Defect Recognition And Image Processing In Semiconductors And Devices

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Defect Recognition And Image Processing In Semiconductors 1997

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Author : J. Doneker
language : en
Publisher: Routledge
Release Date : 2017-11-22

Defect Recognition And Image Processing In Semiconductors 1997 written by J. Doneker and has been published by Routledge this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-11-22 with Science categories.

Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.

Defect Recognition And Image Processing In Semiconductors And Devices Proceedings Of The 5th Int Conference 6 10 September 1993 Santander Spain

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Author : Juan Jiménez
language : en
Publisher: CRC Press
Release Date : 1994-05-26

Defect Recognition And Image Processing In Semiconductors And Devices Proceedings Of The 5th Int Conference 6 10 September 1993 Santander Spain written by Juan Jiménez and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994-05-26 with Art categories.

The fifth in this series of conferences was held in Santander, Spain from 6 to 10 September 1993, and was attended by workers from industry and research institutes worldwide. Device yield is a crucial factor for determining the choice of semiconducting material made by manufacturers, and that choice is based upon a knowledge of how defects might affect a particular substrate, epilayer or base material. The DRIP conference series was instigated to address the mapping of these technologically important defects. Topics covered at the meeting included silicon, and compound semiconductor substrates and epilayers. Methods for defect recognition included tunelling microscopy, inelastic light scattering (Raman), elastic light scattering, photoluminescence mapping, defect characterization, optical probe beams, and effects of defects on devices. The meeting focused in particular on the microscopic nature of as-grown defects: their distribution as a function of growth conditions, and their redistribution under subsequent heat treatments. The conference dealt with the increasing number and sophistication of visualization techniques which map physical properties of defects, and which may in future permit better control of defect engineering. Researchers in solid state or device physics, or electrical engineering will find this volume an invaluable, up to date reference on the latest techniques for the identification of defects, developments in their control, implications for device fabrication, and future directions for the analysis and mapping of semiconductors.

Defect Recognition And Image Processing In Semiconductors 1997

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Author : J. Doneker
language : en
Publisher: CRC Press
Release Date : 1998-01-01

Defect Recognition And Image Processing In Semiconductors 1997 written by J. Doneker and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-01-01 with Science categories.

Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.

Defect Recognition And Image Processing In Semiconductors 1997

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Author : J. Donecker
language : en
Publisher:
Release Date : 1998

Defect Recognition And Image Processing In Semiconductors 1997 written by J. Donecker and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998 with TECHNOLOGY & ENGINEERING categories.

"Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide."--Provided by publisher.

Defect Recognition And Image Processing In Semiconductors And Devices

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Author : Juan Jimenez
language : en
Publisher:
Release Date : 1994

Defect Recognition And Image Processing In Semiconductors And Devices written by Juan Jimenez and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Image processing categories.

Defect Recognition And Image Processing In Semiconductors 1995

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Author : A.R Mickelson
language : en
Publisher: CRC Press
Release Date : 1996-05-30

Defect Recognition And Image Processing In Semiconductors 1995 written by A.R Mickelson and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996-05-30 with Science categories.

These proceedings provide an overview of research into defect inhomogeneities semiconductor materials and (as grown) devices. Defect inhomogeneities affect the performance of both as grown and processed semiconductors. A valuable overview of mapping and microscopy techniques for the study of such defects and an insight into the effect of such defects on device performance.

Drip 5

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Author :
language : en
Publisher:
Release Date : 1993

Drip 5 written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1993 with categories.

Defect Recognition And Image Processing In Iii V Compounds

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Author : J. P. Fillard
language : en
Publisher: Elsevier Publishing Company
Release Date : 1985

Defect Recognition And Image Processing In Iii V Compounds written by J. P. Fillard and has been published by Elsevier Publishing Company this book supported file pdf, txt, epub, kindle and other format this book has been release on 1985 with Gallium categories.

Defect Recognition And Image Processing In Iii V Compounds Ii

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Author : Eicke R. Weber
language : en
Publisher: Elsevier Publishing Company
Release Date : 1987

Defect Recognition And Image Processing In Iii V Compounds Ii written by Eicke R. Weber and has been published by Elsevier Publishing Company this book supported file pdf, txt, epub, kindle and other format this book has been release on 1987 with Gallium arsenide categories.

Defect Recognition And Image Processing In Iii V Compounds

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Author : International Symposium on Defect Recognition and Image Processing in III-V Compounds
language : en
Publisher:
Release Date : 1985

Defect Recognition And Image Processing In Iii V Compounds written by International Symposium on Defect Recognition and Image Processing in III-V Compounds and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1985 with categories.