Evolution Of Surface And Thin Film Microstructure Volume 280
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Evolution Of Surface And Thin Film Microstructure
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Author : Harry A. Atwater
language : en
Publisher: Cambridge University Press
Release Date : 2014-06-05
Evolution Of Surface And Thin Film Microstructure written by Harry A. Atwater and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-06-05 with Technology & Engineering categories.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Mechanisms Of Thin Film Evolution Volume 317
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Author : Steven M. Yalisove
language : en
Publisher:
Release Date : 1994-05-11
Mechanisms Of Thin Film Evolution Volume 317 written by Steven M. Yalisove and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994-05-11 with Technology & Engineering categories.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Handbook Of Deposition Technologies For Films And Coatings
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Author : Peter M. Martin
language : en
Publisher: William Andrew
Release Date : 2009-12-01
Handbook Of Deposition Technologies For Films And Coatings written by Peter M. Martin and has been published by William Andrew this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-12-01 with Technology & Engineering categories.
This 3e, edited by Peter M. Martin, PNNL 2005 Inventor of the Year, is an extensive update of the many improvements in deposition technologies, mechanisms, and applications. This long-awaited revision includes updated and new chapters on atomic layer deposition, cathodic arc deposition, sculpted thin films, polymer thin films and emerging technologies. Extensive material was added throughout the book, especially in the areas concerned with plasma-assisted vapor deposition processes and metallurgical coating applications.
Thin Films Volume 308
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Author : Paul H. Townsend
language : en
Publisher:
Release Date : 1993-10-27
Thin Films Volume 308 written by Paul H. Townsend and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1993-10-27 with Technology & Engineering categories.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Fundamental Aspects Of Ultrathin Dielectrics On Si Based Devices
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Author : Eric Garfunkel
language : en
Publisher: Springer Science & Business Media
Release Date : 1998-03-31
Fundamental Aspects Of Ultrathin Dielectrics On Si Based Devices written by Eric Garfunkel and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-03-31 with Technology & Engineering categories.
An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of Audience: Both expert scientists and engineers who wish to keep up with cutting edge research, and new students who wish to learn more about the exciting basic research issues relevant to next-generation device technology.
Atomic Scale Imaging Of Surfaces And Interfaces
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Author : D. K. Biegelsen
language : en
Publisher:
Release Date : 1993
Atomic Scale Imaging Of Surfaces And Interfaces written by D. K. Biegelsen and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1993 with Computers categories.
Materials tunneling microscopy for hydrogen-desorption-induced structural change of Si(111) surface; Steps on the (110) surface InP; Scanning tunneling microscopy on charge density waves in layered compounds; Design of ultra high vacuum scanning electron microscope combined with scanning tunneling microscope; Scanning tunneling microscopy perspective of structures on reduced SrTiO3(001) surfaces; Surface structure and electronic property of reduced SrTiO3(100) surface observed by STM/STS; Metastable structural surface excitations and concerted adatom motions: a STM study of atomic motions within a semiconductor surface; Mechanisms and energetics of surface atomic processes: an atom-probe field ion microscope study; Atomic arrangement of Al near the phase boundaries between square root 3X square root 3-Al and 7X7 structures on Si(111) surfaces; Growth and surface morphology of thin silicon films using an atomic force microscope; Solving interface structures by combined electron microscopy and X-ray diffraction; Quantitative hrem study of the atomic structure of the sum(310)/[001] symmetric tilt grain boundary in Nb; Hrtem observation of a sum =3 \{112\} bicrystal boundary in aluminum; Atomic structure of the (310) twin in niobium; theoretical predictions and comparison with experimental observation; Quantitative high-resolution electron microscopy of grain boundaries in gamma-Al2=3; Comparisons of observed and simulated atomic structures of Pd/NiO heterophase interfaces; Atomic structure of sum =5 (130) symmetrical tilt boundary in strontium titanate; Assessment of GaInAs/GaInAsP interdiffusion profiles obtained using stem-edx and hrem; Electron microscopy characterization of epitaxial growth of Ag deposited on MgO microcubes; Real-time viewinf of dynamic processes on CdTe surfaces at elevated temperature; AFM imaging of the crystalline-to-amorphous transition on the surface of ion-implanted mica; AFM imagings of ferritin molecules bound to LB films of poly-1-benzyl-L-histidine; Artifacts in atomic force microscopy of nanoporous and mesoporous fiducial samples; Al induced reconstructions on the Si(111) surfaces studied by scanning tunneling microscopy; Structure of the sum =3 (111) grain boundary in Cu-1.5%Sb; High resolution electron microscopy of sum =3 NiSi2 (111)/(115) Si and NiSi2(221)/(001)Si interfaces; Image simulations of Ge twin boundaries; Surface structure of oxide catalyst microcrystals: high resolution electron microscopy study; A microstructural study of reaction-bonded silicon carbide...
Ferroelectric Thin Films Iii Volume 310
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Author : Edward R. Myers
language : en
Publisher:
Release Date : 1992
Ferroelectric Thin Films Iii Volume 310 written by Edward R. Myers and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with Science categories.
Papers of the symposium held April 13-16, 1993 in San Francisco, Calif., on: novel analysis techniques to characterize materials and device properties, process integration, degradation and modelling, CVD, spin pyrolysis, niobium and barium based ferroelectrics, materials and processes, sputter deposition, pulsed laser and other deposition techniques. Annotation copyright by Book News, Inc., Portland, OR
Phase Transformations In Thin Films
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Author : M. Atzmon
language : en
Publisher:
Release Date : 1993
Phase Transformations In Thin Films written by M. Atzmon and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1993 with Metals categories.
Ferroelectric Thin Films
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Author :
language : en
Publisher:
Release Date : 1992
Ferroelectric Thin Films written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with Ferroelectric thin films categories.
Amorphous Insulating Thin Films Volume 284
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Author : Jerzy Kanicki
language : en
Publisher:
Release Date : 1993-09-27
Amorphous Insulating Thin Films Volume 284 written by Jerzy Kanicki and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1993-09-27 with Technology & Engineering categories.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.