Colloquium On Algorithmic And Knowledge Based Cad For Vlsi
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Algorithmic And Knowledge Based Cad For Vlsi
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Author : Gaynor E. Taylor
language : en
Publisher: IET
Release Date : 1992
Algorithmic And Knowledge Based Cad For Vlsi written by Gaynor E. Taylor and has been published by IET this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with Computers categories.
Samples the present state-of-the-art in CAD for VLSI, covering both newly developed algorithms and applications of techniques from the artificial intelligence community. The material is based on a tutorial course run in conjunction with the 1991 European Conference on Circuit Theory and Design, and should interest engineers involved in the design and testing of integrated circuits and systems. Annotation copyrighted by Book News, Inc., Portland, OR
Colloquium On Algorithmic And Knowledge Based Cad For Vlsi
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Author :
language : en
Publisher:
Release Date : 1989
Colloquium On Algorithmic And Knowledge Based Cad For Vlsi written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with categories.
Iee Colloquium On Algorithmic And Knowledge Based Cad For Vlsi
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Author :
language : en
Publisher:
Release Date : 1989
Iee Colloquium On Algorithmic And Knowledge Based Cad For Vlsi written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with categories.
Algorithmic And Knowledge Based Cad For Vlsi
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Author : Institution of Electrical Engineers. Electronics Division. Professional Group E10 (Circuit Theory and Design)
language : en
Publisher:
Release Date : 1989
Algorithmic And Knowledge Based Cad For Vlsi written by Institution of Electrical Engineers. Electronics Division. Professional Group E10 (Circuit Theory and Design) and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with categories.
Algorithmic And Knowledge Based Cad For Vlsi Iee Colloquium On
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Author : Institute of Electrical and Electronics Engineers
language : en
Publisher:
Release Date : 1989
Algorithmic And Knowledge Based Cad For Vlsi Iee Colloquium On written by Institute of Electrical and Electronics Engineers and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with categories.
Colloquium On Algorithmic And Knowledge Based Cad For Vlsi
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Author : IEE Electronics Division
language : en
Publisher:
Release Date : 1989
Colloquium On Algorithmic And Knowledge Based Cad For Vlsi written by IEE Electronics Division and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with categories.
Index Of Conference Proceedings
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Author :
language : en
Publisher:
Release Date : 1991
Index Of Conference Proceedings written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with Conference proceedings categories.
Testability Concepts For Digital Ics
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Author : F.P.M. Beenker
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Testability Concepts For Digital Ics written by F.P.M. Beenker and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styles. Thirdly, knowledge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on. All four items have to be treated, managed, and to a great extent integrated before the term 'IC quality' gets a certain meaning and a test a certain measurable value. The contents of this book reflects our activities on testability concepts for complex digital ICs as performed at Philips Research Laboratories in Eindhoven, The Netherlands. Based on the statements above, we have worked along a long term plan, which was based on four pillars. 1. The definition of a test methodology suitable for 'future' IC design styles, 2. capable of handling improved defect models, 3. supported by software tools, and 4. providing an easy link to Automatic Test Equipment. The reasoning we have followed was continuously focused on IC qUality. Quality expressed in terms of the ability of delivering a customer a device with no residual manufacturing defects. Bad devices should not escape a test. The basis of IC quality is a thorough understanding of defects and defect models.
National Radio Science Conference
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Author :
language : en
Publisher:
Release Date : 1996
National Radio Science Conference written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996 with Mobile communication systems categories.
13th National Radio Science Conference
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Author :
language : en
Publisher:
Release Date : 1996
13th National Radio Science Conference written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996 with Electromagnetic waves categories.