Geometrical Charged Particle Optics
DOWNLOAD
Download Geometrical Charged Particle Optics PDF/ePub or read online books in Mobi eBooks. Click Download or Read Online button to get Geometrical Charged Particle Optics book now. This website allows unlimited access to, at the time of writing, more than 1.5 million titles, including hundreds of thousands of titles in various foreign languages. If the content not found or just blank you must refresh this page
Geometrical Charged Particle Optics
DOWNLOAD
Author : Harald Rose
language : en
Publisher: Springer
Release Date : 2013-02-02
Geometrical Charged Particle Optics written by Harald Rose and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-02-02 with Science categories.
This second edition is an extended version of the first edition of Geometrical Charged-Particle Optics. The updated reference monograph is intended as a guide for researchers and graduate students who are seeking a comprehensive treatment of the design of instruments and beam-guiding systems of charged particles and their propagation in electromagnetic fields. Wave aspects are included in this edition for explaining electron holography, the Aharanov-Bohm effect and the resolution of electron microscopes limited by diffraction. Several methods for calculating the electromagnetic field are presented and procedures are outlined for calculating the properties of systems with arbitrarily curved axis. Detailed methods are presented for designing and optimizing special components such as aberration correctors, spectrometers, energy filters monochromators, ion traps, electron mirrors and cathode lenses. In particular, the optics of rotationally symmetric lenses, quadrupoles, and systems composed of these elements are discussed extensively. Beam properties such as emittance, brightness, transmissivity and the formation of caustics are outlined. Relativistic motion and spin precession of the electron are treated in a covariant way by introducing the Lorentz-invariant universal time and by extending Hamilton’s principle from three to four spatial dimensions where the laboratory time is considered as the fourth pseudo-spatial coordinate. Using this procedure and introducing the self action of the electron, its accompanying electromagnetic field and its radiation field are calculated for arbitrary motion. In addition, the Stern-Gerlach effect is revisited for atomic and free electrons.
Geometrical Charged Particle Optics
DOWNLOAD
Author : Harald H. Rose
language : en
Publisher: Springer Science & Business Media
Release Date : 2009
Geometrical Charged Particle Optics written by Harald H. Rose and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009 with Science categories.
This resource covering all theoretical aspects of modern geometrical charged-particle optics is aimed at anyone involved in the design of electron optical instruments and beam-guiding systems for charged particles.
Charged Particle Optics Theory
DOWNLOAD
Author : Timothy R. Groves
language : en
Publisher: CRC Press
Release Date : 2017-12-19
Charged Particle Optics Theory written by Timothy R. Groves and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-19 with Science categories.
Charged Particle Optics Theory: An Introduction identifies the most important concepts of charged particle optics theory, and derives each mathematically from the first principles of physics. Assuming an advanced undergraduate-level understanding of calculus, this book follows a logical progression, with each concept building upon the preceding one. Beginning with a non-mathematical survey of the optical nature of a charged particle beam, the text: Discusses both geometrical and wave optics, as well as the correspondence between them Describes the two-body scattering problem, which is essential to the interaction of a fast charged particle with matter Introduces electron emission as a practical consequence of quantum mechanics Addresses the Fourier transform and the linear second-order differential equation Includes problems to amplify and fill in the theoretical details, with solutions presented separately Charged Particle Optics Theory: An Introduction makes an ideal textbook as well as a convenient reference on the theoretical origins of the optics of charged particle beams. It is intended to prepare the reader to understand the large body of published research in this mature field, with the end result translated immediately to practical application.
Advances In Optics Of Charged Particle Analyzers Part 2
DOWNLOAD
Author :
language : en
Publisher: Academic Press
Release Date : 2025-02-10
Advances In Optics Of Charged Particle Analyzers Part 2 written by and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-02-10 with Technology & Engineering categories.
Advances in Optics of Charged Particle Analyzers: Part Two, Volume 233 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The release in the series features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers. - Provides the authority and expertise of leading contributors from an international board of authors - Presents the latest release in the Advances in Imaging and Electron Physics series - Features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, and more
Quantum Mechanics Of Charged Particle Beam Optics Understanding Devices From Electron Microscopes To Particle Accelerators
DOWNLOAD
Author : Ramaswamy Jagannathan
language : en
Publisher: CRC Press
Release Date : 2019-05-20
Quantum Mechanics Of Charged Particle Beam Optics Understanding Devices From Electron Microscopes To Particle Accelerators written by Ramaswamy Jagannathan and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-05-20 with Science categories.
Classical Charged Particle Beam Optics used in the design and operation of all present-day charged particle beam devices, from low energy electron microscopes to high energy particle accelerators, is entirely based on classical mechanics. A question of curiosity is: How is classical charged particle beam optics so successful in practice though the particles of the beam, like electrons, are quantum mechanical? Quantum Mechanics of Charged Particle Beam Optics answers this question with a comprehensive formulation of ‘Quantum Charged Particle Beam Optics’ applicable to any charged particle beam device.
Electron And Ion Optics
DOWNLOAD
Author : Miklos Szilagyi
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Electron And Ion Optics written by Miklos Szilagyi and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
The field of electron and ion optics is based on the analogy between geometrical light optics and the motion of charged particles in electromagnetic fields. The spectacular development of the electron microscope clearly shows the possibilities of image formation by charged particles of wavelength much shorter than that of visible light. As new applications such as particle accelerators, cathode ray tubes, mass and energy spectrometers, microwave tubes, scanning-type analytical instruments, heavy beam technologies, etc. emerged, the scope of particle beam optics has been exten ded to the formation of fine probes. The goal is to concentrate as many particles as possible in as small a volume as possible. Fabrication of microcircuits is a good example of the growing importance of this field. The current trend is towards increased circuit complexity and pattern density. Because of the diffraction limitation of processes using optical photons and the technological difficulties connected with x-ray processes, charged particle beams are becoming popular. With them it is possible to write directly on a wafer under computer control, without using a mask. Focused ion beams offer especially great possibilities in the submicron region. Therefore, electron and ion beam technologies will most probably playa very important role in the next twenty years or so.
Focusing Of Charged Particles V2
DOWNLOAD
Author : Albert Septier
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Focusing Of Charged Particles V2 written by Albert Septier and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Science categories.
Focusing of Charged Particles, Volume II presents the aspects of particle optics, including the electron, the ion optical domains, and the accelerator field. This book provides a detailed analysis of the principles of the laws of propagation of beams. Comprised of three parts encompassing three chapters, this volume starts with an overview of how a beam of charged particles traverses a region that is at a uniform, constant, electrostatic potential. This book then discusses the principle of charge repulsion effect by which the space charge of the beam modifies the potential in the region that it traverses. Other chapters examine the general design techniques and performances obtainable for electron guns applicable for use in initiating a beam for linear beam tubes that is given in a condensed form. The last chapter deals with the two stable charged particles that can be accelerated, namely, protons and electrons. This book is a valuable resource to physicists, accelerator experts, and experimenters in search of interactions in the detector target.
Advanced Transmission Electron Microscopy
DOWNLOAD
Author : Jian Min Zuo
language : en
Publisher: Springer
Release Date : 2016-10-26
Advanced Transmission Electron Microscopy written by Jian Min Zuo and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-10-26 with Technology & Engineering categories.
This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.
Springer Handbook Of Microscopy
DOWNLOAD
Author : Peter W. Hawkes
language : en
Publisher: Springer Nature
Release Date : 2019-11-02
Springer Handbook Of Microscopy written by Peter W. Hawkes and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-11-02 with Technology & Engineering categories.
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
Aberration Corrected Imaging In Transmission Electron Microscopy An Introduction 2nd Edition
DOWNLOAD
Author : Rolf Erni
language : en
Publisher: World Scientific Publishing Company
Release Date : 2015-03-23
Aberration Corrected Imaging In Transmission Electron Microscopy An Introduction 2nd Edition written by Rolf Erni and has been published by World Scientific Publishing Company this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-03-23 with Technology & Engineering categories.
Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging.This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010.