Elements Of Modern X Ray Physics
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Elements Of Modern X Ray Physics
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Author : Jens Als-Nielsen
language : en
Publisher: John Wiley & Sons
Release Date : 2011-04-20
Elements Of Modern X Ray Physics written by Jens Als-Nielsen and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-04-20 with Science categories.
Eagerly awaited, this second edition of a best-selling text comprehensively describes from a modern perspective the basics of x-ray physics as well as the completely new opportunities offered by synchrotron radiation. Written by internationally acclaimed authors, the style of the book is to develop the basic physical principles without obscuring them with excessive mathematics. The second edition differs substantially from the first edition, with over 30% new material, including: A new chapter on non-crystalline diffraction - designed to appeal to the large community who study the structure of liquids, glasses, and most importantly polymers and bio-molecules A new chapter on x-ray imaging - developed in close cooperation with many of the leading experts in the field Two new chapters covering non-crystalline diffraction and imaging Many important changes to various sections in the book have been made with a view to improving the exposition Four-colour representation throughout the text to clarify key concepts Extensive problems after each chapter There is also supplementary book material for this title available online (http://booksupport.wiley.com). Praise for the previous edition: "The publication of Jens Als-Nielsen and Des McMorrow's Elements of Modern X-ray Physics is a defining moment in the field of synchrotron radiation... a welcome addition to the bookshelves of synchrotron–radiation professionals and students alike.... The text is now my personal choice for teaching x-ray physics...." —Physics Today, 2002
Elements Of Modern X Ray Physics
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Author : Jens Als-Nielsen
language : en
Publisher: Wiley
Release Date : 2001-03-13
Elements Of Modern X Ray Physics written by Jens Als-Nielsen and has been published by Wiley this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001-03-13 with Science categories.
The availability of intense X-ray beams from synchroton storage rings has revolutionised the field of X-ray science. This is illustrated by the cover pictures: Von Laue's first observation of X-ray diffraction from a single crystal of ZnS used an exposure time of around 1000 seconds, whereas the diffraction from a single crystal of myoglobin using modern X-ray synchroton radiation was obtained within the duration of a single pulse lasting only 0.00000000001 seconds. In this book the basics of X-ray physics, as well as the completely new opportunities offered by synchrotron radiation, are viewed from a modern perspective. The style of the book is to develop the basic physical principles without obscuring them in too much mathematical rigour. This approach should make the book attractive to the wider community of material scientists, chemists, biologists and geologists, as well as to physicists who use synchrotron radiation in their research. The book should be useful both to students taking course in X-rays, and to more experienced professionals who have the desire to extend their knowledge into new areas.
Elementary Scattering Theory
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Author : D.S. Sivia
language : en
Publisher: Oxford University Press, USA
Release Date : 2011-01-06
Elementary Scattering Theory written by D.S. Sivia and has been published by Oxford University Press, USA this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-01-06 with Science categories.
This book provides the basic theoretical background for X-ray and neutron scattering experiments. Since these techniques are increasingly being used by biologists and chemists, as well as physicists, the book is intended to be accessible to a broad spectrum of scientists.
Frcr Physics Notes
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Author : Christopher Clarke
language : en
Publisher:
Release Date : 2020-11-13
Frcr Physics Notes written by Christopher Clarke and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-11-13 with categories.
Comprehensive medical imaging physics notes aimed at those sitting the first FRCR physics exam in the UK and covering the scope of the Royal College of Radiologists syllabus. Written by Radiologists, the notes are concise and clearly organised with 100's of beautiful diagrams to aid understanding. The notes cover all of radiology physics, including basic science, x-ray imaging, CT, ultrasound, MRI, molecular imaging, and radiation dosimetry, protection and legislation. Although aimed at UK radiology trainees, it is also suitable for international residents taking similar examinations, postgraduate medical physics students and radiographers. The notes provide an excellent overview for anyone interested in the physics of radiology or just refreshing their knowledge. This third edition includes updates to reflect new legislation and many new illustrations, added sections, and removal of content no longer relevent to the FRCR physics exam. This edition has gone through strict critique and evaluation by physicists and other specialists to provide an accurate, understandable and up-to-date resource. The book summarises and pulls together content from the FRCR Physics Notes at Radiology Cafe and delivers it as a paperback or eBook for you to keep and read anytime. There are 7 main chapters, which are further subdivided into 60 sub-chapters so topics are easy to find. There is a comprehensive appendix and index at the back of the book.
High Resolution X Ray Scattering
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Author : Ullrich Pietsch
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09
High Resolution X Ray Scattering written by Ullrich Pietsch and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Technology & Engineering categories.
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
X Rays And Extreme Ultraviolet Radiation
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Author : David Attwood
language : en
Publisher: Cambridge University Press
Release Date : 2016
X Rays And Extreme Ultraviolet Radiation written by David Attwood and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016 with Science categories.
Master the physics and understand the current applications of modern X-ray and EUV sources with this fully updated second edition.
Nanoscale Photonic Imaging
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Author : Tim Salditt
language : en
Publisher: Springer Nature
Release Date : 2020-06-09
Nanoscale Photonic Imaging written by Tim Salditt and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-06-09 with Science categories.
This open access book, edited and authored by a team of world-leading researchers, provides a broad overview of advanced photonic methods for nanoscale visualization, as well as describing a range of fascinating in-depth studies. Introductory chapters cover the most relevant physics and basic methods that young researchers need to master in order to work effectively in the field of nanoscale photonic imaging, from physical first principles, to instrumentation, to mathematical foundations of imaging and data analysis. Subsequent chapters demonstrate how these cutting edge methods are applied to a variety of systems, including complex fluids and biomolecular systems, for visualizing their structure and dynamics, in space and on timescales extending over many orders of magnitude down to the femtosecond range. Progress in nanoscale photonic imaging in Göttingen has been the sum total of more than a decade of work by a wide range of scientists and mathematicians across disciplines, working together in a vibrant collaboration of a kind rarely matched. This volume presents the highlights of their research achievements and serves as a record of the unique and remarkable constellation of contributors, as well as looking ahead at the future prospects in this field. It will serve not only as a useful reference for experienced researchers but also as a valuable point of entry for newcomers.
Three Dimensional X Ray Diffraction Microscopy
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Author : Henning Friis Poulsen
language : en
Publisher: Springer Science & Business Media
Release Date : 2004-08-31
Three Dimensional X Ray Diffraction Microscopy written by Henning Friis Poulsen and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-08-31 with Nature categories.
Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing. The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
X Ray Diffraction Crystallography
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Author : Yoshio Waseda
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-03-18
X Ray Diffraction Crystallography written by Yoshio Waseda and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-03-18 with Technology & Engineering categories.
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
An Introduction To X Ray Crystallography
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Author : Michael M. Woolfson
language : en
Publisher: Cambridge University Press
Release Date : 1997-01-13
An Introduction To X Ray Crystallography written by Michael M. Woolfson and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-01-13 with Medical categories.
A textbook for the student beginning a serious study of X-ray crystallography.