Defect Recognition And Image Processing In Semiconductors 1997

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Defect Recognition And Image Processing In Semiconductors 1997

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Author : J. Doneker
language : en
Publisher: Routledge
Release Date : 2017-11-22

Defect Recognition And Image Processing In Semiconductors 1997 written by J. Doneker and has been published by Routledge this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-11-22 with Science categories.

Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.

Defect Recognition And Image Processing In Semiconductors 1997

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Author : J. Doneker
language : en
Publisher: CRC Press
Release Date : 1998-01-01

Defect Recognition And Image Processing In Semiconductors 1997 written by J. Doneker and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-01-01 with Science categories.

Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.

Defect Recognition And Image Processing In Semiconductors 1997

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Author : J. Donecker
language : en
Publisher:
Release Date : 1998

Defect Recognition And Image Processing In Semiconductors 1997 written by J. Donecker and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998 with TECHNOLOGY & ENGINEERING categories.

"Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide."--Provided by publisher.

Defect Recognition And Image Processing In Semiconductors And Devices

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Author : Juan Jimenez
language : en
Publisher:
Release Date : 1994

Defect Recognition And Image Processing In Semiconductors And Devices written by Juan Jimenez and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Image processing categories.

Defect Recognition And Image Processing In Iii V Compounds

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Author : J. P. Fillard
language : en
Publisher: Elsevier Publishing Company
Release Date : 1985

Defect Recognition And Image Processing In Iii V Compounds written by J. P. Fillard and has been published by Elsevier Publishing Company this book supported file pdf, txt, epub, kindle and other format this book has been release on 1985 with Gallium categories.

Defect Recognition And Image Processing In Iii V Compounds Ii

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Author : Eicke R. Weber
language : en
Publisher: Elsevier Publishing Company
Release Date : 1987

Defect Recognition And Image Processing In Iii V Compounds Ii written by Eicke R. Weber and has been published by Elsevier Publishing Company this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987 with Gallium arsenide categories.

Metal Halide Perovskites For Generation Manipulation And Detection Of Light

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Author : Juan P. Martínez-Pastor
language : en
Publisher: Elsevier
Release Date : 2023-07-20

Metal Halide Perovskites For Generation Manipulation And Detection Of Light written by Juan P. Martínez-Pastor and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-07-20 with Technology & Engineering categories.

Metal Halide Perovskites for Generation, Manipulation and Detection of Light covers the current state and future prospects of lead halide perovskite photonics and photon sources, both from an academic and industrial point-of-view. Advances in metal halide perovskite photon sources (lasers) based on thin films, microcrystals and nanocrystals are comprehensively reviewed, with leading experts contributing current advances in theory, fundamental concepts, fabrication techniques, experiments and other important research innovations. This book is suitable for graduate students, researchers, scientists and engineers in academia and R&D in industry working in the disciplines of materials science and engineering. Includes comprehensive reviews from academic and industrial perspectives of current trends in the field of metal halide perovskite for photonics Provides an up-to-date look at the most recent and upcoming applications in metal halide perovskite photonics, such as; photodetectors, lighting, lasing, nonlinear photonics and quantum technologies Discusses future prospective trends and envisioned applications of metal halide perovskites, from near-UV to near-IR photonics

Defect Recognition And Image Processing In Iii V Compounds

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Author : J. P. Fillard
language : en
Publisher:
Release Date : 1985

Defect Recognition And Image Processing In Iii V Compounds written by J. P. Fillard and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1985 with Gallium categories.

Defect Recognition And Image Processing In Iii V Compounds

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Author : International Symposium on Defect Recognition and Image Processing in III-V Compounds
language : en
Publisher:
Release Date : 1985

Defect Recognition And Image Processing In Iii V Compounds written by International Symposium on Defect Recognition and Image Processing in III-V Compounds and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1985 with categories.

Defect Recognition And Image Processing In Iii V Compounds Iii

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Author : Tomoya Ogawa
language : en
Publisher:
Release Date : 1990

Defect Recognition And Image Processing In Iii V Compounds Iii written by Tomoya Ogawa and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990 with Gallium arsenide categories.