Built In Test
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Built In Test For Vlsi
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Author : Paul H. Bardell
language : en
Publisher: Wiley-Interscience
Release Date : 1987-10-20
Built In Test For Vlsi written by Paul H. Bardell and has been published by Wiley-Interscience this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987-10-20 with Technology & Engineering categories.
This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing.
System On Chip Test Architectures
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Author : Laung-Terng Wang
language : en
Publisher: Morgan Kaufmann
Release Date : 2010-07-28
System On Chip Test Architectures written by Laung-Terng Wang and has been published by Morgan Kaufmann this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-07-28 with Technology & Engineering categories.
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
Built In Self Test And Digital Self Calibration For Rf Socs
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Author : Sleiman Bou-Sleiman
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-09-23
Built In Self Test And Digital Self Calibration For Rf Socs written by Sleiman Bou-Sleiman and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-09-23 with Technology & Engineering categories.
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
Mech
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Author :
language : en
Publisher:
Release Date : 1982
Mech written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1982 with Airplanes, Military categories.
Reliability Engineering
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Author : Alessandro Birolini
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-08-15
Reliability Engineering written by Alessandro Birolini and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-08-15 with Technology & Engineering categories.
This book shows how to build in, evaluate, and demonstrate reliability and availability of components, equipment, systems. It presents the state-of-the-art of reliability engineering, both in theory and practice, and is based on the author's more than 30 years experience in this field, half in industry and half as Professor of Reliability Engineering at the ETH, Zurich. The structure of the book allows rapid access to practical results. This final edition extend and replace all previous editions. New are, in particular, a strategy to mitigate incomplete coverage, a comprehensive introduction to human reliability with design guidelines and new models, and a refinement of reliability allocation, design guidelines for maintainability, and concepts related to regenerative stochastic processes. The set of problems for homework has been extended. Methods & tools are given in a way that they can be tailored to cover different reliability requirement levels and be used for safety analysis. Because of the Appendices A6 - A8, the book is also self contained from a mathematical point of view, and can be used as a text book or as a desktop reference, with a large number of tables (60), figures (190), and examples (210 of which 70 as problems for homework) to support the practical aspects.
Operators Manual
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Author :
language : en
Publisher:
Release Date : 1989
Operators Manual written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with Military helicopters categories.
Common System And Software Testing Pitfalls
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Author : Donald G. Firesmith
language : en
Publisher: Addison-Wesley Professional
Release Date : 2014-01-17
Common System And Software Testing Pitfalls written by Donald G. Firesmith and has been published by Addison-Wesley Professional this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-01-17 with Computers categories.
“Don’s book is a very good addition both to the testing literature and to the literature on quality assurance and software engineering... . [It] is likely to become a standard for test training as well as a good reference for professional testers and developers. I would also recommend this book as background material for negotiating outsourced software contracts. I often work as an expert witness in litigation for software with very poor quality, and this book might well reduce or eliminate these lawsuits....” –Capers Jones, VP and CTO, Namcook Analytics LLC Software and system testers repeatedly fall victim to the same pitfalls. Think of them as “anti-patterns”: mistakes that make testing far less effective and efficient than it ought to be. In Common System and Software Testing Pitfalls, Donald G. Firesmith catalogs 92 of these pitfalls. Drawing on his 35 years of software and system engineering experience, Firesmith shows testers and technical managers and other stakeholders how to avoid falling into these pitfalls, recognize when they have already fallen in, and escape while minimizing their negative consequences. Firesmith writes for testing professionals and other stakeholders involved in large or medium-sized projects. His anti-patterns and solutions address both “pure software” applications and “software-reliant systems,” encompassing heterogeneous subsystems, hardware, software, data, facilities, material, and personnel. For each pitfall, he identifies its applicability, characteristic symptoms, potential negative consequences and causes, and offers specific actionable recommendations for avoiding it or limiting its consequences. This guide will help you Pinpoint testing processes that need improvement–before, during, and after the project Improve shared understanding and collaboration among all project participants Develop, review, and optimize future project testing programs Make your test documentation far more useful Identify testing risks and appropriate risk-mitigation strategies Categorize testing problems for metrics collection, analysis, and reporting Train new testers, QA specialists, and other project stakeholders With 92 common testing pitfalls organized into 14 categories, this taxonomy of testing pitfalls should be relatively complete. However, in spite of its comprehensiveness, it is also quite likely that additional pitfalls and even missing categories of pitfalls will be identified over time as testers read this book and compare it to their personal experiences. As an enhancement to the print edition, the author has provided the following location on the web where readers can find major additions and modifications to this taxonomy of pitfalls: http://donald.firesmith.net/home/common-testing-pitfalls Please send any recommended changes and additions to dgf (at) sei (dot) cmu (dot) edu, and the author will consider them for publication both on the website and in future editions of this book.
Testing Commercial Off The Shelf Components And Systems
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Author : Sami Beydeda
language : en
Publisher: Springer Science & Business Media
Release Date : 2005-08-15
Testing Commercial Off The Shelf Components And Systems written by Sami Beydeda and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-08-15 with Computers categories.
Industrial development of software systems needs to be guided by recognized engineering principles. Commercial-off-the-shelf (COTS) components enable the systematic and cost-effective reuse of prefabricated tested parts, a characteristic approach of mature engineering disciplines. This reuse necessitates a thorough test of these components to make sure that each works as specified in a real context. Beydeda and Gruhn invited leading researchers in the area of component testing to contribute to this monograph, which covers all related aspects from testing components in a context-independent manner through testing components in the context of a specific system to testing complete systems built from different components. The authors take the viewpoints of both component developers and component users, and their contributions encompass functional requirements such as correctness and functionality compliance as well as non-functional requirements like performance and robustness. Overall this monograph offers researchers, graduate students and advanced professionals a unique and comprehensive overview of the state of the art in testing COTS components and COTS-based systems.
Databases And Information Systems V
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Author : Hele-Mai Haav
language : en
Publisher: IOS Press
Release Date : 2009
Databases And Information Systems V written by Hele-Mai Haav and has been published by IOS Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009 with Computers categories.
The Eighth International Baltic Conference on Databases and Information Systems took place on June 2–5 2008 in Tallinn, Estonia. This conference is continuing a series of successful bi-annual Baltic conferences on databases and information systems (IS). The aim is to provide a wide international forum for academics and practitioners in the field of databases and modern information systems for exchanging their achievements in this area. The original research results presented in Databases and Information Systems V mostly belong to novel fields of IS and database research such as database technology and the semantic web, ontology-based IS, IS and AI technologies and IS integration. The contribution of Dr. Jari PalomÄki showed how different ontological commitments affect the way we are modeling the world when creating an information system. As semantic technologies have been gaining more attention recently, a special session on semantic interoperability of IS was organized. The invited talks from each Baltic State gave a good insight how semantic interoperability initiatives are developing in each of the Baltic States and how they relate to the European semantic interoperability framework.
Testing Software And Systems
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Author : Alexandre Petrenko
language : en
Publisher: Springer
Release Date : 2010-10-25
Testing Software And Systems written by Alexandre Petrenko and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-10-25 with Computers categories.
Annotation. This book constitutes the refereed proceedings of the 22nd IFIP WG 6.1 International Conference on Testing Software and Systems, ICTSS 2010, held in Natal, Brazil, in November 2010. ICTSS 2010 is the merger of the 22nd IFIP International Conference on Testing of Communicating Systems (TESTCOM) and the 10th International Workshop on Formal Approaches to Testing of Software (FATES). The 16 revised full papers presented together with 2 invited presentations were carefully selected from 60 submissions. The papers cover a wide range of topics in the field of testing of general software and systems such as test automation, integration testing, test case selection, search based testing, combinatorial testing, inductive testing, test architectures for large-scale systems, and end-to-end performance testing.