Ellipsometry In The Measurement Of Surfaces And Thin Films
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Ellipsometry In The Measurement Of Surfaces And Thin Films
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Author : Elio Passaglia
language : en
Publisher:
Release Date : 1964
Ellipsometry In The Measurement Of Surfaces And Thin Films written by Elio Passaglia and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1964 with Ellipsometry categories.
Ellipsometry Of Functional Organic Surfaces And Films
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Author : Karsten Hinrichs
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-10-24
Ellipsometry Of Functional Organic Surfaces And Films written by Karsten Hinrichs and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-24 with Science categories.
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
Spectroscopic Ellipsometry
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Author : Hiroyuki Fujiwara
language : en
Publisher: John Wiley & Sons
Release Date : 2007-09-27
Spectroscopic Ellipsometry written by Hiroyuki Fujiwara and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-09-27 with Technology & Engineering categories.
Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.
Spectroscopic Ellipsometry And Reflectometry
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Author : Harland G. Tompkins
language : en
Publisher: Wiley-Interscience
Release Date : 1999-03-18
Spectroscopic Ellipsometry And Reflectometry written by Harland G. Tompkins and has been published by Wiley-Interscience this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999-03-18 with Science categories.
While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. A guide for practitioners and researchers in a variety of disciplines, it addresses a broad range of applications in physics, chemistry, electrical engineering, and materials science.
Ellipsometry In The Measurement Of Surfaces And Thin Films
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Author : E. Passaglia
language : en
Publisher:
Release Date : 1963
Ellipsometry In The Measurement Of Surfaces And Thin Films written by E. Passaglia and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1963 with categories.
Ellipsometry In The Measurement Of Surfaces And Thin Films
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Author : E. Passaglia
language : en
Publisher:
Release Date : 1964
Ellipsometry In The Measurement Of Surfaces And Thin Films written by E. Passaglia and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1964 with categories.
Ellipsometry At The Nanoscale
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Author : Maria Losurdo
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-12
Ellipsometry At The Nanoscale written by Maria Losurdo and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-12 with Technology & Engineering categories.
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.
Ellipsometry In The Measurement Of Surfaces And Thin Films
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Author :
language : en
Publisher:
Release Date : 1963
Ellipsometry In The Measurement Of Surfaces And Thin Films written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1963 with Optics categories.
Nanocrystals
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Author : Sudheer Neralla
language : en
Publisher: BoD – Books on Demand
Release Date : 2012-08-29
Nanocrystals written by Sudheer Neralla and has been published by BoD – Books on Demand this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-08-29 with Science categories.
Nanocrystals research has been an area of significant interest lately, due to the wide variety of potential applications in semiconductor, optical and biomedical fields. This book consists of a collection of research work on nanocrystals processing and characterization of their structural, optical, electronic, magnetic and mechanical properties. Various methods for nanocrystals synthesis are discussed in the book. Size-dependent properties such as quantum confinement, superparamagnetism have been observed in semiconductor and magnetic nanoparticles. Nanocrystals incorporated into different material systems have proven to possess improved properties. A review of the exciting outcomes nanoparticles study has provided indicates further accomplishments in the near future.
Optical Properties Of Materials And Their Applications
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Author : Jai Singh
language : en
Publisher: John Wiley & Sons
Release Date : 2020-01-07
Optical Properties Of Materials And Their Applications written by Jai Singh and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-01-07 with Science categories.
Provides a semi-quantitative approach to recent developments in the study of optical properties of condensed matter systems Featuring contributions by noted experts in the field of electronic and optoelectronic materials and photonics, this book looks at the optical properties of materials as well as their physical processes and various classes. Taking a semi-quantitative approach to the subject, it presents a summary of the basic concepts, reviews recent developments in the study of optical properties of materials and offers many examples and applications. Optical Properties of Materials and Their Applications, 2nd Edition starts by identifying the processes that should be described in detail and follows with the relevant classes of materials. In addition to featuring four new chapters on optoelectronic properties of organic semiconductors, recent advances in electroluminescence, perovskites, and ellipsometry, the book covers: optical properties of disordered condensed matter and glasses; concept of excitons; photoluminescence, photoinduced changes, and electroluminescence in noncrystalline semiconductors; and photoinduced bond breaking and volume change in chalcogenide glasses. Also included are chapters on: nonlinear optical properties of photonic glasses; kinetics of the persistent photoconductivity in crystalline III-V semiconductors; and transparent white OLEDs. In addition, readers will learn about excitonic processes in quantum wells; optoelectronic properties and applications of quantum dots; and more. Covers all of the fundamentals and applications of optical properties of materials Includes theory, experimental techniques, and current and developing applications Includes four new chapters on optoelectronic properties of organic semiconductors, recent advances in electroluminescence, perovskites, and ellipsometry Appropriate for materials scientists, chemists, physicists and electrical engineers involved in development of electronic materials Written by internationally respected professionals working in physics and electrical engineering departments and government laboratories Optical Properties of Materials and Their Applications, 2nd Edition is an ideal book for senior undergraduate and postgraduate students, and teaching and research professionals in the fields of physics, chemistry, chemical engineering, materials science, and materials engineering.