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Field Ion Microscopy

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Field Ion Microscopy

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Author : John J. Hren
language : en
Publisher: Springer
Release Date : 2013-11-11

Field Ion Microscopy written by John J. Hren and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-11 with Technology & Engineering categories.

Field Ion Microscopy

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Author : Erwin W. Müller
language : en
Publisher:
Release Date : 1969

Field Ion Microscopy written by Erwin W. Müller and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1969 with Science categories.

Atom Probe Field Ion Microscopy

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Author : Tien T. Tsong
language : en
Publisher: Cambridge University Press
Release Date : 1990-08-30

Atom Probe Field Ion Microscopy written by Tien T. Tsong and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990-08-30 with Science categories.

Atom-probe field ion microscopy is the only technique capable of imaging solid surfaces with atomic resolution, while chemically analysing surface atoms selected by the observer from the field ion image. This book presents the basic principles and illustrates the capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution.

Field Ion Microscopy

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Author : R. Wagner
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Field Ion Microscopy written by R. Wagner and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.

Despite the recent progress in developing various microanalytical tools of better spatial resolution and more sensitivity to chemical analyses for the study of various defects in metallic solids the Field-Ion Microscope (FIM) still remains the only instrument up to now to resolve single atoms in the surface of a metal. Fifteen years after Milller!) invented the FIM he was also the first to combine the FIM with a time-of-flight (ToF) mass spectrometer - the so-called Atom-Probe FlM - to identify the chemical nature of single atoms imaged in the FIM2). Originally the motivation to develop the ToF atom probe was to use this method to obtain some more fundamental understanding of field ionization and field evaporation, the most basic physical processes in field-ion microscopy. Even after the successful combination of a FIM with a ToF atom probe had been accomplished, the technique was rarely applied to metallurgical investigations since for a fairly long period only refractory metals such as tungsten, molybdenum, iridium, etc. could be imaged in the FIM. How ever, these metals do not playa very important role in metallurgy. Only when Turner et 3 al. ) substituted the conventional phosphorescent screen of the field-ion microscope with micro-channel electron multiplier arrays, termed micro channel plates, did it become possible to image in the FIM the less refractory metals like Fe, Cu, Ni and even AI.

Atom Probe Field Ion Microscopy

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Author : Tien T. Tsong
language : en
Publisher:
Release Date : 1990-08-30

Atom Probe Field Ion Microscopy written by Tien T. Tsong and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990-08-30 with Science categories.

Atom Probe Tomography

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Author : Williams Lefebvre
language : en
Publisher: Academic Press
Release Date : 2016-05-30

Atom Probe Tomography written by Williams Lefebvre and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-05-30 with Science categories.

Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process. - Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials - Written for both experienced researchers and new users - Includes exercises, along with corrections, for users to practice the techniques discussed - Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy

Field Emission And Field Ionization

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Author : Robert Gomer
language : en
Publisher:
Release Date : 1961

Field Emission And Field Ionization written by Robert Gomer and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1961 with Science categories.

Market: Students and researchers in vacuum and surface science, microscopy, and semiconductor physics. This definitive work was based on four lectures presented at Harvard University in 1958. When it was written, field emission was one of the few techniques available for surface studies and the attainment of ultra-high vacuum was a little-known art. Though more sophisticated treatments have since been developed, Gomer's pioneering work remains valid to this day.

Atom Probe Field Ion Microscopy And Its Applications

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Author : Toshio Sakurai
language : en
Publisher:
Release Date : 1989

Atom Probe Field Ion Microscopy And Its Applications written by Toshio Sakurai and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with Science categories.

Atom Probe Microscopy

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Author : Baptiste Gault
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-08-27

Atom Probe Microscopy written by Baptiste Gault and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-08-27 with Technology & Engineering categories.

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.

Atom Probe Tomography

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Author : Michael K. Miller
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Atom Probe Tomography written by Michael K. Miller and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.

The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.

Field Ion Microscopy

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