhofer IOSB und the Lehrstuhls für interaktive Echtzeitsysteme statt. Vom 27. bis zum 31. Juli trugen die Doktorranden der beiden Institute über den Stand ihrer Forschung vor in Themen wie KI, maschinellen Lernen, computer vision, usage control, Metrologie vor. Die Ergebnisse dieser Vorträge sind in diesem Band als technische Berichte gesammelt. - In 2020, the annual joint workshop of the Fraunhofer IOSB and the Vision and Fusion Laboratory of the KIT was hosted at the IOSB in Karlsruhe. For a week from the 27th to the 31st July the doctoral students of both institutions presented extensive reports on the status of their research and discussed topics ranging from computer vision and optical metrology to network security, usage control and machine learning. The results and ideas presented at the workshop are collected in this book.
Ocm 2023 Optical Characterization Of Materials Conference Proceedings
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Author : Beyerer, Jürgen
language : en
Publisher: KIT Scientific Publishing
Release Date : 2023-05-25
Ocm 2023 Optical Characterization Of Materials Conference Proceedings written by Beyerer, Jürgen and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-05-25 with Science categories.
The state of the art in the optical characterization of materials is advancing rapidly. New insights have been gained into the theoretical foundations of this research and exciting developments have been made in practice, driven by new applications and innovative sensor technologies that are constantly evolving.
Automatische Sichtpr Fung
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Author : Jürgen Beyerer
language : de
Publisher: Springer-Verlag
Release Date : 2024-10-02
Automatische Sichtpr Fung written by Jürgen Beyerer and has been published by Springer-Verlag this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-10-02 with Technology & Engineering categories.
Das Lehrbuch behandelt systematisch die Bildgewinnung für die automatische Sichtprüfung. Die Autoren leiten die wesentlichen Methoden detailliert ab und stellen alle gängigen Bildgewinnungsverfahren in einem strukturierten Zusammenhang dar. Der zweite Teil des Buches ist der Bildsignalbeschreibung und der Bildauswertung gewidmet, wobei insbesondere Methoden behandelt werden, die für die automatische Sichtprüfung relevant sind. Die Autoren skizzieren die Herleitung der beschriebenen Methoden, ohne sich in mathematischen Details zu verlieren. Ihr Ziel ist, dass der Leser die Zusammenhänge wirklich versteht und das "große Bild" des Fachgebietes erkennt. Das Buch ist in sich geschlossen und bedarf zum Verständnis keiner ergänzenden Literatur. Die 3. Auflage wurde an vielen Stellen verbessert und unter anderem durch die detaillierte Einführung von neuronalen Faltungsnetzen auf den aktuellen Stand der Technik aktualisiert. Die Zielgruppen Das Buch eignet sich für Studierende der Informatik, Elektro- und Informationstechnik, der Physik und des Maschinenbaus. Ebenso wendet es sich an Ingenieure in der Automatisierungstechnik.
Abbildende Ellipsometrie Mit Lichtwegumkehrung F R Die Optische Charakterisierung Von Gekr Mmten Oberfl Chen
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Author : Negara, Christian Emanuel
language : de
Publisher: KIT Scientific Publishing
Release Date : 2023-07-14
Abbildende Ellipsometrie Mit Lichtwegumkehrung F R Die Optische Charakterisierung Von Gekr Mmten Oberfl Chen written by Negara, Christian Emanuel and has been published by KIT Scientific Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-07-14 with categories.
Die Ellipsometrie ist ein Messverfahren zur Oberflächencharakterisierung und Dünnschichtmessung von ebenen Oberflächen unter Verwendung von polarisiertem Licht. Ein neues Messprinzip basierend auf Lichtwegumkehrung und Retroreflexion ermöglicht jedoch die Erfassung von beliebigen Freiformflächen. Dieses neue Messprinzip und damit verbundene Fragestellungen zur Messabbildung, Auswertealgorithmik und Mehrdeutigkeiten sowie Freiheitsgrade der Lösungsmenge werden in dieser Arbeit untersucht. - Ellipsometry is a measuring method for surface characterization and thin-film measurement of flat surfaces using polarized light. However, a new measuring principle based on return-path ellipsometry and retroreflection enables the detection of free-form surfaces. This new measurement principle and related questions regarding the measurement function, evaluation algorithms and ambiguities as well as degrees of freedom of the solution set are examined in this work.
Spectroscopic Ellipsometry
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Author : Hiroyuki Fujiwara
language : en
Publisher: John Wiley & Sons
Release Date : 2007-09-27
Spectroscopic Ellipsometry written by Hiroyuki Fujiwara and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-09-27 with Technology & Engineering categories.
Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.
Ellipsometry In The Measurement Of Surfaces And Thin Films
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Author : Elio Passaglia
language : en
Publisher:
Release Date : 1964
Ellipsometry In The Measurement Of Surfaces And Thin Films written by Elio Passaglia and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1964 with Ellipsometry categories.