Grain Boundary Contrast In Field Ion Microscope Images
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Grain Boundary Contrast In Field Ion Microscope Images
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Author : Robert D. French
language : en
Publisher:
Release Date : 1971
Grain Boundary Contrast In Field Ion Microscope Images written by Robert D. French and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1971 with categories.
The contrast in field ion microscopy images due to (110) symmetric tilt boundaries in a bcc lattice was systematically investigated for misorientations up to 26 degrees by computer image simulation. In low-angel grain boundaries, there are three contrast effects: dislocation spirals, cusps in plane edges, and zone-line displacement. The way in which those contrast effects develop with increasing tilt angle is discussed and illustrated with image simulations. An important result is that under favorable conditions, contrast due to the boundary dislocations could still be resolved in the simulation of the high-angle 26 degree boundary. (Author).
Field Ion Microscopy
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Author : R. Wagner
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Field Ion Microscopy written by R. Wagner and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
Despite the recent progress in developing various microanalytical tools of better spatial resolution and more sensitivity to chemical analyses for the study of various defects in metallic solids the Field-Ion Microscope (FIM) still remains the only instrument up to now to resolve single atoms in the surface of a metal. Fifteen years after Milller!) invented the FIM he was also the first to combine the FIM with a time-of-flight (ToF) mass spectrometer - the so-called Atom-Probe FlM - to identify the chemical nature of single atoms imaged in the FIM2). Originally the motivation to develop the ToF atom probe was to use this method to obtain some more fundamental understanding of field ionization and field evaporation, the most basic physical processes in field-ion microscopy. Even after the successful combination of a FIM with a ToF atom probe had been accomplished, the technique was rarely applied to metallurgical investigations since for a fairly long period only refractory metals such as tungsten, molybdenum, iridium, etc. could be imaged in the FIM. How ever, these metals do not playa very important role in metallurgy. Only when Turner et 3 al. ) substituted the conventional phosphorescent screen of the field-ion microscope with micro-channel electron multiplier arrays, termed micro channel plates, did it become possible to image in the FIM the less refractory metals like Fe, Cu, Ni and even AI.
Microscopy Of Materials
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Author : David Keith Bowen
language : en
Publisher: John Wiley & Sons
Release Date : 1975
Microscopy Of Materials written by David Keith Bowen and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 1975 with Science categories.
Field Ion Microscopy
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Author : John J. Hren
language : en
Publisher: Springer
Release Date : 2013-11-11
Field Ion Microscopy written by John J. Hren and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-11 with Technology & Engineering categories.
Scientific And Technical Aerospace Reports
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Author :
language : en
Publisher:
Release Date : 1980
Scientific And Technical Aerospace Reports written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1980 with Aeronautics categories.
Handbook Of Microscopy
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Author : S. Amelinckx
language : en
Publisher: John Wiley & Sons
Release Date : 2008-08-29
Handbook Of Microscopy written by S. Amelinckx and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-08-29 with Science categories.
Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information. With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which techique is suitable for characterizing a given material?"
Electron And Ion Microscopy And Microanalysis
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Author : Lawrence E Murr
language : en
Publisher: CRC Press
Release Date : 2018-10-08
Electron And Ion Microscopy And Microanalysis written by Lawrence E Murr and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-10-08 with Technology & Engineering categories.
The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
High Resolution Microscopy Of Materials Volume 139
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Author : William Krakow
language : en
Publisher:
Release Date : 1989-09-12
High Resolution Microscopy Of Materials Volume 139 written by William Krakow and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989-09-12 with Technology & Engineering categories.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
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Author :
language : en
Publisher: 清华大学出版社有限公司
Release Date : 2006
written by and has been published by 清华大学出版社有限公司 this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006 with categories.
本书是一本关于各种显微学的原理及其在该迅猛发展的领域内应用的综述参考书。本书涵盖的范围包括共聚焦光学显微镜、扫描近场光学显微镜、各种扫描探针显微术、离子和电子显微镜、电子能量损失和X射线谱等。
Concise Encyclopedia Of Materials Characterization
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Author : R.W. Cahn
language : en
Publisher: Elsevier
Release Date : 2016-01-22
Concise Encyclopedia Of Materials Characterization written by R.W. Cahn and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-01-22 with Technology & Engineering categories.
To use materials effectively, their composition, degree of perfection, physical and mechanical characteristics, and microstructure must be accurately determined. This concise encyclopledia covers the wide range of characterization techniques necessary to achieve this. Articles included are not only concerned with the characterization techniques of specific materials such as polymers, metals, ceramics and semiconductors but also techniques which can be applied to materials in general. The techniques described cover bulk methods, and also a number of specific methods to study the topography and composition of surface and near-surface regions. These techniques range from the well-established and traditional to the very latest including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques. This unique concise encyclopedia comprises 116 articles by leading experts in the field from around the world to create the ideal guide for materials scientists, chemists and engineers involved with any aspect of materials characterization. With over 540 illustrations, extensive cross-referencing, approximately 900 references, and a detailed index, this concise encyclopedia will be a valuable asset to any materials science collection.
