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Electrostatic Lens Systems

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Electrostatic Lens Systems

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Author : D.W.O. Heddle
language : en
Publisher:
Release Date : 1991-06

Electrostatic Lens Systems written by D.W.O. Heddle and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991-06 with Science categories.

The use of electrostatic lenses for the control of ion and electron beams has grown considerably in recent years. In addition, innovations in the production of low energy positrons have opened a whole new field of research for which electrostatic lenses are required. Electrostatic Lens Systems is therefore a timely treatise on the practical aspects of lens system design. The text gives a clear and concise treatment of the motion of charged particles in electrostatic fields and describes several methods of calculating the potential and field distributions for various electrode geometries. Electrostatic Lens Systems is also intended to be an interactive tutor on the practical design and analysis of systems using round lenses (both apertures and cylinders) through a unique suite of programs (provided on IBM compatible disc). Combined with an emphasis on the Bessel function expansion method and a thorough description of the well known relaxation methods, this volume will be a significant reference work and learning tool for experienced workers and new researchers alike. If you need to use electrostatic lenses then you need to read Electrostatic Lens Systems.

Electrostatic Lens Systems 2nd Edition

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Author : D.W.O. Heddle
language : en
Publisher: CRC Press
Release Date : 2000-12-13

Electrostatic Lens Systems 2nd Edition written by D.W.O. Heddle and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000-12-13 with Technology & Engineering categories.

Electrostatic Lens Systems: Second Edition enables readers to design lens systems for focusing beams of charged particles that have useful characteristics. The book covers the basic theory of the motion of charged particles in electrostatic fields and describes several methods for the calculation of the potential and field distribution for various electrode geometries. It emphasizes the Bessel function expansion method, developed by the author and his students, and the nine-point implementation of the finite difference method. Demonstration programs of other methods can be found via the websites provided. A chapter on aberrations presents formulae that enable the coefficients to be determined by an extension to the ray tracing procedures, demonstrating optimum conditions for lens operation. The book is accompanied by a disk that provides a suite of computer programs (LENSYS for MS-DOS) intended for practical use in the design and analysis of systems using round lenses with apertures or cylindrical elements. These programs are of value even to experienced workers in the field who may be quite familiar with much of the material in the text.

Electrostatic Lens Systems

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Author : D.W.O. Heddle
language : en
Publisher: Taylor & Francis
Release Date : 1991-06-01

Electrostatic Lens Systems written by D.W.O. Heddle and has been published by Taylor & Francis this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991-06-01 with Technology & Engineering categories.

Handbook Of Charged Particle Optics

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Author : Jon Orloff
language : en
Publisher: CRC Press
Release Date : 2017-12-19

Handbook Of Charged Particle Optics written by Jon Orloff and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-19 with Science categories.

With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.

Applied Charged Particle Optics

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Author : Helmut Liebl
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-01-12

Applied Charged Particle Optics written by Helmut Liebl and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-01-12 with Science categories.

Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.

Electron Optics

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Author : P. Grivet
language : en
Publisher: Elsevier
Release Date : 2013-10-22

Electron Optics written by P. Grivet and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-22 with Science categories.

Electron Optics, Second English Edition, Part I: Optics is a 10-chapter book that begins by elucidating the fundamental features and basic techniques of electron optics, as well as the distribution of potential and field in electrostatic lenses. This book then explains the field distribution in magnetic lenses; the optical properties of electrostatic and magnetic lenses; and the similarities and differences between glass optics and electron optics. Subsequent chapters focus on lens defects; some electrostatic lenses and triode guns; and magnetic lens models. The strong focusing lenses and prism optics are also described. This book will be useful to graduating students, as well as to beginners who sometimes feel lost in the abundant specialized literature.

Surface Microscopy With Low Energy Electrons

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Author : Ernst Bauer
language : en
Publisher: Springer
Release Date : 2014-07-10

Surface Microscopy With Low Energy Electrons written by Ernst Bauer and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-07-10 with Technology & Engineering categories.

This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.

Focusing Of Charged Particles V2

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Author : Albert Septier
language : en
Publisher: Elsevier
Release Date : 2012-12-02

Focusing Of Charged Particles V2 written by Albert Septier and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Science categories.

Focusing of Charged Particles, Volume II presents the aspects of particle optics, including the electron, the ion optical domains, and the accelerator field. This book provides a detailed analysis of the principles of the laws of propagation of beams. Comprised of three parts encompassing three chapters, this volume starts with an overview of how a beam of charged particles traverses a region that is at a uniform, constant, electrostatic potential. This book then discusses the principle of charge repulsion effect by which the space charge of the beam modifies the potential in the region that it traverses. Other chapters examine the general design techniques and performances obtainable for electron guns applicable for use in initiating a beam for linear beam tubes that is given in a condensed form. The last chapter deals with the two stable charged particles that can be accelerated, namely, protons and electrons. This book is a valuable resource to physicists, accelerator experts, and experimenters in search of interactions in the detector target.

Sector Field Mass Spectrometry For Elemental And Isotopic Analysis

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Author : Thomas Prohaska
language : en
Publisher: Royal Society of Chemistry
Release Date : 2014-11-21

Sector Field Mass Spectrometry For Elemental And Isotopic Analysis written by Thomas Prohaska and has been published by Royal Society of Chemistry this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-11-21 with Science categories.

This book was triggered by the success story of sector field mass spectrometry in elemental and isotopic analysis since the first presentation of the mass spectrum of Ne a hundred years ago. The outstanding and unique features of sector field mass spectrometry - high sensitivity, high mass resolution and simultaneous multiple ion detection – have paved the way for its widespread and successful application across different scientific disciplines. Written, compiled and edited by world renowned experts, this book is intended to provide deep insight into the topic along with fundamental knowledge about elemental and isotopic analysis. Aimed at scientists in the field of natural and life sciences, instrument manufacturers, practitioners and graduate students, it provides solid information about the methodological background and analytical capabilities of sector field mass spectrometry. A detailed description of peculiarities and an overview of the most relevant applications making use of specific techniques employing sector field mass analysers (ICP-MS, GDMS, TIMS, SIMS and IRMS) are given, including a presentation of the currently available commercial instruments. This approach guarantees that readers are thoroughly introduced to and familiarized with the fascinating inter- and transdisciplinary field of sector field mass spectrometry.

Ion Implantation Technology 92

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Author : D.F. Downey
language : en
Publisher: Elsevier
Release Date : 2012-12-02

Ion Implantation Technology 92 written by D.F. Downey and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Technology & Engineering categories.

Ion implantation technology has made a major contribution to the dramatic advances in integrated circuit technology since the early 1970's. The ever-present need for accurate models in ion implanted species will become absolutely vital in the future due to shrinking feature sizes. Successful wide application of ion implantation, as well as exploitation of newly identified opportunities, will require the development of comprehensive implant models. The 141 papers (including 24 invited papers) in this volume address the most recent developments in this field. New structures and possible approaches are described. The implications for ion implantation technology as well as additional observations of needs and opportunities are discussed. The volume will be of value to all those who are interested in acquiring a more complete understanding of the current developments in ion implantation processes and comprehensive implant models.

Electrostatic Lens Systems

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