Coherent Electron Microscopy Designing Faster And Brighter Electron Sources
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Coherent Electron Microscopy Designing Faster And Brighter Electron Sources
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Author : Peter W. Hawkes
language : en
Publisher: Elsevier
Release Date : 2023-08-17
Coherent Electron Microscopy Designing Faster And Brighter Electron Sources written by Peter W. Hawkes and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-08-17 with Technology & Engineering categories.
Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. - Provides the authority and expertise of leading contributors from an international board of authors - Presents the latest release in the Advances in Imaging and Electron Physics series
Electron Microscopy
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Author : Masashi Arita
language : en
Publisher: BoD – Books on Demand
Release Date : 2019-10-02
Electron Microscopy written by Masashi Arita and has been published by BoD – Books on Demand this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-10-02 with Science categories.
TEM and SEM have contributed greatly to the progress of various research fields, which has been accelerated in the last few decades by highly functional electron microscopes and microscopy. In this tide of microscopy, various microscopic methods have been developed to make clear many unsolved problems, e.g. pulse beam TEM, environmental microscopy, correlative microscopy, etc. In this book, a number of reviews have been collected concerning these subjects. We think that the content in each chapter is impressive, and we hope this book will contribute to future advances in electron microscopy, materials science, and biomedicine.
Energy And Water Development Appropriations For 2010 Dept Of Energy Fiscal Year 2010 Justifications
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Author : United States. Congress. House. Committee on Appropriations. Subcommittee on Energy and Water Development
language : en
Publisher:
Release Date : 2009
Energy And Water Development Appropriations For 2010 Dept Of Energy Fiscal Year 2010 Justifications written by United States. Congress. House. Committee on Appropriations. Subcommittee on Energy and Water Development and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009 with Federal aid to energy development categories.
Scientific And Technical Aerospace Reports
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Author :
language : en
Publisher:
Release Date : 1995
Scientific And Technical Aerospace Reports written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Aeronautics categories.
Advances In Imaging And Electron Physics
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Author :
language : en
Publisher: Academic Press
Release Date : 2015-08-21
Advances In Imaging And Electron Physics written by and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-08-21 with Science categories.
Advances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contains contributions from leading authorities on the subject matter - Informs and updates on all the latest developments in the field of imaging and electron physics - Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource - Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science. and digital image processing
Transmission Electron Microscopy
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Author : David Bernard Williams
language : en
Publisher: Taylor & Francis US
Release Date : 1996
Transmission Electron Microscopy written by David Bernard Williams and has been published by Taylor & Francis US this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996 with Science categories.
This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.
Transmission Electron Microscopy Techniques
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Author : Kaushal Dhawan
language : en
Publisher: Educohack Press
Release Date : 2025-02-20
Transmission Electron Microscopy Techniques written by Kaushal Dhawan and has been published by Educohack Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-02-20 with Technology & Engineering categories.
"Transmission Electron Microscopy Techniques" is a comprehensive guide that explores the use of transmission electron microscopes (TEM) to study materials at the atomic level. TEMs use electrons instead of light to magnify objects, achieving resolutions millions of times greater than light microscopes. We cover all aspects of TEM, from the basic principles of how it works to the latest advancements in the field. This book includes practical information on using a TEM and troubleshooting potential issues. Complex concepts are explained clearly and simply, making them accessible to those new to TEM. The book features many diagrams, micrographs, and schematics to help visualize the discussed concepts. We explore how TEM is used in various fields, such as materials science, biology, and nanotechnology, and discuss the latest advancements in TEM technology, including aberration-corrected microscopy and cryo-TEM. Practical guidance is provided on using a TEM and troubleshooting common problems. "Transmission Electron Microscopy Techniques" is a valuable resource for students, researchers, and professionals interested in TEM and its applications.
Surface Microscopy With Low Energy Electrons
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Author : Ernst Bauer
language : en
Publisher: Springer
Release Date : 2014-07-10
Surface Microscopy With Low Energy Electrons written by Ernst Bauer and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-07-10 with Technology & Engineering categories.
This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.
Electron Energy Loss Spectroscopy In The Electron Microscope
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Author : R.F. Egerton
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09
Electron Energy Loss Spectroscopy In The Electron Microscope written by R.F. Egerton and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Science categories.
to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units.
Transmission Electron Microscopy
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Author : C. Barry Carter
language : en
Publisher: Springer
Release Date : 2016-08-24
Transmission Electron Microscopy written by C. Barry Carter and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-08-24 with Technology & Engineering categories.
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.