Characterization Of Microstructures By Analytical Electron Microscopy Aem
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Characterization Of Microstructures By Analytical Electron Microscopy Aem
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Author : Yonghua Rong
language : en
Publisher: Springer
Release Date : 2012-04-28
Characterization Of Microstructures By Analytical Electron Microscopy Aem written by Yonghua Rong and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-04-28 with Technology & Engineering categories.
"Characterization of Microstructures by Analytical Electron Microscopy (AEM)" describes the basic concepts and operative techniques of AEM. It focuses on the study of phase transformations and dislocation in deformation by AEM. Further, the book also presents the physical concepts and mathematic analysis for diffraction and crystallography using numerous examples, such as the quantitative prediction of the orientation relationships in phase transformations. The book is intended for researchers and graduate students in materials science and engineering, and condensed matter physics. Yonghua Rong is a professor at School of Materials Science and Engineering, Shanghai Jiao Tong University, China.
Introduction To Analytical Electron Microscopy
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Author : John Hren
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-11
Introduction To Analytical Electron Microscopy written by John Hren and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-11 with Technology & Engineering categories.
The birth of analytical electron microscopy (AEM) is somewhat obscure. Was it the recognition of the power and the development of STEM that signaled its birth? Was AEM born with the attachment of a crystal spectrometer to an otherwise conventional TEM? Or was it born earlier with the first analysis of electron loss spectra? It's not likely that any of these developments alone would have been sufficient and there have been many others (microdiffraction, EDS, microbeam fabrication, etc.) that could equally lay claim to being critical to the establishment of true AEM. It is probably more accurate to simply ascribe the present rapid development to the obvious: a combination of ideas whose time has come. Perhaps it is difficult to trace the birth of AEM simply because it remains a point of contention to even define its true scope. For example, the topics in this book, even though very broad, are still far from a complete description of what many call AEM. When electron beams interact with a solid it is well-known that a bewildering number of possible interactions follow. Analytical electron microscopy attempts to take full qualitative and quantitative advantage of as many of these interactions as possible while still preserving the capability of high resolution imaging. Although we restrict ourselves here to electron transparent films, much of what is described applies to thick specimens as well. Not surprisingly, signals from all possible interactions cannot yet (and probably never will) be attained simultaneously under optimum conditions.
Analytical Electron Microscopy For Materials Science
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Author : DAISUKE Shindo
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-04-17
Analytical Electron Microscopy For Materials Science written by DAISUKE Shindo and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Science categories.
Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.
Scanning Electron Microscopy X Ray Microanalysis And Analytical Electron Microscopy
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Author : Charles E. Lyman
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Scanning Electron Microscopy X Ray Microanalysis And Analytical Electron Microscopy written by Charles E. Lyman and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. The present workbook provides a series of fundamental experiments to aid in "hands-on" learning of the use of the instrumentation and the techniques. It is written by a group of eminently qualified scientists and educators. The importance of hands-on learning cannot be overemphasized.
Principles Of Analytical Electron Microscopy
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Author : David C. Joy
language : en
Publisher: Springer Science & Business Media
Release Date : 1986-07-31
Principles Of Analytical Electron Microscopy written by David C. Joy and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986-07-31 with Science categories.
Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.
Field Emission Scanning Electron Microscopy
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Author : Nicolas Brodusch
language : en
Publisher: Springer
Release Date : 2017-09-25
Field Emission Scanning Electron Microscopy written by Nicolas Brodusch and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-09-25 with Technology & Engineering categories.
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Electron Microscopy And Analysis
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Author : Peter J. Goodhew
language : en
Publisher: CRC Press
Release Date : 2000-11-30
Electron Microscopy And Analysis written by Peter J. Goodhew and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000-11-30 with Technology & Engineering categories.
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors h
Practical Analytical Electron Microscopy In Materials Science
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Author : David Bernard Williams
language : en
Publisher: Electron Optics Publishing Group
Release Date : 1984
Practical Analytical Electron Microscopy In Materials Science written by David Bernard Williams and has been published by Electron Optics Publishing Group this book supported file pdf, txt, epub, kindle and other format this book has been release on 1984 with Science categories.
Electron Microscopy And Analysis
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Author : Peter J. Goodhew
language : en
Publisher: CRC Press
Release Date : 1988-04-25
Electron Microscopy And Analysis written by Peter J. Goodhew and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1988-04-25 with Science categories.
A comprehensive introductory text, extensively revised and updated to cover the physical basis and operation of the common types of electron microscope with illustrations of their applications. In addition, electron microscopy is compared with other modern techniques for examining both crystalline and non-crystalline materials.
Combined Electron Microscope Electron Diffraction And Electron Microprobe Analysis Of Identical Microstructures In The Debond Area Of A Dissimilar Metal Joint
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Author : L. G. Bostwick
language : en
Publisher:
Release Date : 1971
Combined Electron Microscope Electron Diffraction And Electron Microprobe Analysis Of Identical Microstructures In The Debond Area Of A Dissimilar Metal Joint written by L. G. Bostwick and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1971 with Electron microscopes categories.