Current Comparator Design For Iddq Testing In Vlsi Circuits

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Current Comparator Design For Iddq Testing In Vlsi Circuits

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Author : Umesh Mehta
language : en
Publisher:
Release Date : 1996

Current Comparator Design For Iddq Testing In Vlsi Circuits written by Umesh Mehta and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996 with Iddq testing categories.

Iddq Testing Of Vlsi Circuits

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Author : Ravi K. Gulati
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Iddq Testing Of Vlsi Circuits written by Ravi K. Gulati and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Computers categories.

Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice.

Introduction To Iddq Testing

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Author : S. Chakravarty
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Introduction To Iddq Testing written by S. Chakravarty and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.

Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.

Iddq Testing Of Vlsi Circuits

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Author : Chuck Hawkins
language : en
Publisher:
Release Date : 1995

Iddq Testing Of Vlsi Circuits written by Chuck Hawkins and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with categories.

Iddq 96

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Author : Carol Tong
language : en
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
Release Date : 1996

Iddq 96 written by Carol Tong and has been published by Institute of Electrical & Electronics Engineers(IEEE) this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996 with Computers categories.

Annotation Papers from the October 1996 workshop concentrate on areas such as IDDQ's effectiveness with emerging submicron and other technologies, testing and testability, limit setting and testing, current sensors, test generation and testing, and future trends. Subjects include automatic test pattern generation for IDDQ faults based on symbolic simulation, SHOVE testing, testability of flip-flop structures, and realistic defect coverages of voltage and current tests. No index. Annotation copyrighted by Book News, Inc., Portland, OR.

A Behavioral Model Of A Built In Current Sensor For Iddq Testing

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Author : Ammar Gharaibeh
language : en
Publisher:
Release Date : 2010

A Behavioral Model Of A Built In Current Sensor For Iddq Testing written by Ammar Gharaibeh and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with categories.

IDDQ testing is one of the most effective methods for detecting defects in integrated circuits. Higher leakage currents in more advanced semiconductor technologies have reduced the resolution of IDDQ test. One solution is to use built-in current sensors. Several sensor techniques for measuring the current based on the magnetic field or voltage drop across the supply line have been proposed. In this work, we develop a behavioral model for a built-in current sensor measuring voltage drop and use this model to better understand sensor operation, identify the effect of different parameters on sensor resolution, and suggest design modifications to improve future sensor performance.

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Author :
language : en
Publisher:
Release Date : 1694

written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1694 with categories.

Iddq Testing For Cmos Vlsi

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Author : Rochit Rajsuman
language : en
Publisher: Artech House Publishers
Release Date : 1995

Iddq Testing For Cmos Vlsi written by Rochit Rajsuman and has been published by Artech House Publishers this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Technology & Engineering categories.

This book discusses in detail the correlation between physical defects and logic faults, and shows you how Iddq testing locates these defects. The book provides planning guidelines and optimization methods and is illustrated with numerous examples ranging from simple circuits to extensive case studies.

Ieee Vlsi Test Symposium

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Author :
language : en
Publisher:
Release Date : 2004

Ieee Vlsi Test Symposium written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004 with Application-specific integrated circuits categories.

On Line Testing For Vlsi

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Author : Michael Nicolaidis
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09

On Line Testing For Vlsi written by Michael Nicolaidis and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Technology & Engineering categories.

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.