Electron Beam Testing Technology

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Electron Beam Testing Technology

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Author : John T.L. Thong
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-06-29

Electron Beam Testing Technology written by John T.L. Thong and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-06-29 with Science categories.

Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age.

Electron Beam Testing Technology For High Speed Device Characterisation

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Author : John Thiam Leong Thong
language : en
Publisher:
Release Date : 1989

Electron Beam Testing Technology For High Speed Device Characterisation written by John Thiam Leong Thong and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with categories.

Vacuum Electronics

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Author : Joseph A. Eichmeier
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-03-04

Vacuum Electronics written by Joseph A. Eichmeier and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-03-04 with Technology & Engineering categories.

Nineteen experts from the electronics industry, research institutes and universities have joined forces to prepare this book. It does nothing less than provide a complete overview of the electrophysical fundamentals, the present state of the art and applications, as well as the future prospects of microwave tubes and systems. The book does the same for optoelectronics vacuum devices, electron and ion beam devices, light and X-ray emitters, particle accelerators and vacuum interrupters.

Advances In Imaging And Electron Physics

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Author : Peter W. Hawkes
language : en
Publisher: Elsevier
Release Date : 2004-12-18

Advances In Imaging And Electron Physics written by Peter W. Hawkes and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-12-18 with Technology & Engineering categories.

* A special volume devoted principally to therole of the late Sir Charles Oatley in the development of the scanning electron microscopeings* It contains historical articles and reminiscences by most of the scientists who have worked on the scanning electron microscope in Oatley's laboratory * Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physicsAlthough the scanning electron microscope had a prehistory in Germany and the USA, its real champion was Charles Oatley, who launched his projectin the Cambridge University Engineering Department shortly after the end of World War II. A first microscope was built successfully by D. McMullan, oneof the Guest Editors of this volume and a succession of progressively improved instruments followed. One in particular, built by K.C.A. Smith was commissioned specially for the Canadian Pulp and Paper Research Institute for use in their Montreal laboratories. All these efforts culminated in the commercial model built by the Cambridge Instrument Company and marketed in 1965 under the trade name, Stereoscan.Although this story has been told on several occasions, in particular in these Advances, it seemed appropriate, in the centenary year of the birth of Sir Charles Oatley, that more details should be published to celebrate these achievements. This volume is the result. It contains not only historical articles and reminiscences by most of the scientists who have worked on the scanning electron microscope in Oatley's laboratory but also full or partial reproductions of many of the key publications, beginning with McMullan's early paper of 1953 and including Oatley's own "Early history of the scanning electron microscope" (1982). A website has been created, in which supplementary material is collected.This volume is a tribute to a bold pioneering scientist and a vivid record of the creation of the first commercial scanning electron microscopes and of subsequent developments. * A special volume devoted principally to therole of the late Sir Charles Oatley in the development of the scanning electron microscopeings* It contains historical articles and reminiscences by most of the scientists who have worked on the scanning electron microscope in Oatley's laboratory* Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics

Multi Chip Module Test Strategies

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Author : Yervant Zorian
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Multi Chip Module Test Strategies written by Yervant Zorian and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).

Istfa 2019 Proceedings Of The 45th International Symposium For Testing And Failure Analysis

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Author : ASM International
language : en
Publisher: ASM International
Release Date : 2019-12-01

Istfa 2019 Proceedings Of The 45th International Symposium For Testing And Failure Analysis written by ASM International and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-12-01 with Technology & Engineering categories.

The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.

Advanced Smart Information And Communication Technology And Systems

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Author : Mykhailo Ilchenko
language : en
Publisher: Springer Nature
Release Date : 2025-07-28

Advanced Smart Information And Communication Technology And Systems written by Mykhailo Ilchenko and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-07-28 with Computers categories.

This book highlights the most important research areas in Information and Communication Technologies and their impact on digital society and environment sustainable development namely the research in fields of Information and Communication Technologies, artificial intelligence in ICT, lunar missions maintenance, security of data and services, smart robotic systems implementation in the digital environment, and mathematical modeling for practical and research tasks in communication and data processing fields provided by various groups of researchers from Germany and Ukraine in cooperation with scientists from different countries. The presented studies contain a discussion on the use of multi-cloud integration approaches, in particular, based on methods of deep learning, practical implementation of the Internet of Things (IoT), the modern study of V2V Communication, and research in fields of mathematical modeling in applied problems. The book focuses on the basics of information and analytical activities in the digital global space, to providing broadband Internet access without decreasing the quality of experience (QoE) level, improving services provision, and system architecture with improving security. The study of modern communication and information technologies contains original works dealing with many aspects of their improvement and use for research that shows some effective technological solutions that can be used for the implementation of novel cloud infrastructure and radio electronics systems. These results can be used in the implementation of novel systems and to promote the exchange of information in e-societies. Given its scope, the book offers a valuable resource for scientists, lecturers, specialists working at enterprises, and graduate and undergraduate students who engage with problems in Information and Communication Technologies as well as aspects of society and environment sustainable development.

Scientific And Technical Aerospace Reports

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Author :
language : en
Publisher:
Release Date : 1995

Scientific And Technical Aerospace Reports written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Aeronautics categories.

Beam Processing Technologies

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Author : Norman G. Einspruch
language : en
Publisher: Academic Press
Release Date : 2014-12-01

Beam Processing Technologies written by Norman G. Einspruch and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-12-01 with Technology & Engineering categories.

Beam Processing Technologies is a collection of papers that deals with the miniaturization of devices that will be faster, consume less power, and cost less per operation or fabrication. One paper discusses metal oxide semiconductor (MOS) integrated circuit technology including the operation of devices whose lateral and vertical dimensions are scaled down. If the devices' silicon doping profiles are increased by the same scale factor, they can operate on lower voltages and currents, with the same performance. Another paper describes laser beam processing and wafer-scale integration as techniques to increase the number of devices on a silicon chip. Electron beam technologies can be used in many fabrication processes such as in microlithography, selective oxidation, doping, metrology. Ion beam applications depend on the presence of the ion introduced into the device (e.g. implantation doping), on pseudoelastic collisions (e.g. physical sputtering or crystal damage), and on inelastic scattering (e.g. polymer resist exposure). Silicon molecular beam epitaxy (SiMBE) can also grow high-quality layers at low temperature, particularly concerning germanium, especially as reagrds the growth system design and utilization of n- and p-type doping. Chemical beam epitaxy (CBE) is another epitaxial growth technique that can surpass MBE and metal organic chemical vapor deposition (MO-CVD). The collection is suitable chemical engineers, industrial physicists, and researchers whose work involve micro-fabrication and development of integrated circuits.

Technical Abstract Bulletin

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Author :
language : en
Publisher:
Release Date : 1964

Technical Abstract Bulletin written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1964 with Science categories.