Design For Testability Debug And Reliability

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Design For Testability Debug And Reliability

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Author : Sebastian Huhn
language : en
Publisher: Springer Nature
Release Date : 2021-04-19

Design For Testability Debug And Reliability written by Sebastian Huhn and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-04-19 with Technology & Engineering categories.

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.

Design For Testability Debug And Reliability

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Author : Sebastian Huhn
language : en
Publisher:
Release Date : 2021

Design For Testability Debug And Reliability written by Sebastian Huhn and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021 with categories.

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces. Provides readers with a combination of a comprehensive set of formal techniques covering and enhancing different aspects of the state-of-the-art design and test flow for ICs; Introduces newly developed heuristic, formal optimization-based and partition-based retargeting techniques and integrates them into a common framework; Describes fully compliant (with respect to industrial de-facto standard) measures to enhance the DFT, DFD and DFR capabilities while supporting standardized data exchange formats; Includes new measures to tackle shortcomings of existing state-of-the-art methods, including zero-defect enforcing safety-critical applications.

Next Generation Design For Testability Debug And Reliability Using Formal Techniques

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Author : Sebastian Michael Huhn
language : en
Publisher:
Release Date : 2020

Next Generation Design For Testability Debug And Reliability Using Formal Techniques written by Sebastian Michael Huhn and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020 with categories.

System On Chip Test Architectures

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Author : Laung-Terng Wang
language : en
Publisher: Morgan Kaufmann
Release Date : 2010-07-28

System On Chip Test Architectures written by Laung-Terng Wang and has been published by Morgan Kaufmann this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-07-28 with Technology & Engineering categories.

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.

Fundamentals Of Design Of Experiments For Automotive Engineering Volume I

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Author : Young J. Chiang
language : en
Publisher: SAE International
Release Date : 2023-11-28

Fundamentals Of Design Of Experiments For Automotive Engineering Volume I written by Young J. Chiang and has been published by SAE International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-11-28 with Computers categories.

In a world where innovation and sustainability are paramount, Fundamentals of Design of Experiments for Automotive Engineering: Volume I serves as a definitive guide to harnessing the power of statistical thinking in product development. As first of four volumes in SAE International’s DOE for Product Reliability Growth series, this book presents a practical, application-focused approach by emphasizing DOE as a dynamic tool for automotive engineers. It showcases real-world examples, demonstrating how process improvements and system optimizations can significantly enhance product reliability. The author, Yung Chiang, leverages extensive product development expertise to present a comprehensive process that ensures product performance and reliability throughout its entire lifecycle. Whether individuals are involved in research, design, testing, manufacturing, or marketing, this essential reference equips them with the skills needed to excel in their respective roles. This book explores the potential of Reliability and Sustainability with DOE, featuring the following topics: - Fundamental prerequisites for deploying DOE: Product reliability processes, measurement uncertainty, failure analysis, and design for reliability. - Full factorial design 2K: A system identification tool for relating objectives to factors and understanding main and interactive effects. - Fractional factorial design 2RK-P: Ideal for identifying main effects and 2-factor interactions. - General fractional factorial design LK-P: Systematically identification of significant inputs and analysis of nonlinear behaviors. - Composite designs as response surface methods: Resolving interactions and optimizing decisions with limited factors. - Adapting to practical challenges with “short” DOE: Leveraging optimization schemes like D-optimality, and A-optimality for optimal results. Readers are encouraged not to allow product failures to hinder progress but to embrace the "statistical thinking" embedded in DOE. This book can illuminate the path to designing products that stand the test of time, resulting in satisfied customers and thriving businesses. (ISBN 9781468606027, ISBN 9781468606034, ISBN 9781468606041, DOI 10.4271/9781468606034)

Vlsi Test Principles And Architectures

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Author : Laung-Terng Wang
language : en
Publisher: Elsevier
Release Date : 2006-08-14

Vlsi Test Principles And Architectures written by Laung-Terng Wang and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-08-14 with Technology & Engineering categories.

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Product Design And Testing For Automotive Engineering Volume Ii

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Author : Young J. Chiang
language : en
Publisher: SAE International
Release Date : 2024-09-17

Product Design And Testing For Automotive Engineering Volume Ii written by Young J. Chiang and has been published by SAE International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-09-17 with Computers categories.

Failure modes and effects analysis (FMEA); Reliability; Product Development; Design Process; Test Procedures "Explore Product Design and Testing for Automotive Engineering: Volume II, an essential guide reshaping vehicle manufacturing with unprecedented reliability. As part of SAE International’s DOE for Product Reliability Growth series, this practical resource introduces cutting-edge methodologies crucial for predicting and improving product reliability in an era of automotive electrification. The book navigates statistical tolerance design, showcasing how variability in part fabrication and assembly can enhance reliability and sustainability. Key topics include: - Statistical tolerance design's impact on manufacturing and material selection, focusing on non-normal distributions' effects on product assembly and cost. Methods like maximum likelihood estimators and Monte Carlo simulations are used for assembly strategy synthesis. - Reliability DOEs using log-location-scale distributions to estimate lifetimes of non-normally distributed components, especially in accelerated life testing. It covers transformations optimizing parts and system designs under the lognormal distribution. - Weibull distribution (DOE-W) for characterizing lifetimes affected by various failure modes, detailing parameter assessment methods and real-world applications. The book also introduces reliability design of experiments based on the exponential distribution (DOE-E). - Importance of predicting lifecycles and enhancing reliability through qualitative and stepwise accelerated life tests. Integration of physics of failure with statistical methods like Weibull statistics and lognormal approximation enhances analysis credibility. - Inferential mechanisms such as the Arrhenius and Eyring models in predicting automotive component lifecycles, refining product life prediction based on reliability DOEs. Whether you're an engineer, researcher, or automotive professional, this book equips you to navigate reliability engineering confidently. Revolutionize your approach to product design and testing with Product Design and Testing for Automotive Engineering, your definitive companion in shaping the future of automotive reliability." (ISBN 9781468607703 ISBN 9781468607697 ISBN 9781468607727 DOI 10.4271/9781468607697)

Vlsi Testing Design For Testability

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Author : Dr. A Chrispin Jiji
language : en
Publisher: Booksclinic Publishing
Release Date : 2025-02-25

Vlsi Testing Design For Testability written by Dr. A Chrispin Jiji and has been published by Booksclinic Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-02-25 with Computers categories.

Nanometer Technology Designs

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Author : Nisar Ahmed
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-02-26

Nanometer Technology Designs written by Nisar Ahmed and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-02-26 with Technology & Engineering categories.

Adopting new fabrication technologies not only provides higher integration and enhances performance, but also increases the types of manufacturing defects. With design size in millions of gates and working frequency in GHz timing-related defects havv become a high proportion of the total chip defects. For nanometer technology designs, the stuck-at fault test alone cannot ensure a high quality level of chips. At-speed tests using the transition fault model has become a requirement in technologies below 180nm. Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise (including IR-drop, ground bounce, and Ldi/dt) effects on chip performance, high test pattern volume, low fault/defect coverage, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.

Reliability Engineering

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Author : A. Birolini
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-04-17

Reliability Engineering written by A. Birolini and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Science categories.

Reliability engineering is a rapidly evolving discipline, whose purpose is to develop methods and tools to predict, evaluate, and demonstrate reliability, maintainability, and availability of components, equipment, and systems, as well as to support development and production engineers in building in reliability and maintainability. To be cost and time effective, reliability engineering has to be coordinated with quality assurance activities, in agreement with Total Quality Management (TQM) and Concurrent Engineering efforts. To build in reliability and maintainability into complex equipment or systems, failure rate and failure mode analyses have to be performed early in the development phase and be supported by design guidelines for reliability, maintainability, and software quality as well as by extensive design reviews. Before production, qualification tests on prototypes are necessary to ensure that quality and reliability targets have been met. In the production phase, processes need to be selected and monitored to assure the required quality level. For many systems, availability requirements have also to be satisfied. In these cases, stochastic processes can be used to investigate and optimize availability. including logistical support as well. Software often plays a dominant role, requiring specific quality assurance activities. This book presents the state-of-the-art of reliability engineering, both in theory and practice. It is based on over 25 years experience of the author in this field, half of which was in industry and half as Professor for reliability engineering at the ETH (Swiss Federal Institute of Technology Zurich).