Functional Design Errors In Digital Circuits
DOWNLOAD
Download Functional Design Errors In Digital Circuits PDF/ePub or read online books in Mobi eBooks. Click Download or Read Online button to get Functional Design Errors In Digital Circuits book now. This website allows unlimited access to, at the time of writing, more than 1.5 million titles, including hundreds of thousands of titles in various foreign languages. If the content not found or just blank you must refresh this page
Functional Design Errors In Digital Circuits
DOWNLOAD
Author : Kai-hui Chang
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-12-02
Functional Design Errors In Digital Circuits written by Kai-hui Chang and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-12-02 with Technology & Engineering categories.
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Functional Design Errors In Digital Circuits
DOWNLOAD
Author : Kai-hui Chang
language : en
Publisher: Springer
Release Date : 2009-08-29
Functional Design Errors In Digital Circuits written by Kai-hui Chang and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-08-29 with Technology & Engineering categories.
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Functional Design Error Diagnosis Correction And Layout Repair Of Digital Circuits
DOWNLOAD
Author : Kai-Hui Chang
language : en
Publisher:
Release Date : 2007
Functional Design Error Diagnosis Correction And Layout Repair Of Digital Circuits written by Kai-Hui Chang and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007 with categories.
Soft Error Reliability Of Vlsi Circuits
DOWNLOAD
Author : Behnam Ghavami
language : en
Publisher: Springer Nature
Release Date : 2020-10-13
Soft Error Reliability Of Vlsi Circuits written by Behnam Ghavami and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-10-13 with Technology & Engineering categories.
This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.
Equivalence Checking Of Digital Circuits
DOWNLOAD
Author : Paul Molitor
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-05-08
Equivalence Checking Of Digital Circuits written by Paul Molitor and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-05-08 with Technology & Engineering categories.
Hardware veri?cation is the process of checking whether a design conforms to its speci?cations of functionality and timing. In today’s design processes it becomes more and more important. Very large scale integrated (VLSI) circuits and the resulting digital systems have conquered a place in almost all areas of our life, even in security sensitive applications. Complex digital systems control airplanes, have been used in banks and on intensive-care units. Hence, the demand for error-free designs is more important than ever. In addition, economic reasons underline this demand as well. The design and production process of present day VLSI-circuits is highly time- and cost-intensive. Mo- over, it is nearly impossible to repair integrated circuits. Thus, it is desirable to detect design errors early in the design process and not just after producing the prototype chip. All these facts are re?ected by developing and prod- tion statistics of present day companies. For example, In?neon Technologies [118] assumed that about 60% to 80% of the overall design time was spent for veri?cation in 2000. Other sources cite the 3-to-1 head count ratio between veri?cation engineers and logic designers. This shows that verifying logical correctness of the design of hardware systems is a major gate to the problem of time-to-market (cf. [113]). With the chip complexity constantly increasing, the dif?culty as well as the - portance of functional veri?cation of new product designs has been increased. It is not only more important to get error-free designs.
Digital Logic Design
DOWNLOAD
Author : B. Holdsworth
language : en
Publisher: Butterworth-Heinemann
Release Date : 2014-05-12
Digital Logic Design written by B. Holdsworth and has been published by Butterworth-Heinemann this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-05-12 with Computers categories.
Digital Logic Design, Second Edition provides a basic understanding of digital logic design with emphasis on the two alternative methods of design available to the digital engineer. This book describes the digital design techniques, which have become increasingly important. Organized into 14 chapters, this edition begins with an overview of the essential laws of Boolean algebra, K-map plotting techniques, as well as the simplification of Boolean functions. This text then presents the properties and develops the characteristic equations of a number of various types of flip-flop. Other chapters consider the design of synchronous and asynchronous counters using either discrete flip-flops or shift registers. This book discusses as well the design and implementation of event driven logic circuits using the NAND sequential equation. The final chapter deals with simple coding techniques and the principles of error detection and correction. This book is a valuable resource for undergraduate students, digital engineers, and scientists.
Digital Circuit Testing
DOWNLOAD
Author : Francis C. Wang
language : en
Publisher: Academic Press
Release Date : 1991-07-28
Digital Circuit Testing written by Francis C. Wang and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991-07-28 with Technology & Engineering categories.
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Self Checking And Fault Tolerant Digital Design
DOWNLOAD
Author : Parag K. Lala
language : en
Publisher: Morgan Kaufmann
Release Date : 2001
Self Checking And Fault Tolerant Digital Design written by Parag K. Lala and has been published by Morgan Kaufmann this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Computers categories.
With VLSI chip transistors getting smaller and smaller, today's digital systems are more complex than ever before. This increased complexity leads to more cross-talk, noise, and other sources of transient errors during normal operation. Traditional off-line testing strategies cannot guarantee detection of these transient faults. And with critical applications relying on faster, more powerful chips, fault-tolerant, self-checking mechanisms must be built in to assure reliable operation. Self-Checking and Fault-Tolerant Digital Design deals extensively with self-checking design techniques and is the only book that emphasizes major techniques for hardware fault tolerance. Graduate students in VLSI design courses as well as practicing designers will appreciate this balanced treatment of the concepts and theory underlying fault tolerance along with the practical techniques used to create fault-tolerant systems. Features: Introduces reliability theory and the importance of maintainability Presents coding and the construction of several error detecting and correcting codes Discusses in depth, the available techniques for fail-safe design of combinational circuits Details checker design techniques for detecting erroneous bits and encoding output of self-checking circuits Demonstrates how to design self-checking sequential circuits, including a technique for fail-safe state machine design
Diagnosis And Reliable Design Of Digital Systems
DOWNLOAD
Author : Melvin A. Breuer
language : en
Publisher: Computer Science Press, Incorporated
Release Date : 1976
Diagnosis And Reliable Design Of Digital Systems written by Melvin A. Breuer and has been published by Computer Science Press, Incorporated this book supported file pdf, txt, epub, kindle and other format this book has been release on 1976 with Computers categories.
Considers the problems of test generation, simulation, & reliability-enhancing design techniques for digital circuits & systems.
Soft Errors In Modern Electronic Systems
DOWNLOAD
Author : Michael Nicolaidis
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-09-24
Soft Errors In Modern Electronic Systems written by Michael Nicolaidis and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-09-24 with Technology & Engineering categories.
This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.