Built In Self Test And Digital Self Calibration For Rf Socs
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Built In Self Test And Digital Self Calibration For Rf Socs
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Author : Sleiman Bou-Sleiman
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-09-23
Built In Self Test And Digital Self Calibration For Rf Socs written by Sleiman Bou-Sleiman and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-09-23 with Technology & Engineering categories.
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
Built In Self Test And Digital Self Calibration For Rf Socs
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Author : Matthew Marsh
language : en
Publisher: Createspace Independent Publishing Platform
Release Date : 2017-05-08
Built In Self Test And Digital Self Calibration For Rf Socs written by Matthew Marsh and has been published by Createspace Independent Publishing Platform this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-05-08 with categories.
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
Built In Self Test And Digital Self Calibration For Rf Socs
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Author : Wayne Worley
language : en
Publisher: Createspace Independent Publishing Platform
Release Date : 2017-03-22
Built In Self Test And Digital Self Calibration For Rf Socs written by Wayne Worley and has been published by Createspace Independent Publishing Platform this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-03-22 with categories.
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
Built In Self Test And Digital Self Calibration For Radio Frequency Integrated Circuits
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Author : Sleiman Bou Sleiman
language : en
Publisher:
Release Date : 2011
Built In Self Test And Digital Self Calibration For Radio Frequency Integrated Circuits written by Sleiman Bou Sleiman and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011 with categories.
Abstract: he continual physical shrinking of semiconductor device dimensions is allowing for more integration between the previously segmented digital logic, memory, analog, and radio frequency domains - heralding the "More than Moore" era. Although able to meet the performance requirements for high-speed analog and RF, the devices are not guaranteed to always run at their typical sweet spot. The drifts from the optimal operation are due to many factors related to the silicon process and its response to changes in voltage and temperature, or what is collectively named PVT (Process, Voltage, Temperature) variations. These variations are a problem in all the integrated domains of the chip; however, RF circuits fail, in a more disproportionate manner, at sustaining proper operation over PVT. This makes them more prone to performance degradations and loss of yield when fabricated, in contrast to digital chips that can achieve near perfect yield. Putting both RF and digital together on a single chip, the hybrid system obviously inherits the lower yield, negating all the integration advantages. Therefore, the RF portions, in a sense, represent the SoC's Achilles' heel; in essence, an overly powerful and densely integrated chip can be made useless by a smaller underperforming portion of the chip. The ultimate goal is to increase the yield of the RF blocks by actively maintaining them in their optimal operating region. This proves to be a non-trivial task, as the operating conditions of the system at all times need to be known. For complex integrated systems, full verification during fabrication testing is quite prohibitive, in time and cost. A solution would be to build self-testing, and eventually self-healing, systems. Built-in-Self-Test (BiST) paradigms have already established themselves in the validation of digital blocks but are now becoming an increasingly active domain of research and development in RF. The notion of migrating RF test functionality to inside the chip brings us one step closer to cognitive-like radios. If RF blocks and systems can test for, and extract, their performance, then the ability to calibrate and cancel discrepancies can also be built into the system. Hence, Built-in-Self-Calibration (BiSC) can be layered on top of BiST to result in auto-correcting RF impairments at the block and system levels. In this dissertation, we discuss the problems set forth by increased integration and decreased circuit robustness. We also express the requirements for building efficient true self-test mechanisms using on-chip resources not only as value-added elements but also as necessary components for successful first-pass success of RF SoCs. An efficient RF sensor is presented along with the different possible built-in-tests for which it can be employed. The implementation of these on-chip test strategies aid in the development of calibration techniques that leverage the strengths of the more robust parts of the system to cover up the weaknesses of the others.
Machine Learning Paradigms
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Author : George A. Tsihrintzis
language : en
Publisher: Springer
Release Date : 2019-07-06
Machine Learning Paradigms written by George A. Tsihrintzis and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-07-06 with Technology & Engineering categories.
This book is the inaugural volume in the new Springer series on Learning and Analytics in Intelligent Systems. The series aims at providing, in hard-copy and soft-copy form, books on all aspects of learning, analytics, advanced intelligent systems and related technologies. These disciplines are strongly related and mutually complementary; accordingly, the new series encourages an integrated approach to themes and topics in these disciplines, which will result in significant cross-fertilization, research advances and new knowledge creation. To maximize the dissemination of research findings, the series will publish edited books, monographs, handbooks, textbooks and conference proceedings. This book is intended for professors, researchers, scientists, engineers and students. An extensive list of references at the end of each chapter allows readers to probe further into those application areas that interest them most.
Advances In Sensors Reviews Vol 7 Physical And Chemical Sensors Design Applications Networks
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Author : Sergey Yurish
language : en
Publisher: Lulu.com
Release Date :
Advances In Sensors Reviews Vol 7 Physical And Chemical Sensors Design Applications Networks written by Sergey Yurish and has been published by Lulu.com this book supported file pdf, txt, epub, kindle and other format this book has been release on with categories.
Advanced Circuits For Emerging Technologies
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Author : Krzysztof Iniewski
language : en
Publisher: John Wiley & Sons
Release Date : 2012-04-17
Advanced Circuits For Emerging Technologies written by Krzysztof Iniewski and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-04-17 with Technology & Engineering categories.
The book will address the-state-of-the-art in integrated circuit design in the context of emerging systems. New exciting opportunities in body area networks, wireless communications, data networking, and optical imaging are discussed. Emerging materials that can take system performance beyond standard CMOS, like Silicon on Insulator (SOI), Silicon Germanium (SiGe), and Indium Phosphide (InP) are explored. Three-dimensional (3-D) CMOS integration and co-integration with sensor technology are described as well. The book is a must for anyone serious about circuit design for future technologies. The book is written by top notch international experts in industry and academia. The intended audience is practicing engineers with integrated circuit background. The book will be also used as a recommended reading and supplementary material in graduate course curriculum. Intended audience is professionals working in the integrated circuit design field. Their job titles might be : design engineer, product manager, marketing manager, design team leader, etc. The book will be also used by graduate students. Many of the chapter authors are University Professors.
Mixed Signal Circuits
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Author : Thomas Noulis
language : en
Publisher: CRC Press
Release Date : 2018-09-03
Mixed Signal Circuits written by Thomas Noulis and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-09-03 with Technology & Engineering categories.
Mixed-Signal Circuits offers a thoroughly modern treatment of integrated circuit design in the context of mixed-signal applications. Featuring chapters authored by leading experts from industry and academia, this book: Discusses signal integrity and large-scale simulation, verification, and testing Demonstrates advanced design techniques that enable digital circuits and sensitive analog circuits to coexist without any compromise Describes the process technology needed to address the performance challenges associated with developing complex mixed-signal circuits Deals with modeling topics, such as reliability, variability, and crosstalk, that define pre-silicon design methodology and trends, and are the focus of companies involved in wireless applications Develops methods to move analog into the digital domain quickly, minimizing and eliminating common trade-offs between performance, power consumption, simulation time, verification, size, and cost Details approaches for very low-power performances, high-speed interfaces, phase-locked loops (PLLs), voltage-controlled oscillators (VCOs), analog-to-digital converters (ADCs), and biomedical filters Delineates the respective parts of a full system-on-chip (SoC), from the digital parts to the baseband blocks, radio frequency (RF) circuitries, electrostatic-discharge (ESD) structures, and built-in self-test (BIST) architectures Mixed-Signal Circuits explores exciting opportunities in wireless communications and beyond. The book is a must for anyone involved in mixed-signal circuit design for future technologies.
Test And Diagnosis Of Analogue Mixed Signal And Rf Integrated Circuits
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Author : Yichuang Sun
language : en
Publisher: IET
Release Date : 2008-05-30
Test And Diagnosis Of Analogue Mixed Signal And Rf Integrated Circuits written by Yichuang Sun and has been published by IET this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-05-30 with Technology & Engineering categories.
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
Wireless Technologies
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Author : Krzysztof Iniewski
language : en
Publisher: CRC Press
Release Date : 2017-12-19
Wireless Technologies written by Krzysztof Iniewski and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-19 with Technology & Engineering categories.
Advanced concepts for wireless technologies present a vision of technology that is embedded in our surroundings and practically invisible. From established radio techniques like GSM, 802.11 or Bluetooth to more emerging technologies, such as Ultra Wide Band and smart dust motes, a common denominator for future progress is the underlying integrated circuit technology. Wireless Technologies responds to the explosive growth of standard cellular radios and radically different wireless applications by presenting new architectural and circuit solutions engineers can use to solve modern design problems. This reference addresses state-of-the art CMOS design in the context of emerging wireless applications, including 3G/4G cellular telephony, wireless sensor networks, and wireless medical application. Written by top international experts specializing in both the IC industry and academia, this carefully edited work uncovers new design opportunities in body area networks, medical implants, satellite communications, automobile radar detection, and wearable electronics. The book is divided into three sections: wireless system perspectives, chip architecture and implementation issues, and devices and technologies used to fabricate wireless integrated circuits. Contributors address key issues in the development of future silicon-based systems, such as scale of integration, ultra-low power dissipation, and the integration of heterogeneous circuit design style and processes onto one substrate. Wireless sensor network systems are now being applied in critical applications in commerce, healthcare, and security. This reference, which contains 25 practical and scientifically rigorous articles, provides the knowledge communications engineers need to design innovative methodologies at the circuit and system level.