Digital Evaluation And Failure Analysis Data
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Digital Evaluation And Failure Analysis Data
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Author : David B. Nicholls
language : en
Publisher:
Release Date : 1980
Digital Evaluation And Failure Analysis Data written by David B. Nicholls and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1980 with categories.
Digital Evaluation And Failure Analysis Data 2 Pts
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Author : Reliability Analysis Center (U.S.)
language : en
Publisher:
Release Date : 1980
Digital Evaluation And Failure Analysis Data 2 Pts written by Reliability Analysis Center (U.S.) and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1980 with categories.
Digital Evaluation And Failure Analysis Data
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Author : David B. Nicholls
language : en
Publisher:
Release Date : 1980
Digital Evaluation And Failure Analysis Data written by David B. Nicholls and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1980 with Digital integrated circuits categories.
Electronic Reliability Design Handbook
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Author :
language : en
Publisher:
Release Date : 1988
Electronic Reliability Design Handbook written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1988 with Electronic apparatus and appliances categories.
Reliability Analysis And Prediction
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Author : K.B. Misra
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Reliability Analysis And Prediction written by K.B. Misra and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Technology & Engineering categories.
This book equips the reader with a compact information source on all the most recent methodological tools available in the area of reliability prediction and analysis. Topics covered include reliability mathematics, organisation and analysis of data, reliability modelling and system reliability evaluation techniques. Environmental factors and stresses are taken into account in computing the reliability of the involved components. The limitations of models, methods, procedures, algorithms and programmes are outlined. The treatment of maintained systems is designed to aid the worker in analysing systems with more realistic and practical assumptions. Fault tree analysis is also extensively discussed, incorporating recent developments. Examples and illustrations support the reader in the solving of problems in his own area of research. The chapters provide a logical and graded presentation of the subject matter bearing in mind the difficulties of a beginner, whilst bridging the information gap for the more experienced reader. The work will be of considerable interest to engineers working in various industries, research organizations, particularly in defence, nuclear, chemical, space or communications. It will also be an indispensable study aid for serious-minded students and teachers.
Microcircuit Device Reliability
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Author :
language : en
Publisher:
Release Date : 1984
Microcircuit Device Reliability written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1984 with Integrated circuits categories.
Technical Abstract Bulletin
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Author : Defense Documentation Center (U.S.)
language : en
Publisher:
Release Date : 1964
Technical Abstract Bulletin written by Defense Documentation Center (U.S.) and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1964 with Military art and science categories.
Microcircuit Screening Effectiveness
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Author : Henry C. Rickers
language : en
Publisher:
Release Date : 1978
Microcircuit Screening Effectiveness written by Henry C. Rickers and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1978 with Integrated circuits categories.
This information is utilized to determine efficiency factors of individual screens/tests and is combined with cost information to assess screening effectiveness and to provide the proper guidance in determining the optimal screening program for any specific situation. (Author).
Digest Defense Documentation Center
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Author : Defense Documentation Center (U.S.)
language : en
Publisher:
Release Date : 1975
Digest Defense Documentation Center written by Defense Documentation Center (U.S.) and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1975 with Military art and science categories.
Microcircuit Device Reliability
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Author : David B. Nicholls
language : en
Publisher:
Release Date : 1980
Microcircuit Device Reliability written by David B. Nicholls and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1980 with Digital electronics categories.