Handbook Of Optical Dimensional Metrology

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Handbook Of Optical Dimensional Metrology

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Author : Kevin Harding
language : en
Publisher: CRC Press
Release Date : 2013-02-26

Handbook Of Optical Dimensional Metrology written by Kevin Harding and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-02-26 with Technology & Engineering categories.

Due to their speed, data density, and versatility, optical metrology tools play important roles in today’s high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods. The book first builds a foundation for evaluating optical measurement methods. It explores the many terms of optical metrology and compares it to other forms of metrology, such as mechanical gaging, highlighting the limitations and errors associated with each mode of measurement at a general level. This comparison is particularly helpful to current industry users who operate the most widely applied mechanical tools. The book then focuses on each application area of measurement, working down from large area to medium-sized to submicron measurements. It describes the measurement of large objects on the scale of buildings, the measurement of durable manufactured goods such as aircraft engines and appliances, and the measurement of fine features on the micron and nanometer scales. In each area, the book covers fast, coarse measures as well as the finest measurements possible. Best practices and practical examples for each technology aid readers in effectively using the methods. Requiring no prior expertise in optical dimensional metrology, this handbook helps engineers and quality specialists understand the capabilities and limitations of optical metrology methods. It also shows them how to successfully apply optical metrology to a vast array of current engineering and scientific problems.

Handbook Of Optical Dimensional Metrology

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Author : Kevin Harding
language : en
Publisher: Taylor & Francis
Release Date : 2016-04-19

Handbook Of Optical Dimensional Metrology written by Kevin Harding and has been published by Taylor & Francis this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-04-19 with Science categories.

Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods

Handbook Of Optical Metrology

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Author : Toru Yoshizawa
language : en
Publisher: CRC Press
Release Date : 2017-07-28

Handbook Of Optical Metrology written by Toru Yoshizawa and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-07-28 with Technology & Engineering categories.

Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.

Handbook Of Metrology And Applications

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Author : Dinesh K. Aswal
language : en
Publisher: Springer Nature
Release Date : 2023-08-23

Handbook Of Metrology And Applications written by Dinesh K. Aswal and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-08-23 with Technology & Engineering categories.

​This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency metrology, certified reference materials, industrial metrology, industry 4.0, metrology in additive manufacturing, digital transformations in metrology, soft metrology and cyber security, optics in metrology, nano-metrology, metrology for advanced communication, environmental metrology, metrology in biomedical engineering, legal metrology and global trade, ionizing radiation metrology, advanced techniques in evaluation of measurement uncertainty, etc. The book has contributed chapters from world’s leading metrologists and experts on the diversified metrological theme. The internationally recognized team of editors adopt a consistent and systematic approach and writing style, including ample cross reference among topics, offering readers a user-friendly knowledgebase greater than the sum of its parts, perfect for frequent consultation. Moreover, the content of this volume is highly interdisciplinary in nature, with insights from not only metrology but also mechanical/material science, optics, physics, chemistry, biomedical and more. This handbook is ideal for academic and professional readers in the traditional and emerging areas of metrology and related fields.

Fundamental Principles Of Engineering Nanometrology

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Author : Richard Leach
language : en
Publisher: Elsevier
Release Date : 2014-05-17

Fundamental Principles Of Engineering Nanometrology written by Richard Leach and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-05-17 with Science categories.

Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. Richard Leach introduces these techniques to a broad audience of engineers and scientists involved in nanotechnology and manufacturing applications and research. He also provides a routemap and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale. Starting from the fundamentals of precision measurement, the author progresses into different measurement and characterization techniques. The focus on nanometrology in engineering contexts makes this book an essential guide for the emerging nanomanufacturing / nanofabrication sector, where measurement and standardization requirements are paramount both in product specification and quality assurance. This book provides engineers and scientists with the methods and understanding needed to design and produce high-performance, long-lived products while ensuring that compliance and public health requirements are met. Updated to cover new and emerging technologies, and recent developments in standards and regulatory frameworks, this second edition includes many new sections, e.g. new technologies in scanning probe and e-beam microscopy, recent developments in interferometry and advances in co-ordinate metrology. - Demystifies nanometrology for a wide audience of engineers, scientists, and students involved in nanotech and advanced manufacturing applications and research - Introduces metrologists to the specific techniques and equipment involved in measuring at the nano-scale or to nano-scale uncertainty - Fully updated to cover the latest technological developments, standards, and regulations

Optical Microring Resonators

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Author : Vien Van
language : en
Publisher: CRC Press
Release Date : 2016-12-19

Optical Microring Resonators written by Vien Van and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-12-19 with Science categories.

"a detailed, cognizant account of numerous crucial aspects of optical microring resonators" – Amr S. Helmy, Professor of Electrical & Computer Engineering, University of Toronto "an excellent choice for gaining an insight into the vast potential of microring resonators" – Jalil Ali, Professor, Laser Center ISI-SIR, University of Technology, Malaysia "a thorough treatment... appeal[s] to a wide range of audiences" – L. Jay Guo, Professor of Electrical Engineering & Computer Science, The University of Michigan The field of microring resonator research has seen tremendous growth over the past decade, with microring resonators now becoming a ubiquitous element in integrated photonics technology. This book fills the need for a cohesive and comprehensive treatment of the subject, given its importance and the proliferation of new research in the field. The expert author has as an introductory guide for beginners as well as a reference source for more experienced researchers. This book aims to fulfill this need by providing a concise and detailed treatment of the fundamental concepts and theories that underpin the various applications. To appeal to as wide a readership as possible, major areas of applications of microring resonators will also be covered in depth.

Optical Compressive Imaging

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Author : Adrian Stern
language : en
Publisher: CRC Press
Release Date : 2016-11-17

Optical Compressive Imaging written by Adrian Stern and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-11-17 with Mathematics categories.

This dedicated overview of optical compressive imaging addresses implementation aspects of the revolutionary theory of compressive sensing (CS) in the field of optical imaging and sensing. It overviews the technological opportunities and challenges involved in optical design and implementation, from basic theory to optical architectures and systems for compressive imaging in various spectral regimes, spectral and hyperspectral imaging, polarimetric sensing, three-dimensional imaging, super-resolution imaging, lens-free, on-chip microscopy, and phase sensing and retrieval. The reader will gain a complete introduction to theory, experiment, and practical use for reducing hardware, shortening image scanning time, and improving image resolution as well as other performance parameters. Optics practitioners and optical system designers, electrical and optical engineers, mathematicians, and signal processing professionals will all find the book a unique trove of information and practical guidance.

Singular Optics

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Author : Gregory J. Gbur
language : en
Publisher: CRC Press
Release Date : 2016-11-17

Singular Optics written by Gregory J. Gbur and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-11-17 with Mathematics categories.

"This engagingly written text provides a useful pedagogical introduction to an extensive class of geometrical phenomena in the optics of polarization and phase, including simple explanations of much of the underlying mathematics." —Michael Berry, University of Bristol, UK "The author covers a vast number of topics in great detail, with a unifying mathematical treatment. It will be a useful reference for both beginners and experts...." —Enrique Galvez, Charles A. Dana Professor of Physics and Astronomy, Colgate University "a firm and comprehensive grounding both for those looking to acquaint themselves with the field and those of us that need reminding of the things we thought we knew, but hitherto did not understand: an essential point of reference." —Miles Padgett, Kelvin Chair of Natural Philosophy and Vice Principal (Research), University of Glasgow This book focuses on the various forms of wavefield singularities, including optical vortices and polarization singularities, as well as orbital angular momentum and associated applications. It highlights how an understanding of singular optics provides a completely different way to look at light. Whereas traditional optics focuses on the shape and structure of the non-zero portions of the wavefield, singular optics describes a wave’s properties from its null regions. The contents cover the three main areas of the field: the study of generic features of wavefields, determination of unusual properties of vortices and wavefields that contain singularities, and practical applications of vortices and other singularities.

Precision Metal Additive Manufacturing

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Author : Richard Leach
language : en
Publisher: CRC Press
Release Date : 2020-09-21

Precision Metal Additive Manufacturing written by Richard Leach and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-09-21 with Technology & Engineering categories.

Additive manufacturing (AM) is a fast-growing sector with the ability to evoke a revolution in manufacturing due to its almost unlimited design freedom and its capability to produce personalised parts locally and with efficient material use. AM companies, however, still face technological challenges such as limited precision due to shrinkage, built-in stresses and limited process stability and robustness. Moreover, often post-processing is needed due to high roughness and remaining porosity. Qualified, trained personnel are also in short supply. In recent years, there have been dramatic improvements in AM design methods, process control, post-processing, material properties and material range. However, if AM is going to gain a significant market share, it must be developed into a true precision manufacturing method. The production of precision parts relies on three principles: Production is robust (i.e. all sensitive parameters can be controlled). Production is predictable (for example, the shrinkage that occurs is acceptable because it can be predicted and compensated in the design). Parts are measurable (as without metrology, accuracy, repeatability and quality assurance cannot be known). AM of metals is inherently a high-energy process with many sensitive and inter-related process parameters, making it susceptible to thermal distortions, defects and process drift. The complete modelling of these processes is beyond current computational power, and novel methods are needed to practicably predict performance and inform design. In addition, metal AM produces highly textured surfaces and complex surface features that stretch the limits of contemporary metrology. With so many factors to consider, there is a significant shortage of background material on how to inject precision into AM processes. Shortage in such material is an important barrier for a wider uptake of advanced manufacturing technologies, and a comprehensive book is thus needed. This book aims to inform the reader how to improve the precision of metal AM processes by tackling the three principles of robustness, predictability and metrology, and by developing computer-aided engineering methods that empower rather than limit AM design. Richard Leach is a professor in metrology at the University of Nottingham and heads up the Manufacturing Metrology Team. Prior to this position, he was at the National Physical Laboratory from 1990 to 2014. His primary love is instrument building, from concept to final installation, and his current interests are the dimensional measurement of precision and additive manufactured structures. His research themes include the measurement of surface topography, the development of methods for measuring 3D structures, the development of methods for controlling large surfaces to high resolution in industrial applications and the traceability of X-ray computed tomography. He is a leader of several professional societies and a visiting professor at Loughborough University and the Harbin Institute of Technology. Simone Carmignato is a professor in manufacturing engineering at the University of Padua. His main research activities are in the areas of precision manufacturing, dimensional metrology and industrial computed tomography. He is the author of books and hundreds of scientific papers, and he is an active member of leading technical and scientific societies. He has been chairman, organiser and keynote speaker for several international conferences, and received national and international awards, including the Taylor Medal from CIRP, the International Academy for Production Engineering.

Handbook Of Vlsi Microlithography

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Author : William B. Glendinning
language : en
Publisher: William Andrew
Release Date : 2012-12-02

Handbook Of Vlsi Microlithography written by William B. Glendinning and has been published by William Andrew this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Technology & Engineering categories.

This handbook gives readers a close look at the entire technology of printing very high resolution and high density integrated circuit (IC) patterns into thin resist process transfer coatings-- including optical lithography, electron beam, ion beam, and x-ray lithography. The book's main theme is the special printing process needed to achieve volume high density IC chip production, especially in the Dynamic Random Access Memory (DRAM) industry. The book leads off with a comparison of various lithography methods, covering the three major patterning parameters of line/space, resolution, line edge and pattern feature dimension control. The book's explanation of resist and resist process equipment technology may well be the first practical description of the relationship between the resist process and equipment parameters. The basics of resist technology are completely covered -- including an entire chapter on resist process defectivity and the potential yield limiting effect on device production. Each alternative lithographic technique and testing method is considered and evaluated: basic metrology including optical, scanning-electron-microscope (SEM) techniques and electrical test devices, along with explanations of actual printing tools and their design, construction and performance. The editor devotes an entire chapter to today's sophisticated, complex electron-beam printers, and to the emerging x-ray printing technology now used in high-density CMOS devices. Energetic ion particle printing is a controllable, steerable technology that does not rely on resist, and occupies a final section of the handbook.