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Chaos And Stability In Defect Processes In Semiconductors

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Chaos And Stability In Defect Processes In Semiconductors

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Author : I.V. Verner
language : en
Publisher: Trans Tech Publications Ltd
Release Date : 1992-01-01

Chaos And Stability In Defect Processes In Semiconductors written by I.V. Verner and has been published by Trans Tech Publications Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992-01-01 with Technology & Engineering categories.

The book introduces a new scientific ideology for known phenomena, and the authors show how some results of radiation physics of semiconductors, for example processes of disordering and amorphization, can be considered from a synergetics point of view, and how one can apply these concepts and mathematical tools to derive completely new insights.

Chaos And Stability In Defect Processes In Semiconductors

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Author : Igor V. Verner
language : en
Publisher:
Release Date : 1993

Chaos And Stability In Defect Processes In Semiconductors written by Igor V. Verner and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1993 with Science categories.

Chaos And Stability In Defect Processes In Semiconductors

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Author :
language : en
Publisher:
Release Date : 1992

Chaos And Stability In Defect Processes In Semiconductors written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with categories.

Proceedings Of The 17th International Conference On Defects In Semiconductors

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Author : Helmut Heinrich
language : en
Publisher:
Release Date : 1994

Proceedings Of The 17th International Conference On Defects In Semiconductors written by Helmut Heinrich and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Semiconductors categories.

Diffusion And Defect Data

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Author :
language : en
Publisher:
Release Date : 1999

Diffusion And Defect Data written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with Crystals categories.

Proceedings Of The 18th International Conference On Defects In Semiconductors

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Author : Masashi Suezawa
language : en
Publisher:
Release Date : 1995

Proceedings Of The 18th International Conference On Defects In Semiconductors written by Masashi Suezawa and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Semiconductors categories.

Copper Fundamental Mechanisms For Microelectronic Applications

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Author : Shyam P. Murarka
language : en
Publisher: Wiley-Interscience
Release Date : 2000-04-06

Copper Fundamental Mechanisms For Microelectronic Applications written by Shyam P. Murarka and has been published by Wiley-Interscience this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000-04-06 with Science categories.

A complete guide to the state of the art and future direction of copper interconnect technology Owing to its performance advantages, copper metallization for IC interconnect is attracting tremendous interest in the semiconductor community worldwide. This timely book provides scientists and engineers with a much-needed, comprehensive reference on the fundamentals and applications of this emerging technology. The authors draw on more than a decade of intimate involvement with copper interconnect research, integrating the vast amounts of available knowledge and making clear the connection between mechanistic principles and relevant technologies. In-depth, cutting-edge discussions include: * The effects of copper in semiconductor materials, especially silicon * The fundamental chemistry and electro-chemistry of copper * The effects of copper on insulating materials such as glass and polymers * Intermetallic and interfacial reactions of copper in layered structures * Current and projected applications of copper in integrated circuits Copper-Fundamental Mechanisms for Microelectronic Applications also features extensive references, tables, and over 100 illustrations-including dual Damascene patterning necessary for copper interconnects. It is an excellent resource for anyone seeking to explore the current literature and gain insight into opportunities opening in the field.