Characterization In Compound Semiconductor Processing
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Characterization In Compound Semiconductor Processing
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Author : Yale Strausser
language : en
Publisher: Butterworth-Heinemann
Release Date : 1995
Characterization In Compound Semiconductor Processing written by Yale Strausser and has been published by Butterworth-Heinemann this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Technology & Engineering categories.
The book will have two major sections, one on Si based systems and the other on compound semiconductor systems. Although there are many materials common to both technologies, the applications, processing, and problems seen, are different enough to warrant this separation. In the silicon section there will be a chapter on semiconducting layers, such as epi SI, SOI layers, Si Ge films, etc., discussing the techniques used in problem-solving in these films. In the area of conducting films there will be chapters of doped poly Si, silicides and polycides, Al- and/or Cu-cased films, W-based films and one on barrier materials. Each of these systems is sufficiently different to benefit from a different author and a separate discussion of the types of problems encountered. This section will then be completed by a chapter or dielectric films. Even though there are a number of different applications for dielectrics, i.e. passivation films, intermetal dielectrics, gate oxides, field oxides, ad
Encyclopedia Of Materials Characterization
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Author : Charles A. Evans
language : en
Publisher: Gulf Professional Publishing
Release Date : 1992
Encyclopedia Of Materials Characterization written by Charles A. Evans and has been published by Gulf Professional Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with Science categories.
"This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the series."--Knovel.
Compound Semiconductor Bulk Materials And Characterizations
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Author : Osamu Oda
language : en
Publisher: World Scientific
Release Date : 2007
Compound Semiconductor Bulk Materials And Characterizations written by Osamu Oda and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007 with Science categories.
This book is concerned with compound semiconductor bulk materials and has been written for students, researchers and engineers in material science and device fabrication. It offers them the elementary and intermediate knowledge of compound semiconductor bulk materials necessary for entering this field. In the first part, the book describes the physical properties, crystal growth technologies, principles of crystal growth, various defects in crystals, characterization techniques and applications. In the second and the third parts, the book reviews various compound semiconductor materials, including important industrial materials and the results of recent research.
Semiconductor Material And Device Characterization
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Author : Dieter K. Schroder
language : en
Publisher: John Wiley & Sons
Release Date : 2015-06-29
Semiconductor Material And Device Characterization written by Dieter K. Schroder and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-06-29 with Technology & Engineering categories.
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Compound Semiconductor Radiation Detectors
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Author : Alan Owens
language : en
Publisher: Taylor & Francis
Release Date : 2016-04-19
Compound Semiconductor Radiation Detectors written by Alan Owens and has been published by Taylor & Francis this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-04-19 with Science categories.
For many applications, compound semiconductors are now viable competitors to elemental semiconductors because of their wide range of physical properties. This book describes all aspects of radiation detection and measurement using compound semiconductors, including crystal growth, detector fabrication, contacting, and spectroscopic performance (with particular emphasis on the X- and gamma-ray regimes). A concentrated reference for researchers in various disciplines as well as graduate students in specialized courses, the text outlines the potential and limitations of semiconductor detectors.
Process Technology For Semiconductor Lasers
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Author : Kenichi Iga
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-07
Process Technology For Semiconductor Lasers written by Kenichi Iga and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-07 with Science categories.
Process Technology for Semiconductor Lasers describes the design principles of semiconductor lasers, mainly from the fabrication point of view. A review is given of the history of semiconductor-laser development and applications and of the materials used in lasing at short to long wavelengths. The basic design principles for semiconductor-laser devices and the epitaxy for laser production are discussed. An entire chapter is devoted to the technology of liquid-phase epitaxy, and another one to vapor-phase and beam epitaxies. The characterizations of laser materials and the fabrication and characteristics of semiconductor lasers are treated. Mode-control techniques are presented, and surface-emitting lasers are introduced in the final chapter.
Semiconductor Materials Analysis And Fabrication Process Control
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Author : G.M. Crean
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Semiconductor Materials Analysis And Fabrication Process Control written by G.M. Crean and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Science categories.
There is a growing awareness that the successful implementation of novel material systems and technology steps in the fabrication of microelectronic and optoelectronic devices, is critically dependent on the understanding and control of the materials, the process steps and their interactions. The contributions in this volume demonstrate that characterisation and analysis techniques are an essential support mechanism for research in these fields. Current major research themes are reviewed both in the development and application of diagnostic techniques for advanced materials analysis and fabrication process control. Two distinct trends are elucidated: the emergence and evaluation of sophisticated in situ optical diagnostic techniques such as photoreflectance and spectroellipsometry and the industrial application of ultra-high sensitivity chemical analysis techniques for contamination monitoring. The volume will serve as a useful and timely overview of this increasingly important field.
Materials And Process Characterization
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Author : Norman G. Einspruch
language : en
Publisher: Academic Press
Release Date : 2014-12-01
Materials And Process Characterization written by Norman G. Einspruch and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-12-01 with Technology & Engineering categories.
VLSI Electronics: Microstructure Science, Volume 6: Materials and Process Characterization addresses the problem of how to apply a broad range of sophisticated materials characterization tools to materials and processes used for development and production of very large scale integration (VLSI) electronics. This book discusses the various characterization techniques, such as Auger spectroscopy, secondary ion mass spectroscopy, X-ray topography, transmission electron microscopy, and spreading resistance. The systematic approach to the technologies of VLSI electronic materials and device manufacture are also considered. This volume is beneficial to materials scientists, chemists, and engineers who are commissioned with the responsibility of developing and implementing the production of materials and devices to support the VLSI era.
Fundamentals Of Solid State Engineering
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Author : Manijeh Razeghi
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-06-12
Fundamentals Of Solid State Engineering written by Manijeh Razeghi and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-06-12 with Technology & Engineering categories.
Fundamentals of Solid State Engineering, 2nd Edition, provides a multi-disciplinary introduction to Solid State Engineering, combining concepts from physics, chemistry, electrical engineering, materials science and mechanical engineering. Basic physics concepts are introduced, followed by a thorough treatment of the technology for solid state engineering. Topics include compound semiconductor bulk and epitaxial thin films growth techniques, current semiconductor device processing and nano-fabrication technologies. Examples of semiconductor devices and a description of their theory of operation are then discussed, including transistors, semiconductor lasers and photodetectors. Revised throughout, this second edition includes new chapters on the reciprocal lattice, optical properties of semiconductors, semiconductor heterostructures, semiconductor characterization techniques, and an introduction to lasers. Additions and improvements have been made to the material on photodetectors and quantum mechanics as well as to the problem sections.
Advanced Processing And Characterization Of Semiconductors Iii
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Author : Devendra K. Sadana
language : en
Publisher:
Release Date : 1986
Advanced Processing And Characterization Of Semiconductors Iii written by Devendra K. Sadana and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986 with Technology & Engineering categories.